Masayuki Mizuno

Person

Toyko, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wireless communication system and data transmitter
- Patent number 9,391,686
- Issue date Jul 12, 2016
- Renesas Electronics Corporation
- Hidetoshi Ikeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wireless communication system and data transmitter
- Patent number 9,287,968
- Issue date Mar 15, 2016
- Renesas Electronics Corporation
- Hidetoshi Ikeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wireless communication system, wireless communication method, radio...
- Patent number 9,183,422
- Issue date Nov 10, 2015
- Renesas Electronics Corporation
- Haruya Ishizaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Radio communication system, radio communication method, and data tr...
- Patent number 8,891,413
- Issue date Nov 18, 2014
- Renesas Electronics Corporation
- Haruya Ishizaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Redundant computing system and redundant computing method
- Patent number 8,862,934
- Issue date Oct 14, 2014
- NEC Corporation
- Yoshio Kameda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Aging diagnostic device, aging diagnostic method
- Patent number 8,674,774
- Issue date Mar 18, 2014
- NEC Corporation
- Eisuke Saneyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Signal measuring device and signal measuring method
- Patent number 8,635,040
- Issue date Jan 21, 2014
- NEC Corporation
- Koichi Nose
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of testing the same
- Patent number 8,513,970
- Issue date Aug 20, 2013
- NEC Corporation
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measuring device and method
- Patent number 8,444,316
- Issue date May 21, 2013
- NEC Corporation
- Eisuke Saneyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device with test circuit and test...
- Patent number 8,446,162
- Issue date May 21, 2013
- NEC Corporation
- Koichi Nose
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing device, semiconductor device, and testing method
- Patent number 8,441,277
- Issue date May 14, 2013
- NEC Corporation
- Koichiro Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Allocating task groups to processor cores based on number of task a...
- Patent number 8,429,663
- Issue date Apr 23, 2013
- NEC Corporation
- Masamichi Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 8,399,960
- Issue date Mar 19, 2013
- NEC Corporation
- Yoshihiro Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal quality measurement device, spectrum measurement circuit, an...
- Patent number 8,355,884
- Issue date Jan 15, 2013
- NEC Corporation
- Koichi Nose
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor device to detect abnormal leakage current caused by a...
- Patent number 8,330,483
- Issue date Dec 11, 2012
- NEC Corporation
- Masayuki Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,330,254
- Issue date Dec 11, 2012
- Renesas Electronics Corporation
- Masayuki Furumiya
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for performing a screening test of semiconduct...
- Patent number 8,301,936
- Issue date Oct 30, 2012
- NEC Corporation
- Hiroaki Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 8,243,467
- Issue date Aug 14, 2012
- NEC Corporation
- Yoshihiro Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Clock generating circuit and clock generating method
- Patent number 8,242,814
- Issue date Aug 14, 2012
- NEC Corporation
- Koichi Nose
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Microstrip structure including a signal line with a plurality of sl...
- Patent number 8,178,974
- Issue date May 15, 2012
- NEC Corporation
- Masayuki Mizuno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuits and method of detecting faults of...
- Patent number 8,140,912
- Issue date Mar 20, 2012
- NEC Corporation
- Hiroaki Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heat shield plate for substrate annealing apparatus
- Patent number 8,118,591
- Issue date Feb 21, 2012
- IHI Corporation
- Terumasa Ishihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Amplifying apparatus, method of output control and control program
- Patent number 8,115,540
- Issue date Feb 14, 2012
- NEC Corporation
- Koichi Nose
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit and method for parallel testing and semiconductor device
- Patent number 8,115,507
- Issue date Feb 14, 2012
- NEC Corporation
- Masayuki Mizuno
- G11 - INFORMATION STORAGE
Information Patent Grant
Information processing device and failure concealing method therefor
- Patent number 8,108,719
- Issue date Jan 31, 2012
- NEC Corporation
- Hiroaki Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit, method, and semiconductor device
- Patent number 8,093,919
- Issue date Jan 10, 2012
- NEC Corporation
- Masayuki Mizuno
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,084,768
- Issue date Dec 27, 2011
- NEC Corporation
- Shunichi Kaeriyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Clock adjusting circuit and semiconductor integrated circuit device
- Patent number 8,072,253
- Issue date Dec 6, 2011
- NEC Corporation
- Shunichi Kaeriyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Light receiving circuit and digital system
- Patent number 8,023,832
- Issue date Sep 20, 2011
- NEC Corporation
- Masayuki Mizuno
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Signal measuring device
- Patent number 8,019,560
- Issue date Sep 13, 2011
- NEC Corporation
- Koichi Nose
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WIRELESS COMMUNICATION SYSTEM AND DATA TRANSMITTER
- Publication number 20160134350
- Publication date May 12, 2016
- RENESAS ELECTRONICS CORPORATION
- Hidetoshi Ikeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
WIRELESS COMMUNICATION SYSTEM AND DATA TRANSMITTER
- Publication number 20150057038
- Publication date Feb 26, 2015
- Renesas Electronics Corporation
- Hidetoshi Ikeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RADIO COMMUNICATION SYSTEM, RADIO COMMUNICATION METHOD, AND DATA TR...
- Publication number 20150038088
- Publication date Feb 5, 2015
- RENESAS ELECTRONICS CORPORATION
- Haruya ISHIZAKI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RADIO COMMUNICATION SYSTEM, RADIO COMMUNICATION METHOD, AND DATA TR...
- Publication number 20130058263
- Publication date Mar 7, 2013
- RENESAS ELECTRONICS CORPORATION
- Haruya ISHIZAKI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
REDUNDANT COMPUTING SYSTEM AND REDUNDANT COMPUTING METHOD
- Publication number 20120233506
- Publication date Sep 13, 2012
- Yoshio Kameda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AGING DIAGNOSTIC DEVICE, AGING DIAGNOSTIC METHOD
- Publication number 20120161885
- Publication date Jun 28, 2012
- NEC Corporation
- Eisuke Saneyoshi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
WIRELESS COMMUNICATION SYSTEM, WIRELESS COMMUNICATION METHOD, RADIO...
- Publication number 20120062369
- Publication date Mar 15, 2012
- RENESAS ELECTRONICS CORPORATION
- Haruya ISHIZAKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRONIC CIRCUIT, CIRCUIT APPARATUS, TEST SYSTEM, CONTROL METHOD...
- Publication number 20120025790
- Publication date Feb 2, 2012
- NEC Corporation
- Koichiro Noguchi
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME
- Publication number 20110260747
- Publication date Oct 27, 2011
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110012228
- Publication date Jan 20, 2011
- NEC Corporation
- Yoshihiro Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110006443
- Publication date Jan 13, 2011
- NEC Corporation
- Koichiro Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110007554
- Publication date Jan 13, 2011
- NEC Corporation
- Shunichi Kaeriyama
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR DEVICE, AND TESTING METHOD
- Publication number 20100283497
- Publication date Nov 11, 2010
- NEC Corporation
- Koichiro Noguchi
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE MEASURING DEVICE AND METHOD
- Publication number 20100272149
- Publication date Oct 28, 2010
- Eisuke Saneyoshi
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TEST METHOD THEREFOR
- Publication number 20100259292
- Publication date Oct 14, 2010
- Koichi Nose
- G01 - MEASURING TESTING
Information Patent Application
FAILURE PREDICTION CIRCUIT AND METHOD, AND SEMICONDUCTOR INTEGRATED...
- Publication number 20100251046
- Publication date Sep 30, 2010
- Masayuki Mizuno
- G01 - MEASURING TESTING
Information Patent Application
MODULATION DEVICE AND PULSE WAVE GENERATION DEVICE
- Publication number 20100176893
- Publication date Jul 15, 2010
- Koichi Nose
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20100164053
- Publication date Jul 1, 2010
- NEC ELECTRONICS CORPORATION
- Masayuki FURUMIYA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUITS AND METHOD OF DETECTING FAULTS OF...
- Publication number 20100153784
- Publication date Jun 17, 2010
- Hiroaki Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROGRAM CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT, VOLTAGE APPLICAT...
- Publication number 20100134140
- Publication date Jun 3, 2010
- NEC CORPORATION
- Shunichi Kaeriyama
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TASK GROUP ALLOCATING METHOD, TASK GROUP ALLOCATING DEVICE, TASK GR...
- Publication number 20100100886
- Publication date Apr 22, 2010
- Masamichi Takagi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL QUALITY MEASUREMENT DEVICE, SPECTRUM MEASUREMENT CIRCUIT, AN...
- Publication number 20100094577
- Publication date Apr 15, 2010
- Koichi Nose
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
APPARATUS AND METHOD FOR PERFORMING A SCREENING TEST OF SEMICONDUCT...
- Publication number 20100077259
- Publication date Mar 25, 2010
- Hiroaki Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20100066401
- Publication date Mar 18, 2010
- Masayuki Mizuno
- G01 - MEASURING TESTING
Information Patent Application
CLOCK SIGNAL DIVIDING CIRCUIT
- Publication number 20100052753
- Publication date Mar 4, 2010
- Atsufumi Shibayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT AND METHOD FOR PARALLEL TESTING AND SEMICONDUCTOR DEVICE
- Publication number 20100052724
- Publication date Mar 4, 2010
- Masayuki Mizuno
- G01 - MEASURING TESTING
Information Patent Application
AMPLIFYING APPARATUS, METHOD OF OUTPUT CONTROL AND CONTROL PROGRAM
- Publication number 20100052792
- Publication date Mar 4, 2010
- Koichi Nose
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST CIRCUIT, METHOD, AND SEMICONDUCTOR DEVICE
- Publication number 20100045332
- Publication date Feb 25, 2010
- Masayuki Mizuno
- G01 - MEASURING TESTING
Information Patent Application
AMPLIFICATION CIRCUIT, AMPLIFICATION CIRCUIT NOISE REDUCING METHOD...
- Publication number 20100045372
- Publication date Feb 25, 2010
- Haruya Ishizaki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CLOCK ADJUSTING CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
- Publication number 20100039157
- Publication date Feb 18, 2010
- Shunichi Kaeriyama
- G06 - COMPUTING CALCULATING COUNTING

Masayuki Mizuno

Person

Patents Grantslast 30 patents

Wireless communication system and data transmitter

Wireless communication system and data transmitter

Wireless communication system, wireless communication method, radio...

Radio communication system, radio communication method, and data tr...

Redundant computing system and redundant computing method

Aging diagnostic device, aging diagnostic method

Signal measuring device and signal measuring method

Semiconductor device and method of testing the same

Temperature measuring device and method

Semiconductor integrated circuit device with test circuit and test...

Semiconductor testing device, semiconductor device, and testing method

Allocating task groups to processor cores based on number of task a...

Semiconductor device

Signal quality measurement device, spectrum measurement circuit, an...

Semiconductor device to detect abnormal leakage current caused by a...

Semiconductor device

Apparatus and method for performing a screening test of semiconduct...

Semiconductor device

Clock generating circuit and clock generating method

Microstrip structure including a signal line with a plurality of sl...

Semiconductor integrated circuits and method of detecting faults of...

Heat shield plate for substrate annealing apparatus

Amplifying apparatus, method of output control and control program

Circuit and method for parallel testing and semiconductor device

Information processing device and failure concealing method therefor

Test circuit, method, and semiconductor device

Semiconductor device

Clock adjusting circuit and semiconductor integrated circuit device

Light receiving circuit and digital system

Signal measuring device

Patents Applicationslast 30 patents

WIRELESS COMMUNICATION SYSTEM AND DATA TRANSMITTER

WIRELESS COMMUNICATION SYSTEM AND DATA TRANSMITTER

RADIO COMMUNICATION SYSTEM, RADIO COMMUNICATION METHOD, AND DATA TR...

RADIO COMMUNICATION SYSTEM, RADIO COMMUNICATION METHOD, AND DATA TR...

REDUNDANT COMPUTING SYSTEM AND REDUNDANT COMPUTING METHOD

AGING DIAGNOSTIC DEVICE, AGING DIAGNOSTIC METHOD

WIRELESS COMMUNICATION SYSTEM, WIRELESS COMMUNICATION METHOD, RADIO...

ELECTRONIC CIRCUIT, CIRCUIT APPARATUS, TEST SYSTEM, CONTROL METHOD...

SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR DEVICE, AND TESTING METHOD

TEMPERATURE MEASURING DEVICE AND METHOD

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TEST METHOD THEREFOR

FAILURE PREDICTION CIRCUIT AND METHOD, AND SEMICONDUCTOR INTEGRATED...

MODULATION DEVICE AND PULSE WAVE GENERATION DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR INTEGRATED CIRCUITS AND METHOD OF DETECTING FAULTS OF...

PROGRAM CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT, VOLTAGE APPLICAT...

TASK GROUP ALLOCATING METHOD, TASK GROUP ALLOCATING DEVICE, TASK GR...

SIGNAL QUALITY MEASUREMENT DEVICE, SPECTRUM MEASUREMENT CIRCUIT, AN...

APPARATUS AND METHOD FOR PERFORMING A SCREENING TEST OF SEMICONDUCT...

SEMICONDUCTOR DEVICE

CLOCK SIGNAL DIVIDING CIRCUIT

CIRCUIT AND METHOD FOR PARALLEL TESTING AND SEMICONDUCTOR DEVICE

AMPLIFYING APPARATUS, METHOD OF OUTPUT CONTROL AND CONTROL PROGRAM

TEST CIRCUIT, METHOD, AND SEMICONDUCTOR DEVICE

AMPLIFICATION CIRCUIT, AMPLIFICATION CIRCUIT NOISE REDUCING METHOD...

CLOCK ADJUSTING CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE