Membership
Tour
Register
Log in
Masatake TAKAHASHI
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Facility state analyzing device, facility state analyzing method, a...
Patent number
11,946,603
Issue date
Apr 2, 2024
NEC Corporation
Masatake Takahashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
State analysis device, state analysis method, and recording medium
Patent number
11,560,698
Issue date
Jan 24, 2023
NEC Corporation
Masatake Takahashi
E03 - WATER SUPPLY SEWERAGE
Information
Patent Grant
Diagnostic device, diagnostic system, diagnostic method, and comput...
Patent number
10,823,705
Issue date
Nov 3, 2020
NEC Corporation
Shin Tominaga
G01 - MEASURING TESTING
Information
Patent Grant
Position determination device, leak detection system, position dete...
Patent number
10,458,878
Issue date
Oct 29, 2019
NEC Corporation
Hirofumi Inoue
G01 - MEASURING TESTING
Information
Patent Grant
Tap water management system, tap water management device, tap water...
Patent number
10,287,756
Issue date
May 14, 2019
NEC Corporation
Dai Kobayashi
E03 - WATER SUPPLY SEWERAGE
Information
Patent Grant
Position determination device, position determination system, posit...
Patent number
10,156,493
Issue date
Dec 18, 2018
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Grant
Leakage determination system and leakage determination method
Patent number
10,036,684
Issue date
Jul 31, 2018
NEC Corporation
Shohei Kinoshita
G01 - MEASURING TESTING
Information
Patent Grant
Leak inspection device, leak inspection method, and leak inspection...
Patent number
9,970,840
Issue date
May 15, 2018
NEC Corporation
Shigeki Shinoda
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Grant
Sensor device, vibration detection system, sensor unit, information...
Patent number
9,921,097
Issue date
Mar 20, 2018
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Grant
Structure analyzing device and a structure analyzing method
Patent number
9,851,331
Issue date
Dec 26, 2017
NEC Corporation
Yasuhiro Sasaki
G01 - MEASURING TESTING
Information
Patent Grant
Defect analysis device, defect analysis method, and program
Patent number
9,804,053
Issue date
Oct 31, 2017
NEC Corporation
Masatake Takahashi
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Grant
Leak detection system, vibration detection device, information proc...
Patent number
9,772,251
Issue date
Sep 26, 2017
NEC Corporation
Shigeki Shinoda
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Leak detection device, leak detection method and program
Patent number
9,759,629
Issue date
Sep 12, 2017
NEC Corporation
Mizuho Tomiyama
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Grant
Leak-detection device, program, and control method
Patent number
9,739,684
Issue date
Aug 22, 2017
NEC Corporation
Shigeki Shinoda
G01 - MEASURING TESTING
Information
Patent Grant
Sensor unit
Patent number
9,709,488
Issue date
Jul 18, 2017
NEC Corporation
Shin Tominaga
G02 - OPTICS
Information
Patent Grant
Actuator, piezoelectric actuator, electronic device, and method for...
Patent number
9,137,608
Issue date
Sep 15, 2015
NEC Corporation
Masatake Takahashi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Infrared ray sensor, infrared ray detection device, and electronic...
Patent number
8,921,791
Issue date
Dec 30, 2014
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Grant
Piezoelectric actuator and electronic device
Patent number
8,680,746
Issue date
Mar 25, 2014
NEC Corporation
Masatake Takahashi
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information
Patent Grant
Piezoelectric actuator and electronic device
Patent number
8,670,578
Issue date
Mar 11, 2014
NEC Corporation
Yasuharu Onishi
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information
Patent Grant
Piezoelectric actuator and audio components
Patent number
8,569,930
Issue date
Oct 29, 2013
NEC Corporation
Masatake Takahashi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Infrared sensor, electronic device, and manufacturing method of inf...
Patent number
8,530,841
Issue date
Sep 10, 2013
NEC Corporation
Masatake Takahashi
G01 - MEASURING TESTING
Information
Patent Grant
Piezoelectric acoustic device and electronic apparatus
Patent number
8,385,578
Issue date
Feb 26, 2013
NEC Corporation
Yasuharu Onishi
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Piezo-electric actuator and electronic device
Patent number
8,319,396
Issue date
Nov 27, 2012
NEC Corporation
Yasuharu Onishi
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information
Patent Grant
Piezoelectric actuator and electronic apparatus
Patent number
8,148,876
Issue date
Apr 3, 2012
NEC Corporation
Yasuharu Onishi
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL FIBER SENSING SYSTEM, OPTICAL FIBER SENSING DEVICE, AND ROA...
Publication number
20240393163
Publication date
Nov 28, 2024
NEC Corporation
Masatake TAKAHASHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL FIBER SENSING SYSTEM, OPTICAL FIBER SENSING DEVICE, AND ROA...
Publication number
20240385032
Publication date
Nov 21, 2024
NEC Corporation
Masatake TAKAHASHI
G08 - SIGNALLING
Information
Patent Application
TRAFFIC MONITORING APPARATUS, TRAFFIC MONITORING SYSTEM, TRAFFIC MO...
Publication number
20240169827
Publication date
May 23, 2024
NEC Corporation
Masatake Takahashi
G08 - SIGNALLING
Information
Patent Application
TRAFFIC MONITORING APPARATUS, TRAFFIC MONITORING SYSTEM, TRAFFIC MO...
Publication number
20230274634
Publication date
Aug 31, 2023
NEC Corporation
Masatake Takahashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ASSET MANAGEMENT DEVICE AND ASSET MANAGEMENT METHOD
Publication number
20200401971
Publication date
Dec 24, 2020
NEC Corporation
Shin TOMINAGA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
STATE ANALYSIS DEVICE, STATE ANALYSIS METHOD, AND RECORDING MEDIUM
Publication number
20200370285
Publication date
Nov 26, 2020
NEC Corporation
Masatake TAKAHASHI
E03 - WATER SUPPLY SEWERAGE
Information
Patent Application
FACILITY STATE ANALYZING DEVICE, FACILITY STATE ANALYZING METHOD, A...
Publication number
20200347994
Publication date
Nov 5, 2020
NEC Corporation
Masatake TAKAHASHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LEAKAGE POSITION ANALYZING SYSTEM, LEAKAGE POSITION ANALYZING METHO...
Publication number
20190137044
Publication date
May 9, 2019
NEC Corporation
Masatake TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
PIPE CONDITION DETECTION DEVICE, PIPE CONDITION DETECTION METHOD, C...
Publication number
20180292292
Publication date
Oct 11, 2018
NEC Corporation
Masatake TAKAHASHI
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Application
CONDITION ASSESSMENT DEVICE, CONDITION ASSESSMENT METHOD, PROGRAM R...
Publication number
20180136173
Publication date
May 17, 2018
NEC Corporation
Masatake TAKAHASHI
G01 - MEASURING TESTING
Information
Patent Application
DEFECT ANALYSIS DEVICE, DEFECT ANALYSIS SYSTEM, DEFECT ANALYSIS MET...
Publication number
20180045687
Publication date
Feb 15, 2018
NEC Corporation
Shin TOMINAGA
G01 - MEASURING TESTING
Information
Patent Application
POSITION DETERMINATION DEVICE, POSITION DETERMINATION SYSTEM, POSIT...
Publication number
20170322104
Publication date
Nov 9, 2017
NEC Corporation
Junichiro MATAGA
G01 - MEASURING TESTING
Information
Patent Application
TAP WATER MANAGEMENT SYSTEM, TAP WATER MANAGEMENT DEVICE, TAP WATER...
Publication number
20170247863
Publication date
Aug 31, 2017
NEC Corporation
Dai KOBAYASHI
E03 - WATER SUPPLY SEWERAGE
Information
Patent Application
DIAGNOSTIC DEVICE, DIAGNOSTIC SYSTEM, DIAGNOSTIC METHOD, AND COMPUT...
Publication number
20170205376
Publication date
Jul 20, 2017
NEC Corporation
Shin TOMINAGA
G01 - MEASURING TESTING
Information
Patent Application
POSITION DETERMINATION DEVICE, LEAK DETECTION SYSTEM, POSITION DETE...
Publication number
20170102286
Publication date
Apr 13, 2017
NEC Corporation
Hirofumi INOUE
G01 - MEASURING TESTING
Information
Patent Application
LEAKAGE DETERMINATION SYSTEM AND LEAKAGE DETERMINATION METHOD
Publication number
20160282219
Publication date
Sep 29, 2016
NEC Corporation
Shohei KINOSHITA
G01 - MEASURING TESTING
Information
Patent Application
SENSOR UNIT
Publication number
20160216203
Publication date
Jul 28, 2016
NEC Corporation
Shin TOMINAGA
G01 - MEASURING TESTING
Information
Patent Application
LEAK DETECTION SYSTEM, VIBRATION DETECTION DEVICE, INFORMATION PROC...
Publication number
20160076964
Publication date
Mar 17, 2016
NEC Corporation
Shigeki SHINODA
G01 - MEASURING TESTING
Information
Patent Application
DEFECT ANALYSIS DEVICE, DEFECT ANALYSIS METHOD, AND PROGRAM
Publication number
20150276545
Publication date
Oct 1, 2015
NEC Corporation
Masatake Takahashi
G01 - MEASURING TESTING
Information
Patent Application
LEAK INSPECTION DEVICE, LEAK INSPECTION METHOD, AND LEAK INSPECTION...
Publication number
20150253216
Publication date
Sep 10, 2015
NEC Corporation
Shigeki Shinoda
G01 - MEASURING TESTING
Information
Patent Application
LEAK DETECTION DEVICE, LEAK DETECTION METHOD AND PROGRAM
Publication number
20150253215
Publication date
Sep 10, 2015
NEC Corporation
Mizuho Tomiyama
G01 - MEASURING TESTING
Information
Patent Application
VIBRATION SENSOR UNIT
Publication number
20150236610
Publication date
Aug 20, 2015
NEC Corporation
Yasuhiro Sasaki
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE, VIBRATION DETECTION SYSTEM, SENSOR UNIT, INFORMATION...
Publication number
20150226604
Publication date
Aug 13, 2015
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Application
Leak-Detection Device, Program, and Control Method
Publication number
20150211953
Publication date
Jul 30, 2015
NEC Corporation
Shigeki Shinoda
G01 - MEASURING TESTING
Information
Patent Application
INFRARED DETECTION DEVICE AND INFRARED DETECTION METHOD
Publication number
20150204726
Publication date
Jul 23, 2015
NEC Corporation
Junichiro Mataga
G01 - MEASURING TESTING
Information
Patent Application
STRUCTURE ANALYZING DEVICE AND A STRUCTURE ANALYZING METHOD
Publication number
20150177195
Publication date
Jun 25, 2015
NEC Corporation
Yasuhiro Sasaki
G01 - MEASURING TESTING
Information
Patent Application
STRUCTURE ANALYZING DEVICE AND A STRUCTURE ANALYZING METHOD
Publication number
20150114121
Publication date
Apr 30, 2015
NEC Corporation
Masatake Takahashi
G01 - MEASURING TESTING
Information
Patent Application
PIEZOELECTRIC VIBRATION SENSOR
Publication number
20150107363
Publication date
Apr 23, 2015
NEC Corporation
Masatake Takahashi
G01 - MEASURING TESTING
Information
Patent Application
ACCELERATION SENSOR
Publication number
20140116137
Publication date
May 1, 2014
NEC Corporation
Shigeki Shinoda
G01 - MEASURING TESTING
Information
Patent Application
PIEZOELECTRIC ACTUATOR AND ELECTRONIC DEVICE HAVING PIEZOELECTRIC A...
Publication number
20140036431
Publication date
Feb 6, 2014
NEC Corporation
Yasuhiro Sasaki
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL