Masaoki YAMAGATA

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Shape measuring device
- Patent number 10,895,449
- Issue date Jan 19, 2021
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus
- Patent number 10,852,128
- Issue date Dec 1, 2020
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Indicator inspection machine, inspection method, and inspection pro...
- Patent number 10,684,109
- Issue date Jun 16, 2020
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Optical displacement measuring instrument, adjustment method and me...
- Patent number 10,480,930
- Issue date Nov 19, 2019
- Mitutoyo Corporation
- Kentaro Tamura
- G01 - MEASURING TESTING
Information Patent Grant
Inspection machine and attachment jig therefor
- Patent number 10,119,848
- Issue date Nov 6, 2018
- Mitutoyo Corporation
- Yuki Kurahashi
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus
- Patent number 9,989,356
- Issue date Jun 5, 2018
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Illumination apparatus, illumination method, measuring apparatus, a...
- Patent number 9,500,474
- Issue date Nov 22, 2016
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Coordinate measuring apparatus
- Patent number 9,354,041
- Issue date May 31, 2016
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe, attachable cover, and shape measuring apparatus
- Patent number 9,255,792
- Issue date Feb 9, 2016
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe
- Patent number 8,964,281
- Issue date Feb 24, 2015
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe
- Patent number 8,908,256
- Issue date Dec 9, 2014
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Image measuring apparatus
- Patent number 8,643,718
- Issue date Feb 4, 2014
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring instrument
- Patent number 8,573,036
- Issue date Nov 5, 2013
- Mitutoyo Corporation
- Shiro Igasaki
- G01 - MEASURING TESTING
Information Patent Grant
Shape measurement device
- Patent number 8,553,234
- Issue date Oct 8, 2013
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring instrument
- Patent number 8,549,899
- Issue date Oct 8, 2013
- Mitutoyo Corporation
- Shiro Igasaki
- G01 - MEASURING TESTING
Information Patent Grant
Calibrating jig, profile measuring device, and method of offset cal...
- Patent number 8,416,426
- Issue date Apr 9, 2013
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Measuring instrument
- Patent number 8,191,408
- Issue date Jun 5, 2012
- Mitutoyo Corporation
- Shiro Igasaki
- G01 - MEASURING TESTING
Information Patent Grant
Calibrating jig, profile measuring device, and method of offset cal...
- Patent number 8,139,229
- Issue date Mar 20, 2012
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Signal converter, signal processor and signal conversion transmissi...
- Patent number 8,131,896
- Issue date Mar 6, 2012
- Mitutoyo Corporation
- Masaoki Yamagata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Abnormality detecting method for form measuring mechanism and form...
- Patent number 7,882,723
- Issue date Feb 8, 2011
- Mitutoyo Corporation
- Yasuhiro Takahama
- G01 - MEASURING TESTING
Information Patent Grant
Probe straightness measuring method
- Patent number 7,869,970
- Issue date Jan 11, 2011
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring instrument
- Patent number 7,814,779
- Issue date Oct 19, 2010
- Mitutoyo Corporation
- Shiro Igasaki
- G01 - MEASURING TESTING
Information Patent Grant
Profiling controlling method and controller for contact type probes...
- Patent number 7,769,560
- Issue date Aug 3, 2010
- Mitutoyo Corporation
- Shiro Igasaki
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring front and back surfaces of target object
- Patent number 7,701,562
- Issue date Apr 20, 2010
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Grant
Surface profile measuring instrument
- Patent number 7,318,285
- Issue date Jan 15, 2008
- Mitutoyo Corporation
- Sadayuki Matsumiya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method of inspecting gage
- Patent number 6,510,725
- Issue date Jan 28, 2003
- Mitutoyo Corporation
- Yuwu Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Linear measuring machine
- Patent number 6,446,351
- Issue date Sep 10, 2002
- Mitutoyo Corporation
- Yuwu Zhang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION METHOD, INSPECTION APPARATUS, AND INSPECTION PROGRAM FOR...
- Publication number 20240212129
- Publication date Jun 27, 2024
- Mitutoyo Corporation
- Kasumi KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD, INSPECTION APPARATUS, AND INSPECTION PROGRAM FOR...
- Publication number 20240212126
- Publication date Jun 27, 2024
- Mitutoyo Corporation
- Kasumi KONDO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SHAPE RECONSTRUCTION METHOD AND IMAGE MEASUREMENT DEVICE
- Publication number 20220412727
- Publication date Dec 29, 2022
- MACHINE VISION LIGHTING INC.
- Shigeki MASUMURA
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING APPARATUS
- Publication number 20220290971
- Publication date Sep 15, 2022
- MITUTOYO CORPORATION
- Tsutomu ICHIMURA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING DEVICE
- Publication number 20200132439
- Publication date Apr 30, 2020
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Application
INDICATOR INSPECTION MACHINE, INSPECTION METHOD, AND INSPECTION PRO...
- Publication number 20180364019
- Publication date Dec 20, 2018
- MITUTOYO CORPORATION
- Masaoki YAMAGATA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DISPLACEMENT MEASURING INSTRUMENT, ADJUSTMENT METHOD AND ME...
- Publication number 20180259319
- Publication date Sep 13, 2018
- Mitutoyo Corporation
- Kentaro Tamura
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION MACHINE AND ATTACHMENT JIG THEREFOR
- Publication number 20170115141
- Publication date Apr 27, 2017
- MITUTOYO CORPORATION
- Yuki KURAHASHI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS
- Publication number 20150226544
- Publication date Aug 13, 2015
- MITUTOYO CORPORATION
- Kentaro NEMOTO
- G02 - OPTICS
Information Patent Application
OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS
- Publication number 20150226543
- Publication date Aug 13, 2015
- MITUTOYO CORPORATION
- Kentaro NEMOTO
- G02 - OPTICS
Information Patent Application
ILLUMINATION APPARATUS, ILLUMINATION METHOD, MEASURING APPARATUS, A...
- Publication number 20150211842
- Publication date Jul 30, 2015
- MITUTOYO CORPORATION
- Masaoki YAMAGATA
- G01 - MEASURING TESTING
Information Patent Application
COORDINATE MEASURING APPARATUS
- Publication number 20150077761
- Publication date Mar 19, 2015
- MITUTOYO CORPORATION
- Masaoki YAMAGATA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS
- Publication number 20140253724
- Publication date Sep 11, 2014
- MITUTOYO CORPORATION
- Masaoki YAMAGATA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS
- Publication number 20140232855
- Publication date Aug 21, 2014
- MITUTOYO CORPORATION
- Masaoki YAMAGATA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROBE
- Publication number 20130083384
- Publication date Apr 4, 2013
- Mitutoyo Corporation
- Masaoki Yamagata
- G02 - OPTICS
Information Patent Application
SHAPE MEASUREMENT DEVICE
- Publication number 20120262724
- Publication date Oct 18, 2012
- MITUTOYO CORPORATION
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASUREMENT DEVICE
- Publication number 20120262726
- Publication date Oct 18, 2012
- MITUTOYO CORPORATION
- Kentaro Nemoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATING JIG, PROFILE MEASURING DEVICE, AND METHOD OF OFFSET CAL...
- Publication number 20120188558
- Publication date Jul 26, 2012
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Application
IMAGE MEASURING APPARATUS
- Publication number 20120098963
- Publication date Apr 26, 2012
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Application
Surface texture measuring instrument
- Publication number 20110016956
- Publication date Jan 27, 2011
- Mitutoyo Corporation
- Shiro Igasaki
- G01 - MEASURING TESTING
Information Patent Application
Surface texture measuring instrument
- Publication number 20110005307
- Publication date Jan 13, 2011
- Mitutoyo Corporation
- Shiro Igasaki
- G01 - MEASURING TESTING
Information Patent Application
Signal converter, signal processor and signal conversion transmissi...
- Publication number 20100312930
- Publication date Dec 9, 2010
- Mitutoyo Corporation
- Masaoki Yamagata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Calibrating jig, profile measuring device, and method of offset cal...
- Publication number 20100007895
- Publication date Jan 14, 2010
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Application
MEASURING INSTRUMENT
- Publication number 20100000307
- Publication date Jan 7, 2010
- Mitutoyo Corporation
- Shiro Igasaki
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring front and back surfaces of target object
- Publication number 20090207403
- Publication date Aug 20, 2009
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRAIGHTNESS MEASURING METHOD
- Publication number 20090198472
- Publication date Aug 6, 2009
- Mitutoyo Corporation
- Kentaro Nemoto
- G01 - MEASURING TESTING
Information Patent Application
ABNORMALITY DETECTING METHOD FOR FORM MEASURING MECHANISM AND FORM...
- Publication number 20080295571
- Publication date Dec 4, 2008
- Mitutoyo Corporation
- Yasuhiro Takahama
- G01 - MEASURING TESTING
Information Patent Application
PROFILING CONTROLLING METHOD AND CONTROLLER FOR CONTACT TYPE PROBES...
- Publication number 20080195353
- Publication date Aug 14, 2008
- Mitutoyo Corporation
- Shiro Igasaki
- G01 - MEASURING TESTING
Information Patent Application
Surface texture measuring instrument
- Publication number 20070295100
- Publication date Dec 27, 2007
- Mitutoyo Corporation
- Shiro Igasaki
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PROFILE MEASURING INSTRUMENT
- Publication number 20070056176
- Publication date Mar 15, 2007
- Mitutoyo Corporation
- Sadayuki Matsumiya
- G01 - MEASURING TESTING

Masaoki YAMAGATA

Person

Patents Grantslast 30 patents

Shape measuring device

Shape measuring apparatus

Indicator inspection machine, inspection method, and inspection pro...

Optical displacement measuring instrument, adjustment method and me...

Inspection machine and attachment jig therefor

Shape measuring apparatus

Illumination apparatus, illumination method, measuring apparatus, a...

Coordinate measuring apparatus

Optical probe, attachable cover, and shape measuring apparatus

Optical probe

Optical probe

Image measuring apparatus

Surface texture measuring instrument

Shape measurement device

Surface texture measuring instrument

Calibrating jig, profile measuring device, and method of offset cal...

Measuring instrument

Calibrating jig, profile measuring device, and method of offset cal...

Signal converter, signal processor and signal conversion transmissi...

Abnormality detecting method for form measuring mechanism and form...

Probe straightness measuring method

Surface texture measuring instrument

Profiling controlling method and controller for contact type probes...

Method of measuring front and back surfaces of target object

Surface profile measuring instrument

Apparatus and method of inspecting gage

Linear measuring machine

Patents Applicationslast 30 patents

INSPECTION METHOD, INSPECTION APPARATUS, AND INSPECTION PROGRAM FOR...

INSPECTION METHOD, INSPECTION APPARATUS, AND INSPECTION PROGRAM FOR...

SHAPE RECONSTRUCTION METHOD AND IMAGE MEASUREMENT DEVICE

COORDINATE MEASURING APPARATUS

SHAPE MEASURING DEVICE

INDICATOR INSPECTION MACHINE, INSPECTION METHOD, AND INSPECTION PRO...

OPTICAL DISPLACEMENT MEASURING INSTRUMENT, ADJUSTMENT METHOD AND ME...

INSPECTION MACHINE AND ATTACHMENT JIG THEREFOR

OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS

OPTICAL PROBE, ATTACHABLE COVER, AND SHAPE MEASURING APPARATUS

ILLUMINATION APPARATUS, ILLUMINATION METHOD, MEASURING APPARATUS, A...

COORDINATE MEASURING APPARATUS

SHAPE MEASURING APPARATUS

SHAPE MEASURING APPARATUS

OPTICAL PROBE

SHAPE MEASUREMENT DEVICE

SHAPE MEASUREMENT DEVICE

CALIBRATING JIG, PROFILE MEASURING DEVICE, AND METHOD OF OFFSET CAL...

IMAGE MEASURING APPARATUS

Surface texture measuring instrument

Surface texture measuring instrument

Signal converter, signal processor and signal conversion transmissi...

Calibrating jig, profile measuring device, and method of offset cal...

MEASURING INSTRUMENT

Method of measuring front and back surfaces of target object

PROBE STRAIGHTNESS MEASURING METHOD

ABNORMALITY DETECTING METHOD FOR FORM MEASURING MECHANISM AND FORM...

PROFILING CONTROLLING METHOD AND CONTROLLER FOR CONTACT TYPE PROBES...

Surface texture measuring instrument

SURFACE PROFILE MEASURING INSTRUMENT