Masakazu ANDO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Temperature control device and temperature control method
- Patent number 8,653,843
- Issue date Feb 18, 2014
- Advantest Corporation
- Masakazu Ando
- G01 - MEASURING TESTING
Information Patent Grant
Temperature control device and temperature control method
- Patent number 8,063,653
- Issue date Nov 22, 2011
- Advantest Corporation
- Masakazu Ando
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus, pin electronics card, electrical device and switch
- Patent number 7,876,120
- Issue date Jan 25, 2011
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Temperature control device and temperature control method
- Patent number 7,619,427
- Issue date Nov 17, 2009
- Advantest Corporation
- Masakazu Ando
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit for semiconductor test system
- Patent number 5,699,001
- Issue date Dec 16, 1997
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit for semiconductor test system
- Patent number 5,654,655
- Issue date Aug 5, 1997
- Advantest Corporation
- Toshiaki Awaji
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for developing lithographic offset printing plate
- Patent number 5,398,092
- Issue date Mar 14, 1995
- Mitsubishi Paper Mills Limited
- Yoshiyuki Tanno
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
IC test equipment
- Patent number 4,710,704
- Issue date Dec 1, 1987
- Advantest Corporation
- Masakazu Ando
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD
- Publication number 20120025856
- Publication date Feb 2, 2012
- Masakazu Ando
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD
- Publication number 20100066398
- Publication date Mar 18, 2010
- Advantest Corporation
- Masakazu ANDO
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus, pin electronics card, electrical device and switch
- Publication number 20090134900
- Publication date May 28, 2009
- Advantest Corporation
- TOSHIAKI AWAJI
- G01 - MEASURING TESTING
Information Patent Application
Temperature Control Device and Temparature Control Method
- Publication number 20080164899
- Publication date Jul 10, 2008
- Masakazu Ando
- G01 - MEASURING TESTING
Information Patent Application
Cassette
- Publication number 20040149930
- Publication date Aug 5, 2004
- Masakazu Ando
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Masakazu ANDO

Person

Patents Grantslast 30 patents

Temperature control device and temperature control method

Temperature control device and temperature control method

Test apparatus, pin electronics card, electrical device and switch

Temperature control device and temperature control method

Driver circuit for semiconductor test system

Driver circuit for semiconductor test system

Method and apparatus for developing lithographic offset printing plate

IC test equipment

Patents Applicationslast 30 patents

TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD

TEMPERATURE CONTROL DEVICE AND TEMPERATURE CONTROL METHOD

Test apparatus, pin electronics card, electrical device and switch

Temperature Control Device and Temparature Control Method

Cassette