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Matthew C. Graf
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Highland, NY, US
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last 30 patents
Information
Patent Grant
Fault simulation using dynamically alterable behavioral models
Patent number
6,170,078
Issue date
Jan 2, 2001
International Business Machines Corporation
Mark A. Erle
G01 - MEASURING TESTING
Information
Patent Grant
Hierarchical fault modeling system and method
Patent number
5,796,990
Issue date
Aug 18, 1998
International Business Machines Corporation
Mark Alan Erle
G01 - MEASURING TESTING
Information
Patent Grant
Logic simulation machine
Patent number
4,656,580
Issue date
Apr 7, 1987
International Business Machines Corporation
Robert B. Hitchcock
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Gate array chip
Patent number
4,613,958
Issue date
Sep 23, 1986
International Business Machines Corporation
Edward F. Culican
G11 - INFORMATION STORAGE
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Patent Grant
Programmable chip tester having plural pin unit buffers which each...
Patent number
4,517,661
Issue date
May 14, 1985
International Business Machines Corporation
Matthew C. Graf
G01 - MEASURING TESTING
Information
Patent Grant
Method of concurrently testing each of a plurality of interconnecte...
Patent number
4,509,008
Issue date
Apr 2, 1985
International Business Machines Corporation
Sumit DasGupta
G01 - MEASURING TESTING
Information
Patent Grant
Chip partitioning aid (CPA)-A structure for test pattern generation...
Patent number
4,503,386
Issue date
Mar 5, 1985
International Business Machines Corporation
Sumit DasGupta
G01 - MEASURING TESTING