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Masayuki FUJISHIMA
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Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Operating device, light deflector, light deflecting device, distanc...
Patent number
12,196,947
Issue date
Jan 14, 2025
Ricoh Company, Ltd.
Masayuki Fujishima
G01 - MEASURING TESTING
Information
Patent Grant
Light deflector, distance measuring device, projection device, and...
Patent number
12,135,416
Issue date
Nov 5, 2024
Ricoh Company, Ltd.
Tetsumaru Fujita
G02 - OPTICS
Information
Patent Grant
Movable device, distance measurement device, image projection appar...
Patent number
12,091,309
Issue date
Sep 17, 2024
Ricoh Company, Ltd.
Masayuki Fujishima
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Light deflector, deflecting device, distance-measuring apparatus, i...
Patent number
12,044,839
Issue date
Jul 23, 2024
Ricoh Company, Ltd.
Masayuki Fujishima
G02 - OPTICS
Information
Patent Grant
Light deflector, LiDAR device, and image forming apparatus
Patent number
11,624,903
Issue date
Apr 11, 2023
Ricoh Company, Ltd.
Masayuki Fujishima
G01 - MEASURING TESTING
Information
Patent Grant
Movable diffraction element and spectroscope
Patent number
11,187,890
Issue date
Nov 30, 2021
Ricoh Company, Ltd.
Masayuki Fujishima
G01 - MEASURING TESTING
Information
Patent Grant
Spectrometer, analysis equipment, and wavelength-variable light source
Patent number
11,060,909
Issue date
Jul 13, 2021
Ricoh Company, Ltd.
Hidetaka Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
MEMS device
Patent number
10,544,032
Issue date
Jan 28, 2020
Ricoh Company, Ltd.
Masayuki Fujishima
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Frame, spectroscope, spectrometry unit, and image forming apparatus
Patent number
10,444,073
Issue date
Oct 15, 2019
Ricoh Company, Ltd.
Hidetaka Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
Image pickup element, imaging apparatus, and image recognition syst...
Patent number
10,178,361
Issue date
Jan 8, 2019
Ricoh Company, Ltd.
Izumi Itoh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Spectrum measuring device, spectroscopic device, and spectroscopic...
Patent number
10,119,862
Issue date
Nov 6, 2018
Ricoh Company, Ltd.
Shuichi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Spectral measurement device and analysis apparatus
Patent number
9,903,758
Issue date
Feb 27, 2018
Ricoh Company, Ltd.
Junichi Azumi
G01 - MEASURING TESTING
Information
Patent Grant
Imaging module, fabricating method therefor, and imaging device
Patent number
8,796,798
Issue date
Aug 5, 2014
Ricoh Company, Ltd.
Daiki Minegishi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
MOVABLE DEVICE, RANGE-FINDING APPARATUS, IMAGE DISPLAY APPARATUS, H...
Publication number
20230305292
Publication date
Sep 28, 2023
Masayuki FUJISHIMA
G01 - MEASURING TESTING
Information
Patent Application
MOVABLE DEVICE, DISTANCE-MEASURING DEVICE, DISPLAY DEVICE, AND WAVE...
Publication number
20220397677
Publication date
Dec 15, 2022
Masayuki FUJISHIMA
B60 - VEHICLES IN GENERAL
Information
Patent Application
OPERATING DEVICE, LIGHT DEFLECTOR, LIGHT DEFLECTING DEVICE, DISTANC...
Publication number
20220155582
Publication date
May 19, 2022
RICOH COMPANY, LTD.
MASAYUKI FUJISHIMA
G02 - OPTICS
Information
Patent Application
LIGHT DEFLECTOR, ANALYZER, RESIN IDENTIFICATION SYSTEM, AND DISTANC...
Publication number
20220137398
Publication date
May 5, 2022
Ricoh Company, Ltd.
Masami SETO
G02 - OPTICS
Information
Patent Application
LIGHT DEFLECTOR, DISTANCE MEASURING DEVICE, PROJECTION DEVICE, AND...
Publication number
20210396994
Publication date
Dec 23, 2021
RICOH COMPANY, LTD.
Tetsumaru Fujita
G01 - MEASURING TESTING
Information
Patent Application
MOVABLE DEVICE, DISTANCE MEASUREMENT DEVICE, IMAGE PROJECTION APPAR...
Publication number
20210395073
Publication date
Dec 23, 2021
RICOH COMPANY, LTD.
Masayuki FUJISHIMA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
LIGHT DEFLECTOR, DEFLECTING DEVICE, DISTANCE-MEASURING APPARATUS, I...
Publication number
20210109342
Publication date
Apr 15, 2021
Masayuki FUJISHIMA
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
LIGHT DEFLECTOR, LIDAR DEVICE, AND IMAGE FORMING APPARATUS
Publication number
20200400940
Publication date
Dec 24, 2020
RICOH COMPANY, LTD.
MASAYUKI FUJISHIMA
G02 - OPTICS
Information
Patent Application
SPECTROMETER, ANALYSIS EQUIPMENT, AND WAVELENGTH-VARIABLE LIGHT SOURCE
Publication number
20200088572
Publication date
Mar 19, 2020
Hidetaka Noguchi
G01 - MEASURING TESTING
Information
Patent Application
MOVABLE DIFFRACTION ELEMENT AND SPECTROSCOPE
Publication number
20180267293
Publication date
Sep 20, 2018
Masayuki Fujishima
G02 - OPTICS
Information
Patent Application
SPECTRUM MEASURING DEVICE, SPECTROSCOPIC DEVICE, AND SPECTROSCOPIC...
Publication number
20180252578
Publication date
Sep 6, 2018
Shuichi Suzuki
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE
Publication number
20180215608
Publication date
Aug 2, 2018
Masayuki FUJISHIMA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
IMAGE PICKUP ELEMENT, IMAGING APPARATUS, AND IMAGE RECOGNITION SYSTEM
Publication number
20170374325
Publication date
Dec 28, 2017
Izumi ITOH
G02 - OPTICS
Information
Patent Application
SPECTRAL MEASUREMENT DEVICE AND ANALYSIS APPARATUS
Publication number
20170350759
Publication date
Dec 7, 2017
RICOH COMPANY, LTD.
Junichi AZUMI
G01 - MEASURING TESTING
Information
Patent Application
IMAGING MODULE, FABRICATING METHOD THEREFOR, AND IMAGING DEVICE
Publication number
20110180893
Publication date
Jul 28, 2011
RICOH COMPANY, LTD.
Daiki MINEGISHI
H01 - BASIC ELECTRIC ELEMENTS