Masashi Akutsu

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automated analysis device
- Patent number 12,186,758
- Issue date Jan 7, 2025
- HITACHI HIGH-TECH CORPORATION
- Akihiro Yasui
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automatic analyzer with a control unit for displaying background ma...
- Patent number 12,111,327
- Issue date Oct 8, 2024
- HITACHI HIGH-TECH CORPORATION
- Satoru Chida
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device, automatic analysis system, and automatic...
- Patent number 12,085,582
- Issue date Sep 10, 2024
- HITACHI HIGH-TECH CORPORATION
- Tsukasa Suenari
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device and automatic analysis system
- Patent number 12,019,085
- Issue date Jun 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Kunio Enta
- G01 - MEASURING TESTING
Information Patent Grant
Automated analysis device, and method for conveying sample
- Patent number 11,971,423
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Naoto Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Automated analysis device
- Patent number 11,826,759
- Issue date Nov 28, 2023
- HITACHI HIGH-TECH CORPORATION
- Akihiro Yasui
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automated analysis device
- Patent number 11,662,357
- Issue date May 30, 2023
- Hitachi High-Technologies Corporation
- Masashi Akutsu
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer
- Patent number 11,619,639
- Issue date Apr 4, 2023
- Hitachi High-Technologies Corporation
- Akihiro Yasui
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer
- Patent number 11,486,887
- Issue date Nov 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Masashi Akutsu
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and sample-processing system
- Patent number 11,391,750
- Issue date Jul 19, 2022
- HITACHI HIGH-TECH CORPORATION
- Hitoshi Tokieda
- G01 - MEASURING TESTING
Information Patent Grant
Automated analyzer
- Patent number 11,268,971
- Issue date Mar 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Akihisa Makino
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Automated analysis device
- Patent number 11,235,334
- Issue date Feb 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Akihiro Yasui
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Automated analysis device
- Patent number 10,717,087
- Issue date Jul 21, 2020
- HITACHI HIGH-TECH CORPORATION
- Akihiro Yasui
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Sample transfer device and sample processing system
- Patent number 10,150,620
- Issue date Dec 11, 2018
- Hitachi High-Technologies Corporation
- Masashi Akutsu
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Automatic analyzer and sample-processing system
- Patent number 10,094,846
- Issue date Oct 9, 2018
- Hitachi High-Technologies Corporation
- Hitoshi Tokieda
- G01 - MEASURING TESTING
Information Patent Grant
Specimen transfer device and system
- Patent number 10,094,748
- Issue date Oct 9, 2018
- Hitachi High-Technologies Corporation
- Masashi Akutsu
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection automation system and sample transfer method
- Patent number 9,952,239
- Issue date Apr 24, 2018
- Hitachi High-Technologies Corporation
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Grant
Automatic centrifuge, pre-analysis system with automatic centrifuge...
- Patent number 9,651,570
- Issue date May 16, 2017
- Hitachi High-Technologies Corporation
- Kenichi Yagi
- G01 - MEASURING TESTING
Information Patent Grant
Specimen pre-processing connection device and system provided with...
- Patent number 9,651,571
- Issue date May 16, 2017
- Hitachi High-Technologies Corporation
- Takahiro Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection automation system
- Patent number 9,645,161
- Issue date May 9, 2017
- Hitachi High-Technologies Corporation
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and sample-processing system
- Patent number 9,229,019
- Issue date Jan 5, 2016
- Hitach High-Technologies Corporation
- Hitoshi Tokieda
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzing device
- Patent number 9,201,085
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Masashi Akutsu
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 9,063,104
- Issue date Jun 23, 2015
- Hitachi High-Technologies Corporation
- Masashi Akutsu
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzing system
- Patent number 9,031,794
- Issue date May 12, 2015
- Hitachi High-Technologies Corporation
- Osamu Watabe
- G01 - MEASURING TESTING
Information Patent Grant
Automated sample test system, and method for controlling same
- Patent number 8,972,044
- Issue date Mar 3, 2015
- Hitachi High-Technologies Corporation
- Atsushi Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and sample-processing system
- Patent number 8,701,504
- Issue date Apr 22, 2014
- Hitachi High-Technologies Corporation
- Hitoshi Tokieda
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 8,313,695
- Issue date Nov 20, 2012
- Hitachi High-Technologies Corporation
- Masashi Akutsu
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer and sample-processing system
- Patent number 8,252,233
- Issue date Aug 28, 2012
- Hitachi High-Technologies Corporation
- Hitoshi Tokieda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYZER AND OPERATION METHOD THEREOF
- Publication number 20240377421
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH CORPORATION
- Naohiko Fukaya
- G01 - MEASURING TESTING
Information Patent Application
Automated Analyzing Device, and Control Method for Same
- Publication number 20240353435
- Publication date Oct 24, 2024
- Hitachi High-Tech Corporation
- Hirobumi SHIOHATA
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer
- Publication number 20240201215
- Publication date Jun 20, 2024
- Hitachi High-Tech Corporation
- Masashi FUKAYA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYSIS DEVICE
- Publication number 20240017263
- Publication date Jan 18, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihiro YASUI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Automatic Analysis System and Information Takeover Method in Automa...
- Publication number 20240003924
- Publication date Jan 4, 2024
- Hitachi High-Tech Corporation
- Satoshi Yokotsuka
- G01 - MEASURING TESTING
Information Patent Application
Automated Analysis Device
- Publication number 20230258672
- Publication date Aug 17, 2023
- Hitachi High-Technologies Corporation
- Masashi AKUTSU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20230228777
- Publication date Jul 20, 2023
- HITACH HIGH-TECH CORPORATION
- Shunsuke Sasaki
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE, DISPLAY SYSTEM OF AUTOMATIC ANALYSIS DEV...
- Publication number 20230056397
- Publication date Feb 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Kazuaki SHIBA
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer and Method of Operating Automatic Analyzer
- Publication number 20220260601
- Publication date Aug 18, 2022
- Hitachi High-Tech Corporation
- Maki FURUKAWA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS APPARATUS AND CLEANING METHOD FOR SAME
- Publication number 20220206029
- Publication date Jun 30, 2022
- HITACHI HIGH-TECH CORPORATION
- Misato KOIKE
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND MAINTENANCE GUIDE METHOD IN AUTOMATIC...
- Publication number 20220147038
- Publication date May 12, 2022
- HITACHI HIGH-TECH CORPORATION
- Masashi Akutsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATED ANALYSIS DEVICE
- Publication number 20220111391
- Publication date Apr 14, 2022
- HITACHI HIGH-TECH CORPORATION
- Akihiro YASUI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND AUTOMATIC...
- Publication number 20210389337
- Publication date Dec 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Tsukasa SUENARI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20210356483
- Publication date Nov 18, 2021
- HITACHI HIGH-TECH CORPORATION
- Satoru CHIDA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS SYSTEM
- Publication number 20210302451
- Publication date Sep 30, 2021
- Hitachi High-Tech Corporation
- Kunio Enta
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYSIS DEVICE, AND METHOD FOR CONVEYING SAMPLE
- Publication number 20210239721
- Publication date Aug 5, 2021
- HITACHI HIGH-TECH CORPORATION
- Naoto SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYSIS DEVICE
- Publication number 20200330998
- Publication date Oct 22, 2020
- HITACHI HIGH-TECH CORPORATION
- Akihiro YASUI
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Automated Analyzer
- Publication number 20200292566
- Publication date Sep 17, 2020
- Hitachi High-Technologies Corporation
- Akihiro YASUI
- G01 - MEASURING TESTING
Information Patent Application
Automated Analysis Device
- Publication number 20200271678
- Publication date Aug 27, 2020
- Hitachi High-Technologies Corporation
- Masashi AKUTSU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYZER
- Publication number 20200264201
- Publication date Aug 20, 2020
- Hitachi High-Technologies Corporation
- Akihisa MAKINO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYSIS DEVICE
- Publication number 20200009572
- Publication date Jan 9, 2020
- Hitachi High-Technologies Corporation
- Akihiro YASUI
- G01 - MEASURING TESTING
Information Patent Application
Automated Analyzer
- Publication number 20190317119
- Publication date Oct 17, 2019
- Hitachi High-Technologies Corporation
- Masashi AKUTSU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
- Publication number 20180313862
- Publication date Nov 1, 2018
- Hitachi High-Technologies Corporation
- Hitoshi TOKIEDA
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Application
SPECIMEN PRE-PROCESSING CONNECTION DEVICE AND SYSTEM PROVIDED WITH...
- Publication number 20160252539
- Publication date Sep 1, 2016
- Hitachi High-Technologies Corporation
- Takahiro SASAKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE TRANSFER DEVICE AND SAMPLE PROCESSING SYSTEM
- Publication number 20160244269
- Publication date Aug 25, 2016
- Hitachi High-Technologies Corporation
- Masashi AKUTSU
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM
- Publication number 20160084864
- Publication date Mar 24, 2016
- Hitachi High-Technologies Corporation
- Hitoshi TOKIEDA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION AUTOMATION SYSTEM AND SAMPLE TRANSFER METHOD
- Publication number 20150192598
- Publication date Jul 9, 2015
- Hitachi High-Technologies Corporation
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Application
SPECIMEN TRANSFER DEVICE AND SYSTEM
- Publication number 20140294699
- Publication date Oct 2, 2014
- Masashi Akutsu
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION AUTOMATION SYSTEM
- Publication number 20140208872
- Publication date Jul 31, 2014
- Hitachi High-Technologies Corporation
- Kenichi Yasuzawa
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC CENTRIFUGE, PRE-ANALYSIS SYSTEM WITH AUTOMATIC CENTRIFUGE...
- Publication number 20130281279
- Publication date Oct 24, 2013
- Hitachi High-Technologies Corporation
- Kenichi Yagi
- B04 - CENTRIFUGAL APPARATUS OR MACHINES FOR CARRYING-OUT PHYSICAL OR CHEMICAL...

Masashi Akutsu

Person

Patents Grantslast 30 patents

Automated analysis device

Automatic analyzer with a control unit for displaying background ma...

Automatic analysis device, automatic analysis system, and automatic...

Automatic analysis device and automatic analysis system

Automated analysis device, and method for conveying sample

Automated analysis device

Automated analysis device

Automated analyzer

Automated analyzer

Automatic analyzer and sample-processing system

Automated analyzer

Automated analysis device

Automated analysis device

Sample transfer device and sample processing system

Automatic analyzer and sample-processing system

Specimen transfer device and system

Sample inspection automation system and sample transfer method

Automatic centrifuge, pre-analysis system with automatic centrifuge...

Specimen pre-processing connection device and system provided with...

Sample inspection automation system

Automatic analyzer and sample-processing system

Automatic analyzing device

Automatic analyzer

Automatic analyzing system

Automated sample test system, and method for controlling same

Automatic analyzer and sample-processing system

Automatic analyzer

Automatic analyzer and sample-processing system

Patents Applicationslast 30 patents

AUTOMATIC ANALYZER AND OPERATION METHOD THEREOF

Automated Analyzing Device, and Control Method for Same

Automatic Analyzer

AUTOMATED ANALYSIS DEVICE

Automatic Analysis System and Information Takeover Method in Automa...

Automated Analysis Device

AUTOMATIC ANALYZER

AUTOMATIC ANALYSIS DEVICE, DISPLAY SYSTEM OF AUTOMATIC ANALYSIS DEV...

Automatic Analyzer and Method of Operating Automatic Analyzer

AUTOMATIC ANALYSIS APPARATUS AND CLEANING METHOD FOR SAME

AUTOMATIC ANALYSIS DEVICE AND MAINTENANCE GUIDE METHOD IN AUTOMATIC...

AUTOMATED ANALYSIS DEVICE

AUTOMATIC ANALYSIS DEVICE, AUTOMATIC ANALYSIS SYSTEM, AND AUTOMATIC...

AUTOMATIC ANALYZER

AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS SYSTEM

AUTOMATED ANALYSIS DEVICE, AND METHOD FOR CONVEYING SAMPLE

AUTOMATED ANALYSIS DEVICE

Automated Analyzer

Automated Analysis Device

AUTOMATED ANALYZER

AUTOMATED ANALYSIS DEVICE

Automated Analyzer

AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM

SPECIMEN PRE-PROCESSING CONNECTION DEVICE AND SYSTEM PROVIDED WITH...

SAMPLE TRANSFER DEVICE AND SAMPLE PROCESSING SYSTEM

AUTOMATIC ANALYZER AND SAMPLE-PROCESSING SYSTEM

SAMPLE INSPECTION AUTOMATION SYSTEM AND SAMPLE TRANSFER METHOD

SPECIMEN TRANSFER DEVICE AND SYSTEM

SAMPLE INSPECTION AUTOMATION SYSTEM

AUTOMATIC CENTRIFUGE, PRE-ANALYSIS SYSTEM WITH AUTOMATIC CENTRIFUGE...