Masayuki ITOH

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Trouble information search method and trouble information search ap...
- Patent number 11,036,809
- Issue date Jun 15, 2021
- Fujitsu Limited
- Masayuki Itoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Crystal unit and method of adjusting crystal unit
- Patent number 10,644,672
- Issue date May 5, 2020
- Fujitsu Limited
- Hajime Kubota
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method of manufacturing coil component
- Patent number 10,629,371
- Issue date Apr 21, 2020
- Fujitsu Limited
- Masayuki Itoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Component retrieve device and component retrieve method
- Patent number 10,614,189
- Issue date Apr 7, 2020
- Fujitsu Limited
- Kiyokazu Moriizumi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Crystal oscillator, crystal resonator controlling method, and cryst...
- Patent number 10,476,435
- Issue date Nov 12, 2019
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Manufacturing method of transformer device
- Patent number 10,453,606
- Issue date Oct 22, 2019
- Fujitsu Limited
- Masayuki Itoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic component and component-embedded substrate
- Patent number 10,395,832
- Issue date Aug 27, 2019
- Fujitsu Limited
- Tomokazu Nakashima
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Crystal oscillator device and method of measuring crystal oscillato...
- Patent number 10,355,640
- Issue date Jul 16, 2019
- Fujitsu Limited
- Masakazu Kishi
- G01 - MEASURING TESTING
Information Patent Grant
Crystal oscillator device and method of measuring crystal oscillato...
- Patent number 10,355,641
- Issue date Jul 16, 2019
- Fujitsu Limited
- Masakazu Kishi
- G01 - MEASURING TESTING
Information Patent Grant
Crystal oscillator device and method of measuring crystal oscillato...
- Patent number 10,340,850
- Issue date Jul 2, 2019
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Crystal oscillator device and method of measuring crystal oscillato...
- Patent number 10,333,480
- Issue date Jun 25, 2019
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electronic component and component-embedded substrate
- Patent number 10,283,270
- Issue date May 7, 2019
- Fujitsu Limited
- Tomokazu Nakashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for inspecting crystal unit by analyzing frequency character...
- Patent number 10,267,755
- Issue date Apr 23, 2019
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Crystal oscillator device and method of measuring crystal oscillato...
- Patent number 10,256,771
- Issue date Apr 9, 2019
- Fujitsu Limited
- Masakazu Kishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing transformer apparatus
- Patent number 10,102,957
- Issue date Oct 16, 2018
- FUITSU LIMITED
- Masayuki Itoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal unit and method of adjusting crystal unit
- Patent number 10,090,110
- Issue date Oct 2, 2018
- Fujitsu Limited
- Hajime Kubota
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic part bonding substrate
- Patent number 10,028,387
- Issue date Jul 17, 2018
- Fujitsu Limited
- Katsumi Takada
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Crystal unit, oscillator, and method for fabricating the crystal unit
- Patent number 9,929,692
- Issue date Mar 27, 2018
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Crystal unit
- Patent number 9,921,257
- Issue date Mar 20, 2018
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Inductor manufacturing method
- Patent number 9,892,852
- Issue date Feb 13, 2018
- Fujitsu Limited
- Masayuki Itoh
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Method of manufacturing capacitor including intermediate dielectric...
- Patent number 9,865,396
- Issue date Jan 9, 2018
- Fujitsu Limited
- Tomokazu Nakashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crystal resonator, and production method therefor
- Patent number 9,853,627
- Issue date Dec 26, 2017
- Fujitsu Limited
- Hajime Kubota
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Coil component and method of manufacturing coil component
- Patent number 9,812,257
- Issue date Nov 7, 2017
- Fujitsu Limited
- Masayuki Itoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of measuring characteristics of crystal unit
- Patent number 9,778,096
- Issue date Oct 3, 2017
- Fujitsu Limited
- Masakazu Kishi
- G01 - MEASURING TESTING
Information Patent Grant
Crystal unit, oscillator, and method for fabricating the crystal unit
- Patent number 9,774,296
- Issue date Sep 26, 2017
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Transformer apparatus and method for manufacturing transformer appa...
- Patent number 9,570,223
- Issue date Feb 14, 2017
- Fujitsu Limited
- Masayuki Itoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic component assembly apparatus
- Patent number 9,545,044
- Issue date Jan 10, 2017
- Fujitsu Limited
- Katsumi Takada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic component inspection apparatus and method
- Patent number 9,541,602
- Issue date Jan 10, 2017
- Fujitsu Limited
- Hiroshi Kurosawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of production of transformer module
- Patent number 9,536,661
- Issue date Jan 3, 2017
- Fujitsu Limited
- Masayuki Itoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transformer device and manufacturing method thereof
- Patent number 9,524,819
- Issue date Dec 20, 2016
- Fujitsu Limited
- Masayuki Itoh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CALCULATION OF A TRANSPORTATION ROUTE BASED ON A CHARACTERISTIC CHA...
- Publication number 20200090120
- Publication date Mar 19, 2020
- Fujitsu Limited
- Tomokazu NAKASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC COMPONENT AND COMPONENT-EMBEDDED SUBSTRATE
- Publication number 20190180939
- Publication date Jun 13, 2019
- Fujitsu Limited
- Tomokazu NAKASHIMA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
COMPONENT RETRIEVE DEVICE AND COMPONENT RETRIEVE METHOD
- Publication number 20180330035
- Publication date Nov 15, 2018
- Fujitsu Limited
- Kiyokazu Moriizumi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TROUBLE INFORMATION SEARCH METHOD AND TROUBLE INFORMATION SEARCH AP...
- Publication number 20180329901
- Publication date Nov 15, 2018
- Fujitsu Limited
- Masayuki ITOH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC COMPONENT
- Publication number 20180240605
- Publication date Aug 23, 2018
- Fujitsu Limited
- Tomokazu NAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL UNIT
- Publication number 20180164360
- Publication date Jun 14, 2018
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTRONIC PART BONDING SUBSTRATE
- Publication number 20180153029
- Publication date May 31, 2018
- Fujitsu Limited
- Katsumi Takada
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATO...
- Publication number 20170359021
- Publication date Dec 14, 2017
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATO...
- Publication number 20170359023
- Publication date Dec 14, 2017
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATO...
- Publication number 20170359026
- Publication date Dec 14, 2017
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATO...
- Publication number 20170359044
- Publication date Dec 14, 2017
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATO...
- Publication number 20170359022
- Publication date Dec 14, 2017
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CRYSTAL OSCILLATOR, CRYSTAL RESONATOR CONTROLLING METHOD, AND CRYST...
- Publication number 20170359025
- Publication date Dec 14, 2017
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
COIL COMPONENT AND METHOD OF MANUFACTURING COIL COMPONENT
- Publication number 20170278629
- Publication date Sep 28, 2017
- Fujitsu Limited
- Masayuki ITOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL UNIT AND METHOD OF ADJUSTING CRYSTAL UNIT
- Publication number 20170099039
- Publication date Apr 6, 2017
- Fujitsu Limited
- Hajime KUBOTA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CRYSTAL UNIT AND METHOD OF ADJUSTING CRYSTAL UNIT
- Publication number 20170098507
- Publication date Apr 6, 2017
- Fujitsu Limited
- Hajime KUBOTA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL UNIT, OSCILLATOR, AND METHOD FOR FABRICATING THE CRYSTAL UNIT
- Publication number 20170093337
- Publication date Mar 30, 2017
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CRYSTAL UNIT, OSCILLATOR, AND METHOD FOR FABRICATING THE CRYSTAL UNIT
- Publication number 20170093335
- Publication date Mar 30, 2017
- Fujitsu Limited
- Masakazu Kishi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MANUFACTURING METHOD OF TRANSFORMER DEVICE
- Publication number 20170062128
- Publication date Mar 2, 2017
- Fujitsu Limited
- Masayuki ITOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC COMPONENT AND COMPONENT-EMBEDDED SUBSTRATE
- Publication number 20170019999
- Publication date Jan 19, 2017
- FUJITSU LIMITED
- Tomokazu NAKASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSFORMER APPARATUS AND METHOD FOR MANUFACTURING TRANSFORMER APPA...
- Publication number 20160322161
- Publication date Nov 3, 2016
- Fujitsu Limited
- Masayuki ITOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL UNIT
- Publication number 20160231368
- Publication date Aug 11, 2016
- Fujitsu Limited
- Masakazu Kishi
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING CRYSTAL UNIT
- Publication number 20160223391
- Publication date Aug 4, 2016
- Fujitsu Limited
- Masakazu Kishi
- G01 - MEASURING TESTING
Information Patent Application
COMPONENT SELECTION DEVICE AND COMPONENT SELECTION METHOD
- Publication number 20160155089
- Publication date Jun 2, 2016
- Fujitsu Limited
- Tomokazu NAKASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INDUCTOR MANUFACTURING METHOD
- Publication number 20160141101
- Publication date May 19, 2016
- Fujitsu Limited
- Masayuki ITOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MEASURING CHARACTERISTICS OF CRYSTAL UNIT
- Publication number 20160123797
- Publication date May 5, 2016
- Fujitsu Limited
- Masakazu Kishi
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT SYSTEM
- Publication number 20160109496
- Publication date Apr 21, 2016
- Fujitsu Limited
- Masakazu Kishi
- G01 - MEASURING TESTING
Information Patent Application
CAPACITOR AND METHOD OF MANUFACTURING CAPACITOR
- Publication number 20160055977
- Publication date Feb 25, 2016
- Fujitsu Limited
- Tomokazu Nakashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CRYSTAL UNIT AND DEVICE FOR MEASURING CHARACTERISTICS OF THE CRYSTA...
- Publication number 20160011248
- Publication date Jan 14, 2016
- Fujitsu Limited
- Masakazu Kishi
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL UNIT AND METHOD OF MEASURING CHARACTERISTICS OF THE CRYSTAL...
- Publication number 20160003877
- Publication date Jan 7, 2016
- Fujitsu Limited
- Masakazu Kishi
- G01 - MEASURING TESTING

Masayuki ITOH

Person

Patents Grantslast 30 patents

Trouble information search method and trouble information search ap...

Crystal unit and method of adjusting crystal unit

Method of manufacturing coil component

Component retrieve device and component retrieve method

Crystal oscillator, crystal resonator controlling method, and cryst...

Manufacturing method of transformer device

Electronic component and component-embedded substrate

Crystal oscillator device and method of measuring crystal oscillato...

Crystal oscillator device and method of measuring crystal oscillato...

Crystal oscillator device and method of measuring crystal oscillato...

Crystal oscillator device and method of measuring crystal oscillato...

Electronic component and component-embedded substrate

Method for inspecting crystal unit by analyzing frequency character...

Crystal oscillator device and method of measuring crystal oscillato...

Method for manufacturing transformer apparatus

Crystal unit and method of adjusting crystal unit

Electronic part bonding substrate

Crystal unit, oscillator, and method for fabricating the crystal unit

Crystal unit

Inductor manufacturing method

Method of manufacturing capacitor including intermediate dielectric...

Crystal resonator, and production method therefor

Coil component and method of manufacturing coil component

Method of measuring characteristics of crystal unit

Crystal unit, oscillator, and method for fabricating the crystal unit

Transformer apparatus and method for manufacturing transformer appa...

Electronic component assembly apparatus

Electronic component inspection apparatus and method

Method of production of transformer module

Transformer device and manufacturing method thereof

Patents Applicationslast 30 patents

CALCULATION OF A TRANSPORTATION ROUTE BASED ON A CHARACTERISTIC CHA...

ELECTRONIC COMPONENT AND COMPONENT-EMBEDDED SUBSTRATE

COMPONENT RETRIEVE DEVICE AND COMPONENT RETRIEVE METHOD

TROUBLE INFORMATION SEARCH METHOD AND TROUBLE INFORMATION SEARCH AP...

ELECTRONIC COMPONENT

CRYSTAL UNIT

ELECTRONIC PART BONDING SUBSTRATE

CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATO...

CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATO...

CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATO...

CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATO...

CRYSTAL OSCILLATOR DEVICE AND METHOD OF MEASURING CRYSTAL OSCILLATO...

CRYSTAL OSCILLATOR, CRYSTAL RESONATOR CONTROLLING METHOD, AND CRYST...

COIL COMPONENT AND METHOD OF MANUFACTURING COIL COMPONENT

CRYSTAL UNIT AND METHOD OF ADJUSTING CRYSTAL UNIT

CRYSTAL UNIT AND METHOD OF ADJUSTING CRYSTAL UNIT

CRYSTAL UNIT, OSCILLATOR, AND METHOD FOR FABRICATING THE CRYSTAL UNIT

CRYSTAL UNIT, OSCILLATOR, AND METHOD FOR FABRICATING THE CRYSTAL UNIT

MANUFACTURING METHOD OF TRANSFORMER DEVICE

ELECTRONIC COMPONENT AND COMPONENT-EMBEDDED SUBSTRATE

TRANSFORMER APPARATUS AND METHOD FOR MANUFACTURING TRANSFORMER APPA...

CRYSTAL UNIT

METHOD FOR INSPECTING CRYSTAL UNIT

COMPONENT SELECTION DEVICE AND COMPONENT SELECTION METHOD

INDUCTOR MANUFACTURING METHOD

METHOD OF MEASURING CHARACTERISTICS OF CRYSTAL UNIT

MEASUREMENT METHOD AND MEASUREMENT SYSTEM

CAPACITOR AND METHOD OF MANUFACTURING CAPACITOR

CRYSTAL UNIT AND DEVICE FOR MEASURING CHARACTERISTICS OF THE CRYSTA...

CRYSTAL UNIT AND METHOD OF MEASURING CHARACTERISTICS OF THE CRYSTAL...