Masahiro Tomita

Person

Katsuta, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen observation method
- Patent number 8,410,440
- Issue date Apr 2, 2013
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Grant
Specimen observation method
- Patent number 8,164,058
- Issue date Apr 24, 2012
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Grant
Specimen observation method
- Patent number 7,573,030
- Issue date Aug 11, 2009
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample heating holder, method of observing a sample and charged par...
- Patent number 6,495,838
- Issue date Dec 17, 2002
- Hitachi, Ltd.
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 5,898,177
- Issue date Apr 27, 1999
- Hitachi, Ltd.
- Kishio Hidaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen heating device for use with an electron microscope
- Patent number 5,296,669
- Issue date Mar 22, 1994
- Hitachi, Ltd.
- Hiroyuki Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron optical measurement apparatus
- Patent number 5,192,867
- Issue date Mar 9, 1993
- Hitachi, Ltd.
- Nobuyuki Osakabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam generating apparatus of multi-stage accelerat...
- Patent number 5,059,859
- Issue date Oct 22, 1991
- Hitachi, Ltd.
- Junji Endo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Field emission electron gun system
- Patent number 4,945,247
- Issue date Jul 31, 1990
- Hitachi, Ltd.
- Takeshi Kawasaki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN OBSERVATION METHOD
- Publication number 20120138795
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN OBSERVATION METHOD
- Publication number 20090274359
- Publication date Nov 5, 2009
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING
Information Patent Application
Specimen observation method
- Publication number 20080073527
- Publication date Mar 27, 2008
- Hitachi High-Technologies Corporation
- Eiko Nakazawa
- G01 - MEASURING TESTING

Masahiro Tomita

Person

Patents Grantslast 30 patents

Specimen observation method

Specimen observation method

Specimen observation method

Sample heating holder, method of observing a sample and charged par...

Electron microscope

Specimen heating device for use with an electron microscope

Electron optical measurement apparatus

Charged particle beam generating apparatus of multi-stage accelerat...

Field emission electron gun system

Patents Applicationslast 30 patents

SPECIMEN OBSERVATION METHOD

SPECIMEN OBSERVATION METHOD

Specimen observation method