Masakazu Ichikawa

Person

Setagaya-ku, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Manufacturing method for a field-effect transistor, manufacturing m...
- Patent number 6,747,748
- Issue date Jun 8, 2004
- Tokyo Electron Limited
- Tatsuo Matsudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for forming microstructure body
- Patent number 5,746,826
- Issue date May 5, 1998
- Hitachi, Ltd.
- Tsuyoshi Hasegawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface atom fabrication method and apparatus
- Patent number 5,689,494
- Issue date Nov 18, 1997
- Hitachi, Ltd.
- Masakazu Ichikawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Apparatus including a specimen tilt mechanism for measuring electro...
- Patent number 5,572,122
- Issue date Nov 5, 1996
- Hitachi, Ltd.
- Yusuke Yajima
- G01 - MEASURING TESTING
Information Patent Grant
Actuator
- Patent number 5,563,465
- Issue date Oct 8, 1996
- Hitachi, Ltd.
- Hitoshi Nakahara
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Nanodisplacement producing apparatus
- Patent number 5,521,390
- Issue date May 28, 1996
- Hitachi, Ltd.
- Toshihiko Sato
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface atom fabrication method and apparatus
- Patent number 5,416,331
- Issue date May 16, 1995
- Hitachi, Ltd.
- Masakazu Ichikawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of observing electron microscopic images and an apparatus fo...
- Patent number 5,345,080
- Issue date Sep 6, 1994
- Hitachi, Ltd.
- Yusuke Yajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning interference electron microscopy
- Patent number 5,298,747
- Issue date Mar 29, 1994
- Hitachi, Ltd.
- Masakazu Ichikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Combination apparatus having a scanning electron microscope therein
- Patent number 5,229,607
- Issue date Jul 20, 1993
- Hitachi, Ltd.
- Hironobu Matsui
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron microscope and method for observing microscopic image
- Patent number 5,153,434
- Issue date Oct 6, 1992
- Hitachi, Ltd.
- Yusuke Yajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface microscope and surface microscopy
- Patent number 5,144,128
- Issue date Sep 1, 1992
- Hitachi, Ltd.
- Tsuyoshi Hasegawa
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Manufacturing method for a field-effect transistor, manufacturing m...
- Publication number 20020115304
- Publication date Aug 22, 2002
- Tatsuo Matsudo
- H01 - BASIC ELECTRIC ELEMENTS

Masakazu Ichikawa

Person

Patents Grantslast 30 patents

Manufacturing method for a field-effect transistor, manufacturing m...

Method and apparatus for forming microstructure body

Surface atom fabrication method and apparatus

Apparatus including a specimen tilt mechanism for measuring electro...

Actuator

Nanodisplacement producing apparatus

Surface atom fabrication method and apparatus

Method of observing electron microscopic images and an apparatus fo...

Scanning interference electron microscopy

Combination apparatus having a scanning electron microscope therein

Electron microscope and method for observing microscopic image

Surface microscope and surface microscopy

Patents Applicationslast 30 patents

Manufacturing method for a field-effect transistor, manufacturing m...