Masatsugu Shigeno

Person

Chiba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and setting method thereof
- Patent number 11,391,755
- Issue date Jul 19, 2022
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and scanning method using the same
- Patent number 10,837,982
- Issue date Nov 17, 2020
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and scanning method thereof
- Patent number 10,345,335
- Issue date Jul 9, 2019
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional fine movement device
- Patent number 10,161,958
- Issue date Dec 25, 2018
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and probe contact detection method
- Patent number 10,151,773
- Issue date Dec 11, 2018
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measurement range adjusting method fo...
- Patent number 9,921,241
- Issue date Mar 20, 2018
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Actuator position calculation device, actuator position calculation...
- Patent number 9,766,267
- Issue date Sep 19, 2017
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 9,645,170
- Issue date May 9, 2017
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring vibration characteristic of cantilever
- Patent number 9,354,248
- Issue date May 31, 2016
- Hitachi High-Tech Science Corporation
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Cell detachment method
- Patent number 8,859,279
- Issue date Oct 14, 2014
- Hitachi High-Tech Science Corporation
- Amiko Nihei
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Cantilever, cantilever system, and probe microscope and adsorption...
- Patent number 8,719,959
- Issue date May 6, 2014
- Sii Nano Technology Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of measuring vibration characteristics of cantilever
- Patent number 8,615,811
- Issue date Dec 24, 2013
- SII NanoTechnology Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Softening point measuring apparatus and thermal conductivity measur...
- Patent number 8,608,373
- Issue date Dec 17, 2013
- SII NanoTechnology Inc.
- Kazunori Ando
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever, cantilever system, scanning probe microscope, mass sens...
- Patent number 8,214,915
- Issue date Jul 3, 2012
- SII NanoTechnology Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical displacement detection mechanism and surface information me...
- Patent number 7,973,942
- Issue date Jul 5, 2011
- SII Nano Technology Inc.
- Masato Iyoki
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sensor for observations in liquid environments and observation appa...
- Patent number 7,945,965
- Issue date May 17, 2011
- SII NanoTechnology Inc.
- Naoya Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electric potential difference detection method and scanning probe m...
- Patent number 7,861,577
- Issue date Jan 4, 2011
- Seiko Instruments Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever and cantilever manufacturing method
- Patent number 7,823,470
- Issue date Nov 2, 2010
- Seiko Instruments Inc.
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope fine-movement mechanism and scanning prob...
- Patent number 7,614,288
- Issue date Nov 10, 2009
- Sii Nano Technology Inc.
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Grant
Vibration-type cantilever holder and scanning probe microscope
- Patent number 7,605,368
- Issue date Oct 20, 2009
- SII NanoTechnology Inc.
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Liquid cell
- Patent number 7,580,125
- Issue date Aug 25, 2009
- Seiko Instruments Inc.
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and scanning method
- Patent number 7,456,400
- Issue date Nov 25, 2008
- Seiko Instruments Inc.
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever holder and scanning probe microscope
- Patent number 7,375,322
- Issue date May 20, 2008
- SII NanoTechnology Inc.
- Itaru Kitajima
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscopy cantilever holder and scanning probe micr...
- Patent number 7,170,054
- Issue date Jan 30, 2007
- SII NanoTechnology Inc.
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 7,026,607
- Issue date Apr 11, 2006
- SII NanoTechnology Inc.
- Itaru Kitajima
- G01 - MEASURING TESTING
Information Patent Grant
Method of measurement by scanning tunneling microscope
- Patent number 4,902,892
- Issue date Feb 20, 1990
- Agency of Industrial Science and Technology, Kosaka Laboratory Ltd.
- Shigeo Okayama
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE AND SETTING METHOD THEREOF
- Publication number 20210293849
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu SHIGENO
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SCANNING METHOD USING THE SAME
- Publication number 20190293681
- Publication date Sep 26, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope and Scanning Method Thereof
- Publication number 20180284151
- Publication date Oct 4, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND PROBE CONTACT DETECTION METHOD
- Publication number 20170285067
- Publication date Oct 5, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope and Measurement Range Adjusting Method fo...
- Publication number 20160291053
- Publication date Oct 6, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu SHIGENO
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional Fine Movement Device
- Publication number 20160011231
- Publication date Jan 14, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING VIBRATION CHARACTERISTIC OF CANTILEVER
- Publication number 20150276796
- Publication date Oct 1, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu SHIGENO
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20150276797
- Publication date Oct 1, 2015
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu SHIGENO
- G01 - MEASURING TESTING
Information Patent Application
Actuator Position Calculation Device, Actuator Position Calculation...
- Publication number 20140297222
- Publication date Oct 2, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masatsugu Shigeno
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD OF MEASURING VIBRATION CHARACTERISTICS OF CANTILEVER
- Publication number 20120246768
- Publication date Sep 27, 2012
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Softening point measuring apparatus and thermal conductivity measur...
- Publication number 20110038392
- Publication date Feb 17, 2011
- Kazunori Ando
- G01 - MEASURING TESTING
Information Patent Application
Cantilever, cantilever system, scanning probe microscope, mass sens...
- Publication number 20100107284
- Publication date Apr 29, 2010
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVER, CANTILEVER SYSTEM, AND PROBE MICROSCOPE AND ADSORPTION...
- Publication number 20100058499
- Publication date Mar 4, 2010
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
SENSOR FOR OBSERVATIONS IN LIQUID ENVIRONMENTS AND OBSERVATION APPA...
- Publication number 20090265819
- Publication date Oct 22, 2009
- Naoya Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Micro-protruding structure
- Publication number 20080272301
- Publication date Nov 6, 2008
- Masatsugu Shigeno
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Scanning Probe Microscope Fine-Movement Mechanism and Scanning Prob...
- Publication number 20080061232
- Publication date Mar 13, 2008
- SII NANO TECHNOLOGY INC.
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Application
Electric potential difference detection method and scanning probe m...
- Publication number 20080054928
- Publication date Mar 6, 2008
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Optical Displacement Detection Mechanism and Surface Information Me...
- Publication number 20080049236
- Publication date Feb 28, 2008
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Application
Cell detachment method
- Publication number 20070292946
- Publication date Dec 20, 2007
- Amiko Nihei
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Cantilever and cantilever manufacturing method
- Publication number 20070214875
- Publication date Sep 20, 2007
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Liquid cell
- Publication number 20070145290
- Publication date Jun 28, 2007
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Vibration-type cantilever holder and scanning probe microscope
- Publication number 20070104079
- Publication date May 10, 2007
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Cantilever holder and scanning probe microscope
- Publication number 20060219916
- Publication date Oct 5, 2006
- Itaru Kitajima
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and scanning method
- Publication number 20060113472
- Publication date Jun 1, 2006
- Masatsugu Shigeno
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscopy cantilever holder and scanning probe micr...
- Publication number 20060043290
- Publication date Mar 2, 2006
- Masato Iyoki
- G01 - MEASURING TESTING
Information Patent Application
Micro-protruding structure
- Publication number 20050212010
- Publication date Sep 29, 2005
- Masatsugu Shigeno
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Scanning probe microscope
- Publication number 20040227076
- Publication date Nov 18, 2004
- Itaru Kitajima
- G01 - MEASURING TESTING

Masatsugu Shigeno

Person

Patents Grantslast 30 patents

Scanning probe microscope and setting method thereof

Scanning probe microscope and scanning method using the same

Scanning probe microscope and scanning method thereof

Three-dimensional fine movement device

Scanning probe microscope and probe contact detection method

Scanning probe microscope and measurement range adjusting method fo...

Actuator position calculation device, actuator position calculation...

Scanning probe microscope

Method for measuring vibration characteristic of cantilever

Cell detachment method

Cantilever, cantilever system, and probe microscope and adsorption...

Method of measuring vibration characteristics of cantilever

Softening point measuring apparatus and thermal conductivity measur...

Cantilever, cantilever system, scanning probe microscope, mass sens...

Optical displacement detection mechanism and surface information me...

Sensor for observations in liquid environments and observation appa...

Electric potential difference detection method and scanning probe m...

Cantilever and cantilever manufacturing method

Scanning probe microscope fine-movement mechanism and scanning prob...

Vibration-type cantilever holder and scanning probe microscope

Liquid cell

Scanning probe microscope and scanning method

Cantilever holder and scanning probe microscope

Scanning probe microscopy cantilever holder and scanning probe micr...

Scanning probe microscope

Method of measurement by scanning tunneling microscope

Patents Applicationslast 30 patents

SCANNING PROBE MICROSCOPE AND SETTING METHOD THEREOF

SCANNING PROBE MICROSCOPE AND SCANNING METHOD USING THE SAME

Scanning Probe Microscope and Scanning Method Thereof

SCANNING PROBE MICROSCOPE AND PROBE CONTACT DETECTION METHOD

Scanning Probe Microscope and Measurement Range Adjusting Method fo...

Three-Dimensional Fine Movement Device

METHOD FOR MEASURING VIBRATION CHARACTERISTIC OF CANTILEVER

SCANNING PROBE MICROSCOPE

Actuator Position Calculation Device, Actuator Position Calculation...

METHOD OF MEASURING VIBRATION CHARACTERISTICS OF CANTILEVER

Softening point measuring apparatus and thermal conductivity measur...

Cantilever, cantilever system, scanning probe microscope, mass sens...

CANTILEVER, CANTILEVER SYSTEM, AND PROBE MICROSCOPE AND ADSORPTION...

SENSOR FOR OBSERVATIONS IN LIQUID ENVIRONMENTS AND OBSERVATION APPA...

Micro-protruding structure

Scanning Probe Microscope Fine-Movement Mechanism and Scanning Prob...

Electric potential difference detection method and scanning probe m...

Optical Displacement Detection Mechanism and Surface Information Me...

Cell detachment method

Cantilever and cantilever manufacturing method

Liquid cell

Vibration-type cantilever holder and scanning probe microscope

Cantilever holder and scanning probe microscope

Scanning probe microscope and scanning method

Scanning probe microscopy cantilever holder and scanning probe micr...

Micro-protruding structure

Scanning probe microscope