Matthew E. Chraft

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Copperopolis, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of designing an application specific probe card test system
- Patent number 8,581,610
- Issue date Nov 12, 2013
- Charles A Miller
- G01 - MEASURING TESTING
Information Patent Grant
Sharing resources in a system for testing semiconductor devices
- Patent number 7,852,094
- Issue date Dec 14, 2010
- FormFactor, Inc.
- Matthew E. Chraft
- G01 - MEASURING TESTING
Information Patent Grant
Intelligent probe card architecture
- Patent number 7,307,433
- Issue date Dec 11, 2007
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Grant
High performance probe system
- Patent number 6,911,835
- Issue date Jun 28, 2005
- FormFactor, Inc.
- Matthew Chraft
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SHARING RESOURCES IN A SYSTEM FOR TESTING SEMICONDUCTOR DEVICES
- Publication number 20080136432
- Publication date Jun 12, 2008
- FormFactor, Inc.
- Matthew E. Chraft
- G01 - MEASURING TESTING
Information Patent Application
Intelligent probe card architecture
- Publication number 20080100320
- Publication date May 1, 2008
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Method of designing an application specific probe card test system
- Publication number 20060273809
- Publication date Dec 7, 2006
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
Active diagnostic interface for wafer probe applications
- Publication number 20060214679
- Publication date Sep 28, 2006
- FormFactor, Inc.
- Roy J. Henson
- G01 - MEASURING TESTING
Information Patent Application
Intelligent probe card architecture
- Publication number 20050237073
- Publication date Oct 27, 2005
- FormFactor, Inc.
- Charles A. Miller
- G01 - MEASURING TESTING
Information Patent Application
High performance probe system
- Publication number 20040046579
- Publication date Mar 11, 2004
- FormFactor, Inc.
- Matthew Chraft
- G01 - MEASURING TESTING