Masatoshi Yasutake

Person

Sunto-gun, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Particle removing method, particle removing device, atomic force mi...
- Patent number 8,657,962
- Issue date Feb 25, 2014
- AOI Electronics Co., Ltd.
- Hiroki Hayashi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Friction force microscope
- Patent number 8,601,609
- Issue date Dec 3, 2013
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Conductivity measuring apparatus and conductivity measuring method
- Patent number 8,111,079
- Issue date Feb 7, 2012
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Micro-machining dust removing device, micro-machining apparatus, an...
- Patent number 8,062,494
- Issue date Nov 22, 2011
- National University Corporation Shizuoka University
- Futoshi Iwata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
AFM tweezers, method for producing AFM tweezers, and scanning probe...
- Patent number 8,028,567
- Issue date Oct 4, 2011
- AOI Electronics Co., Ltd.
- Tatsuya Kobayashi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Positioning apparatus and scanning probe microscope employing the same
- Patent number 8,001,831
- Issue date Aug 23, 2011
- SII Nano Technology Inc.
- Masafumi Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tweezer-equipped scanning probe microscope and transfer method
- Patent number 7,987,703
- Issue date Aug 2, 2011
- AOI Electronics Co., Ltd.
- Takashi Konno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample manipulating apparatus
- Patent number 7,926,328
- Issue date Apr 19, 2011
- Sii Nano Technology Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample operation apparatus
- Patent number 7,866,205
- Issue date Jan 11, 2011
- SII Nano Technology Inc.
- Masatoshi Yasutake
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample operation apparatus
- Patent number 7,770,474
- Issue date Aug 10, 2010
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Probe microscope system suitable for observing sample of long body
- Patent number 7,507,957
- Issue date Mar 24, 2009
- SII NanoTechnology Inc.
- Masamichi Fujihira
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a scanning magnetic force microscope, method for producin...
- Patent number 7,495,215
- Issue date Feb 24, 2009
- National Institute of Advanced Industrial Science and Technology
- Hiroyuki Akinaga
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating nanometer-scale structure
- Patent number 7,476,418
- Issue date Jan 13, 2009
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Working method using scanning probe
- Patent number 7,442,925
- Issue date Oct 28, 2008
- SII NanoTechnology Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Probe for a scanning microscope
- Patent number 7,398,678
- Issue date Jul 15, 2008
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Processing probe
- Patent number 7,378,654
- Issue date May 27, 2008
- SII NanoTechnology Inc.
- Shigeru Wakiyama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Scanning probe microscope and scanning method
- Patent number 7,373,806
- Issue date May 20, 2008
- SII NanoTechnology Inc.
- Itaru Kitajima
- G01 - MEASURING TESTING
Information Patent Grant
Method of processing vertical cross-section using atomic force micr...
- Patent number 7,278,299
- Issue date Oct 9, 2007
- SII NanoTechnology Inc.
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Grant
Processing method using probe of scanning probe microscope
- Patent number 7,259,372
- Issue date Aug 21, 2007
- SII NanoTechnology Inc.
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Grant
Method of removing particle of photomask using atomic force microscope
- Patent number 7,232,995
- Issue date Jun 19, 2007
- SII NanoTechnology Inc.
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning probe microscope
- Patent number 6,864,481
- Issue date Mar 8, 2005
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope for ultra sensitive electro-magnetic fiel...
- Patent number 6,817,231
- Issue date Nov 16, 2004
- Seiko Instruments Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Conductive probe for scanning microscope and machining method using...
- Patent number 6,787,769
- Issue date Sep 7, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning microscope produced by focused ion beam machining
- Patent number 6,759,653
- Issue date Jul 6, 2004
- Yoshikazu Nakayama
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for vertical scanning microscope and probe for vertical...
- Patent number 6,705,154
- Issue date Mar 16, 2004
- Daiken Chemical Co., Ltd.
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 6,593,571
- Issue date Jul 15, 2003
- Seiko Instruments Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and method of measuring geometry of sampl...
- Patent number 6,499,340
- Issue date Dec 31, 2002
- Seiko Instruments Inc.
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing minute foreign substance, and pr...
- Patent number 6,355,495
- Issue date Mar 12, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Naohiko Fujino
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 6,291,822
- Issue date Sep 18, 2001
- Seiko Instruments Inc.
- Takeshi Umemoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Analyzing method and apparatus for minute foreign substances, and m...
- Patent number 6,255,127
- Issue date Jul 3, 2001
- Seiko Instruments Inc.
- Naohiko Fujino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FRICTION FORCE MICROSCOPE
- Publication number 20120227139
- Publication date Sep 6, 2012
- Masatoshi YASUTAKE
- G01 - MEASURING TESTING
Information Patent Application
Conductivity measuring apparatus and conductivity measuring method
- Publication number 20090206855
- Publication date Aug 20, 2009
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Application
TWEEZERS SYSTEM FOR SCANNING PROBE MICROSCOPE, SCANNING PROBE MICRO...
- Publication number 20090188011
- Publication date Jul 23, 2009
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Application
AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe...
- Publication number 20090000365
- Publication date Jan 1, 2009
- AOI ELECTRONICS CO., LTD.
- Tatsuya KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE MANIPULATING APPARATUS
- Publication number 20080314131
- Publication date Dec 25, 2008
- SII Nano Technology, Inc.
- Masatoshi Yasutake
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Particle removing method, particle removing device, atomic force mi...
- Publication number 20080307866
- Publication date Dec 18, 2008
- AOI ELECTRONICS CO., LTD.
- Hayashi Hiroki
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Tweezer-Equipped Scanning Probe Microscope and Transfer Method
- Publication number 20080295585
- Publication date Dec 4, 2008
- AOI ELECTRONICS CO., LTD.
- Takashi Konno
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR A SCANNING MAGNETIC FORCE MICROSCOPE, METHOD FOR PRODUCIN...
- Publication number 20080166560
- Publication date Jul 10, 2008
- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Hiroyuki Akinaga
- G01 - MEASURING TESTING
Information Patent Application
Micro-machining dust removing device, micro-machining apparatus, an...
- Publication number 20080132151
- Publication date Jun 5, 2008
- National University Corporation Shizuoka University
- Futoshi Iwata
- B82 - NANO-TECHNOLOGY
Information Patent Application
SAMPLE OPERATION APPARATUS
- Publication number 20080105044
- Publication date May 8, 2008
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Application
Sample Operation Apparatus
- Publication number 20080105043
- Publication date May 8, 2008
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Application
Processing method using atomic force microscope microfabrication de...
- Publication number 20070278177
- Publication date Dec 6, 2007
- Kazushige Kondo
- G01 - MEASURING TESTING
Information Patent Application
Working method using scanning probe
- Publication number 20060219901
- Publication date Oct 5, 2006
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Application
Probe for a scanning microscope
- Publication number 20060150720
- Publication date Jul 13, 2006
- YOSHIKAZU NAKAYAMA
- Yoshikazu Nakayama
- G01 - MEASURING TESTING
Information Patent Application
Probe microscope system suitable for observing sample of long body
- Publication number 20060060778
- Publication date Mar 23, 2006
- Masamichi Fujihira
- G01 - MEASURING TESTING
Information Patent Application
Method of removing particle of photomask using atomic force microscope
- Publication number 20060022134
- Publication date Feb 2, 2006
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Application
Processing method using probe of scanning probe microscope
- Publication number 20050263700
- Publication date Dec 1, 2005
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Application
Method of processing vertical cross-section using atomic force micr...
- Publication number 20050262685
- Publication date Dec 1, 2005
- Osamu Takaoka
- G01 - MEASURING TESTING
Information Patent Application
Processing probe
- Publication number 20050199809
- Publication date Sep 15, 2005
- Shigeru Wakiyama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for fabricating nanometer-scale structure
- Publication number 20050089463
- Publication date Apr 28, 2005
- Masatoshi Yasutake
- D01 - NATURAL OR ARTIFICIAL THREADS OR FIBRES SPINNING
Information Patent Application
Scanning probe microscope and scanning method
- Publication number 20050050947
- Publication date Mar 10, 2005
- Itaru Kitajima
- G01 - MEASURING TESTING
Information Patent Application
Preparation of sample chip, method of observing wall surface thereo...
- Publication number 20040185586
- Publication date Sep 23, 2004
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Application
Method and system for surface or cross-sectional processing and obs...
- Publication number 20040154744
- Publication date Aug 12, 2004
- Takashi Kaito
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Scanning probe microscope for ultra sensitive electro-magnetic fiel...
- Publication number 20030172726
- Publication date Sep 18, 2003
- Masatoshi Yasutake
- G01 - MEASURING TESTING
Information Patent Application
Probe for scanning probe microscope
- Publication number 20030122072
- Publication date Jul 3, 2003
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Application
Cantilever for vertical scanning microscope and probe for vertical...
- Publication number 20030010100
- Publication date Jan 16, 2003
- Yoshikazu Nakayama
- B82 - NANO-TECHNOLOGY

Masatoshi Yasutake

Person

Patents Grantslast 30 patents

Particle removing method, particle removing device, atomic force mi...

Friction force microscope

Conductivity measuring apparatus and conductivity measuring method

Micro-machining dust removing device, micro-machining apparatus, an...

AFM tweezers, method for producing AFM tweezers, and scanning probe...

Positioning apparatus and scanning probe microscope employing the same

Tweezer-equipped scanning probe microscope and transfer method

Sample manipulating apparatus

Sample operation apparatus

Sample operation apparatus

Probe microscope system suitable for observing sample of long body

Probe for a scanning magnetic force microscope, method for producin...

Method for fabricating nanometer-scale structure

Working method using scanning probe

Probe for a scanning microscope

Processing probe

Scanning probe microscope and scanning method

Method of processing vertical cross-section using atomic force micr...

Processing method using probe of scanning probe microscope

Method of removing particle of photomask using atomic force microscope

Probe for scanning probe microscope

Scanning probe microscope for ultra sensitive electro-magnetic fiel...

Conductive probe for scanning microscope and machining method using...

Probe for scanning microscope produced by focused ion beam machining

Cantilever for vertical scanning microscope and probe for vertical...

Scanning probe microscope

Scanning probe microscope and method of measuring geometry of sampl...

Method and apparatus for analyzing minute foreign substance, and pr...

Scanning probe microscope

Analyzing method and apparatus for minute foreign substances, and m...

Patents Applicationslast 30 patents

FRICTION FORCE MICROSCOPE

Conductivity measuring apparatus and conductivity measuring method

TWEEZERS SYSTEM FOR SCANNING PROBE MICROSCOPE, SCANNING PROBE MICRO...

AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe...

SAMPLE MANIPULATING APPARATUS

Particle removing method, particle removing device, atomic force mi...

Tweezer-Equipped Scanning Probe Microscope and Transfer Method

PROBE FOR A SCANNING MAGNETIC FORCE MICROSCOPE, METHOD FOR PRODUCIN...

Micro-machining dust removing device, micro-machining apparatus, an...

SAMPLE OPERATION APPARATUS

Sample Operation Apparatus

Processing method using atomic force microscope microfabrication de...

Working method using scanning probe

Probe for a scanning microscope

Probe microscope system suitable for observing sample of long body

Method of removing particle of photomask using atomic force microscope

Processing method using probe of scanning probe microscope

Method of processing vertical cross-section using atomic force micr...

Processing probe

Method for fabricating nanometer-scale structure

Scanning probe microscope and scanning method

Preparation of sample chip, method of observing wall surface thereo...

Method and system for surface or cross-sectional processing and obs...

Scanning probe microscope for ultra sensitive electro-magnetic fiel...

Probe for scanning probe microscope

Cantilever for vertical scanning microscope and probe for vertical...