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Mathias M. Schubert
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Lincoln, NE, US
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Patents Grants
last 30 patents
Information
Patent Grant
Optical sensing and separation based on ordered 3D nanostructured s...
Patent number
10,190,978
Issue date
Jan 29, 2019
Nutech Ventures
Mathias M. Schubert
G01 - MEASURING TESTING
Information
Patent Grant
Birefringence imaging chromatography based on highly ordered 3D nan...
Patent number
10,101,265
Issue date
Oct 16, 2018
BOARD OF REGENTS FOR THE UNIVERSITY OF NEBRASKA
Mathias M. Schubert
G01 - MEASURING TESTING
Information
Patent Grant
Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, n...
Patent number
10,073,120
Issue date
Sep 11, 2018
Board of Regents for the University of Nebraska
Tino Hofmann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Combined use of oscillating means and ellipsometry to determine unc...
Patent number
10,048,059
Issue date
Aug 14, 2018
J. A. Woollam Co., Inc.
Mathias M. Schubert
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Grant
Method of obtaining micrographs of transparent or semi-transparent...
Patent number
10,026,167
Issue date
Jul 17, 2018
Board of Regents of the University of Nebraska
Tino Hofmann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated mid-infrared, far infrared and terahertz optical Hall ef...
Patent number
9,851,294
Issue date
Dec 26, 2017
J. A. Woollam Co., Inc.
Tino Hofmann
G01 - MEASURING TESTING
Information
Patent Grant
Optical sensing and separation based on ordered three-dimensional n...
Patent number
9,739,710
Issue date
Aug 22, 2017
Nutech Ventures
Mathias M. Schubert
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz-infrared ellipsometer system, and method of use
Patent number
9,041,927
Issue date
May 26, 2015
J. A. Woollam Co., Inc.
Craig M. Herzinger
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz-infrared ellipsometer system, and method of use
Patent number
8,934,096
Issue date
Jan 13, 2015
University of Nebraska Board of Regents
Craig M. Herzinger
G01 - MEASURING TESTING
Information
Patent Grant
Polarization-coupled ferroelectric unipolar junction memory and ene...
Patent number
8,711,599
Issue date
Apr 29, 2014
Nutech Ventures
Mathias M. Schubert
G11 - INFORMATION STORAGE
Information
Patent Grant
Terahertz-infrared ellipsometer system, and method of use
Patent number
8,705,032
Issue date
Apr 22, 2014
J. A. Woollam Co., Inc.
Craig M. Herzinger
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz resonator
Patent number
8,507,860
Issue date
Aug 13, 2013
Nutech Ventures
Eva Schubert
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Terahertz-infrared ellipsometer system, and method of use
Patent number
8,488,119
Issue date
Jul 16, 2013
J. A. Woollam Co., Inc.
Craig M. Herzinger
G01 - MEASURING TESTING
Information
Patent Grant
Mass sensor
Patent number
8,441,635
Issue date
May 14, 2013
Nutech Ventures
Mathias M. Schubert
G01 - MEASURING TESTING
Information
Patent Grant
Terahertz-infrared ellipsometer system, and method of use
Patent number
8,416,408
Issue date
Apr 9, 2013
J. A. Woollam Co., Inc.
Craig M. Herzinger
G01 - MEASURING TESTING
Information
Patent Grant
Empirical correction for spectroscopic ellipsometric measurements o...
Patent number
8,248,607
Issue date
Aug 21, 2012
J. A. Woollam Co., Inc.
Craig M. Herzinger
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS UTILIZING LONG WAVELENGTH ELECTROMAGNETIC RADIA...
Publication number
20210090857
Publication date
Mar 25, 2021
SEAGATE TECHNOLOGY LLC
Minna Hovinen
G01 - MEASURING TESTING
Information
Patent Application
Optical Sensing and Separation Based on Ordered 3D Nanostructured S...
Publication number
20180024055
Publication date
Jan 25, 2018
NUTECH VENTURES
Mathias M. Schubert
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS UTILIZING LONG WAVELENGTH ELECTROMAGNETIC RADIA...
Publication number
20160041089
Publication date
Feb 11, 2016
Minna Hovinen
G01 - MEASURING TESTING
Information
Patent Application
TERAHERTZ-INFRARED ELLIPSOMETER SYSTEM, AND METHOD OF USE
Publication number
20150153230
Publication date
Jun 4, 2015
REGENTS OF THE UNIVERSITY OF NEBRASKA (50%)
Craig M. Herzinger
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL SENSING AND SEPARATION BASED ON ORDERED THREE-DIMENSIONAL N...
Publication number
20140106980
Publication date
Apr 17, 2014
Mathias M. Schubert
G01 - MEASURING TESTING
Information
Patent Application
Terahertz-infrared ellipsometer system, and method of use
Publication number
20140027644
Publication date
Jan 30, 2014
REGENTS OF THE UNIVERSITY OF NEBRASKA (50%)
Craig M. Herzinger
G01 - MEASURING TESTING
Information
Patent Application
Terahertz-infrared ellipsometer system, and method of use
Publication number
20120261580
Publication date
Oct 18, 2012
Craig M. Herzinger
G01 - MEASURING TESTING
Information
Patent Application
Terahertz-infrared ellipsometer system, and method of use
Publication number
20120206724
Publication date
Aug 16, 2012
Craig M. Herzinger
G01 - MEASURING TESTING
Information
Patent Application
Polarization-Coupled Ferroelectric Unipolar Junction Memory And Ene...
Publication number
20120081943
Publication date
Apr 5, 2012
Mathias M. Schubert
G11 - INFORMATION STORAGE
Information
Patent Application
Terahertz Resonator
Publication number
20100295635
Publication date
Nov 25, 2010
Eva Schubert
B82 - NANO-TECHNOLOGY
Information
Patent Application
Mass Sensor
Publication number
20100245820
Publication date
Sep 30, 2010
Mathias M. Schubert
G01 - MEASURING TESTING
Information
Patent Application
RAPID MATERIAL OPTICAL DIAGNOSTICS METHOD
Publication number
20070229826
Publication date
Oct 4, 2007
Board of Regents of University of Nebraska
MATHIAS M. SCHUBERT
G01 - MEASURING TESTING