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Masaru Tomioka

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  • Hitachinaka, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Ion trap/time-of-flight mass analyzing apparatus and mass analyzing...
    • Patent number 7,186,973
    • Issue date Mar 6, 2007
    • Hitachi High-Technologies Corporation
    • Yasushi Terui
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Time of flight mass spectrometer
    • Patent number D522391
    • Issue date Jun 6, 2006
    • Hitachi High-Technologies Corporation
    • Mitsuru Onuma
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Mass spectrometer
    • Patent number 7,053,367
    • Issue date May 30, 2006
    • Hitachi High-Technologies Corporation
    • Tomoyuki Tobita
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion trap mass analyzing apparatus
    • Patent number 6,977,373
    • Issue date Dec 20, 2005
    • Hitachi High-Technologies Corporation
    • Kiyomi Yoshinari
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion trap mass analyzing apparatus
    • Patent number 6,759,652
    • Issue date Jul 6, 2004
    • Hitachi High-Technologies Corporation
    • Kiyomi Yoshinari
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Ion trap mass spectrometer
    • Patent number 6,157,030
    • Issue date Dec 5, 2000
    • Hitachi, Ltd.
    • Minoru Sakairi
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents