Masayuki Nara

Person

Tsukuba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus and measurement method
- Patent number 11,867,809
- Issue date Jan 9, 2024
- Mitutoyo Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method
- Patent number 11,656,074
- Issue date May 23, 2023
- Mitutoyo Corporation
- Yuto Inoue
- G01 - MEASURING TESTING
Information Patent Grant
Measurement point determination method, non-transitory storage medi...
- Patent number 11,530,908
- Issue date Dec 20, 2022
- Mitutoyo Corporation
- Takeshi Hagino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Calibration method
- Patent number 11,525,664
- Issue date Dec 13, 2022
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Spatial accuracy correction method and apparatus
- Patent number 11,366,448
- Issue date Jun 21, 2022
- Mitutoyo Corporation
- Shinichiro Yanaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spatial accuracy correction method and apparatus
- Patent number 11,366,447
- Issue date Jun 21, 2022
- Mitutoyo Corporation
- Shinichiro Yanaka
- G05 - CONTROLLING REGULATING
Information Patent Grant
Inspection method, correction method, and inspection device
- Patent number 11,359,910
- Issue date Jun 14, 2022
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting positioning machine by laser tr...
- Patent number 10,557,941
- Issue date Feb 11, 2020
- Mitutoyo Corporation
- Shinichirou Yanaka
- G01 - MEASURING TESTING
Information Patent Grant
Index error estimating apparatus, index error calibrating apparatus...
- Patent number 9,335,186
- Issue date May 10, 2016
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Laser tracking interferometer
- Patent number 9,316,487
- Issue date Apr 19, 2016
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Tracking type laser gauge interferometer with rotation mechanism co...
- Patent number 8,514,405
- Issue date Aug 20, 2013
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and interferometer
- Patent number 8,175,743
- Issue date May 8, 2012
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional lattice calibrating device, two-dimensional lattice...
- Patent number 7,765,079
- Issue date Jul 27, 2010
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method and measurement apparatus using tracking type la...
- Patent number 7,583,374
- Issue date Sep 1, 2009
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Form measuring device, form measuring method, form analysis device,...
- Patent number 7,483,807
- Issue date Jan 27, 2009
- Mitutoyo Corporation
- Masayuki Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and program for estimating uncertainty
- Patent number 7,225,104
- Issue date May 29, 2007
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Form measuring device, form measuring method, form analysis device,...
- Patent number 7,188,046
- Issue date Mar 6, 2007
- Mitutoyo Corporation
- Masayuki Nara
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL-MEASURING-APPARATUS INSPECTION GAUGES, THREE-DIME...
- Publication number 20230136366
- Publication date May 4, 2023
- MITUTOYO CORPORATION
- Yuto INOUE
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD
- Publication number 20220333920
- Publication date Oct 20, 2022
- MITUTOYO CORPORATION
- Yuto INOUE
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION METHOD
- Publication number 20220042782
- Publication date Feb 10, 2022
- MITUTOYO CORPORATION
- Masayuki NARA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD, CORRECTION METHOD, AND INSPECTION DEVICE
- Publication number 20210063139
- Publication date Mar 4, 2021
- MITUTOYO CORPORATION
- Masayuki NARA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD
- Publication number 20210011155
- Publication date Jan 14, 2021
- Mitutoyo Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT POINT DETERMINATION METHOD, NON-TRANSITORY STORAGE MEDI...
- Publication number 20200072591
- Publication date Mar 5, 2020
- MITUTOYO CORPORATION
- Takeshi HAGINO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPATIAL ACCURACY CORRECTION METHOD AND APPARATUS
- Publication number 20190187660
- Publication date Jun 20, 2019
- MITUTOYO CORPORATION
- Shinichiro YANAKA
- G05 - CONTROLLING REGULATING
Information Patent Application
SPATIAL ACCURACY CORRECTION METHOD AND APPARATUS
- Publication number 20190187661
- Publication date Jun 20, 2019
- MITUTOYO CORPORATION
- Shinichiro YANAKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING POSITIONING MACHINE BY LASER TR...
- Publication number 20180038960
- Publication date Feb 8, 2018
- MITUTOYO CORPORATION
- Shinichirou YANAKA
- G01 - MEASURING TESTING
Information Patent Application
LASER TRACKING INTERFEROMETER
- Publication number 20140347673
- Publication date Nov 27, 2014
- MITUTOYO CORPORATION
- Masayuki NARA
- G01 - MEASURING TESTING
Information Patent Application
INDEX ERROR ESTIMATING APPARATUS, INDEX ERROR CALIBRATING APPARATUS...
- Publication number 20130019652
- Publication date Jan 24, 2013
- MITUTOYO CORPORATION
- Masayuki NARA
- G01 - MEASURING TESTING
Information Patent Application
TRACKING TYPE LASER GAUGE INTERFEROMETER
- Publication number 20110069319
- Publication date Mar 24, 2011
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND INTERFEROMETER
- Publication number 20100211206
- Publication date Aug 19, 2010
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Application
Two-dimensional lattice calibrating device, two-dimensional lattice...
- Publication number 20080294364
- Publication date Nov 27, 2008
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT APPARATUS USING TRACKING TYPE LA...
- Publication number 20080259311
- Publication date Oct 23, 2008
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Application
Form measuring device, form measuring method, form analysis device,...
- Publication number 20070112541
- Publication date May 17, 2007
- Mitutoyo Corporation
- Masayuki Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and program for estimating uncertainty
- Publication number 20060149507
- Publication date Jul 6, 2006
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Application
Form measuring device, form measuring method, form analysis device,...
- Publication number 20050065751
- Publication date Mar 24, 2005
- Mitutoyo Corporation
- Masayuki Nara
- G06 - COMPUTING CALCULATING COUNTING

Masayuki Nara

Person

Patents Grantslast 30 patents

Measurement apparatus and measurement method

Calibration method

Measurement point determination method, non-transitory storage medi...

Calibration method

Spatial accuracy correction method and apparatus

Spatial accuracy correction method and apparatus

Inspection method, correction method, and inspection device

Method and apparatus for inspecting positioning machine by laser tr...

Index error estimating apparatus, index error calibrating apparatus...

Laser tracking interferometer

Tracking type laser gauge interferometer with rotation mechanism co...

Measurement system and interferometer

Two-dimensional lattice calibrating device, two-dimensional lattice...

Measurement method and measurement apparatus using tracking type la...

Form measuring device, form measuring method, form analysis device,...

Method and program for estimating uncertainty

Form measuring device, form measuring method, form analysis device,...

Patents Applicationslast 30 patents

THREE-DIMENSIONAL-MEASURING-APPARATUS INSPECTION GAUGES, THREE-DIME...

CALIBRATION METHOD

CALIBRATION METHOD

INSPECTION METHOD, CORRECTION METHOD, AND INSPECTION DEVICE

MEASUREMENT APPARATUS AND MEASUREMENT METHOD

MEASUREMENT POINT DETERMINATION METHOD, NON-TRANSITORY STORAGE MEDI...

SPATIAL ACCURACY CORRECTION METHOD AND APPARATUS

SPATIAL ACCURACY CORRECTION METHOD AND APPARATUS

METHOD AND APPARATUS FOR INSPECTING POSITIONING MACHINE BY LASER TR...

LASER TRACKING INTERFEROMETER

INDEX ERROR ESTIMATING APPARATUS, INDEX ERROR CALIBRATING APPARATUS...

TRACKING TYPE LASER GAUGE INTERFEROMETER

MEASUREMENT SYSTEM AND INTERFEROMETER

Two-dimensional lattice calibrating device, two-dimensional lattice...

MEASUREMENT METHOD AND MEASUREMENT APPARATUS USING TRACKING TYPE LA...

Form measuring device, form measuring method, form analysis device,...

Method and program for estimating uncertainty

Form measuring device, form measuring method, form analysis device,...