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Matthew C. Gwinn
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Salem, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Detector and method for cluster ion beam diagnostics
Patent number
6,737,643
Issue date
May 18, 2004
Epion Corporation
Richard P. Torti
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas cluster ion beam smoother apparatus
Patent number
6,486,478
Issue date
Nov 26, 2002
Epion Corporation
Bruce K. Libby
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Multi-cusp ion source
Patent number
6,294,862
Issue date
Sep 25, 2001
Eaton Corporation
Adam A. Brailove
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of implanting low doses of ions into a substrate
Patent number
5,962,858
Issue date
Oct 5, 1999
Eaton Corporation
Matthew C. Gwinn
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
Information
Patent Application
Detector and method for cluster ion beam diagnostics
Publication number
20010054686
Publication date
Dec 27, 2001
Richard P. Torti
H01 - BASIC ELECTRIC ELEMENTS