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Masatoshi Kitagawa
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Mito, JP
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last 30 patents
Information
Patent Grant
Electrophoresis apparatus using capillary array and sample plate as...
Patent number
7,713,394
Issue date
May 11, 2010
Hitachi, Ltd.
Shuhei Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Electrophoresis apparatus using capillary array and sample plate as...
Patent number
7,056,427
Issue date
Jun 6, 2006
Hitachi, Ltd.
Shuhei Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
High sensitive element analyzing method and apparatus of the same
Patent number
5,202,562
Issue date
Apr 13, 1993
Hitachi, Ltd.
Masataka Koga
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Mass spectrometer for analyzing ultra trace element using plasma io...
Patent number
5,185,523
Issue date
Feb 9, 1993
Hitachi, Ltd.
Masatoshi Kitagawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma analyzer for trace element analysis
Patent number
5,130,537
Issue date
Jul 14, 1992
Hitachi, Ltd.
Yukio Okamoto
G01 - MEASURING TESTING
Information
Patent Grant
Atomic absorption spectrophotometer
Patent number
D307398
Issue date
Apr 24, 1990
Hitachi, Ltd.
Shouji Umemoto
D10 - Measuring, testing, or signalling instruments
Information
Patent Grant
Atomic absorption spectrophotometer
Patent number
4,867,562
Issue date
Sep 19, 1989
Hitachi, Ltd.
Konosuke Oishi
G01 - MEASURING TESTING
Information
Patent Grant
Double polarized light beam spectrophotometer of light source modul...
Patent number
4,645,341
Issue date
Feb 24, 1987
Hitachi, Ltd.
Masataka Koga
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Electrophoresis apparatus using capillary array and sample plate as...
Publication number
20060086613
Publication date
Apr 27, 2006
Shuhei Yamamoto
G01 - MEASURING TESTING
Information
Patent Application
Electrophoresis apparatus using capillary array and sample plate as...
Publication number
20010040096
Publication date
Nov 15, 2001
Shuhei Yamamoto
G01 - MEASURING TESTING