Mathijs Petrus Wilhelmus van den Boogaard

Person

Boxtel, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method of preparing a cryogenic sample with improved cooling charac...
- Patent number 11,994,341
- Issue date May 28, 2024
- FEI Company
- Maarten Kuijper
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder for a charged particle microscope
- Patent number 11,251,014
- Issue date Feb 15, 2022
- FEI Company
- Mathijs Petrus Wilhelmus van den Boogaard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi modal cryo compatible GUID grid
- Patent number 11,101,104
- Issue date Aug 24, 2021
- FEI Company
- Maarten Kuijper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of analyzing surface modification of a specimen in a charged...
- Patent number 10,811,223
- Issue date Oct 20, 2020
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of analyzing surface modification of a specimen in a charged...
- Patent number 10,115,561
- Issue date Oct 30, 2018
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit probe for charged particle beam system
- Patent number 9,709,600
- Issue date Jul 18, 2017
- FEI Company
- Paul Johannes L. Barends
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample preparation stage
- Patent number 8,754,384
- Issue date Jun 17, 2014
- FEI Company
- Johannes A. H. W. G. Persoon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PREPARING A CRYOGENIC SAMPLE WITH IMPROVED COOLING CHARAC...
- Publication number 20240271850
- Publication date Aug 15, 2024
- FEI Company
- Maarten KUIJPER
- G01 - MEASURING TESTING
Information Patent Application
CONTAINER LID
- Publication number 20230365307
- Publication date Nov 16, 2023
- FEI Corporation
- Nestor Hernandez Rodriguez
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
BLOTTING MATERIAL WITH PROFILED REGION, METHOD OF MANUFACTURING SAM...
- Publication number 20220410615
- Publication date Dec 29, 2022
- FEI Company
- Ivanka Spee
- B43 - WRITING OR DRAWING IMPLEMENTS BUREAU ACCESSORIES
Information Patent Application
METHOD OF PREPARING A CRYOGENIC SAMPLE WITH IMPROVED COOLING CHARAC...
- Publication number 20220316784
- Publication date Oct 6, 2022
- FEI Company
- Maarten KUIJPER
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Application
MULTI MODAL CRYO COMPATIBLE GUID GRID
- Publication number 20210066032
- Publication date Mar 4, 2021
- FEI Company
- Maarten Kuijper
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SAMPLE HOLDER FOR A CHARGED PARTICLE MICROSCOPE
- Publication number 20200273659
- Publication date Aug 27, 2020
- FEI Company
- Mathijs Petrus Wilhelmus van den Boogaard
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...
- Publication number 20190051492
- Publication date Feb 14, 2019
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...
- Publication number 20160365224
- Publication date Dec 15, 2016
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Circuit Probe for Charged Particle Beam System
- Publication number 20150048815
- Publication date Feb 19, 2015
- FEI Company
- Paul Johannes L. Barends
- G01 - MEASURING TESTING

Mathijs Petrus Wilhelmus van den Boogaard

Person

Patents Grantslast 30 patents

Method of preparing a cryogenic sample with improved cooling charac...

Sample holder for a charged particle microscope

Multi modal cryo compatible GUID grid

Method of analyzing surface modification of a specimen in a charged...

Method of analyzing surface modification of a specimen in a charged...

Circuit probe for charged particle beam system

Sample preparation stage

Patents Applicationslast 30 patents

METHOD OF PREPARING A CRYOGENIC SAMPLE WITH IMPROVED COOLING CHARAC...

CONTAINER LID

BLOTTING MATERIAL WITH PROFILED REGION, METHOD OF MANUFACTURING SAM...

METHOD OF PREPARING A CRYOGENIC SAMPLE WITH IMPROVED COOLING CHARAC...

MULTI MODAL CRYO COMPATIBLE GUID GRID

SAMPLE HOLDER FOR A CHARGED PARTICLE MICROSCOPE

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...

METHOD OF ANALYZING SURFACE MODIFICATION OF A SPECIMEN IN A CHARGED...

Circuit Probe for Charged Particle Beam System