Matthew S. Grady

Person

Burlington, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Real-time rule engine for adaptive testing of integrated circuits
- Patent number 9,336,109
- Issue date May 10, 2016
- International Business Machines Corporation
- David E. Atkinson
- G01 - MEASURING TESTING
Information Patent Grant
Real-time rule engine for adaptive testing of integrated circuits
- Patent number 9,311,201
- Issue date Apr 12, 2016
- International Business Machines Corporation
- David E. Atkinson
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test optimization using adaptive test pattern sa...
- Patent number 8,689,066
- Issue date Apr 1, 2014
- International Business Machines Corporation
- Matthew S. Grady
- G01 - MEASURING TESTING
Information Patent Grant
Method for monitoring thermal control
- Patent number 8,087,823
- Issue date Jan 3, 2012
- International Business Machines Corporation
- Francois Aube
- G01 - MEASURING TESTING
Information Patent Grant
Method of adding fabrication monitors to integrated circuit chips
- Patent number 7,620,931
- Issue date Nov 17, 2009
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of adding fabrication monitors to integrated circuit chips
- Patent number 7,323,278
- Issue date Jan 29, 2008
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of adding fabrication monitors to integrated circuit chips
- Patent number 7,240,322
- Issue date Jul 3, 2007
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Designing scan chains with specific parameter sensitivities to iden...
- Patent number 7,194,706
- Issue date Mar 20, 2007
- International Business Machines Corporation
- James W. Adkisson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for determining minimum post production test time...
- Patent number 7,139,944
- Issue date Nov 21, 2006
- International Business Machines Corporation
- Tange Nan Barbour
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit and method for monitoring defects
- Patent number 6,998,866
- Issue date Feb 14, 2006
- International Business Machines Corporation
- Greg Bazan
- G01 - MEASURING TESTING
Information Patent Grant
Signal pin tester for AC defects in integrated circuits
- Patent number 6,909,274
- Issue date Jun 21, 2005
- International Business Machines Corporation
- Frank W. Angelotti
- G01 - MEASURING TESTING
Information Patent Grant
Method of statistical binning for reliability selection
- Patent number 6,789,032
- Issue date Sep 7, 2004
- International Business Machines Corporation
- Tange N. Barbour
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method to predetermine a bitmap of a self-tested embedde...
- Patent number 6,754,864
- Issue date Jun 22, 2004
- International Business Machines Corporation
- David V. Gangl
- G11 - INFORMATION STORAGE
Information Patent Grant
Signal pin tester for AC defects in integrated circuits
- Patent number 6,590,382
- Issue date Jul 8, 2003
- International Business Machines Corp.
- Frank W. Angelotti
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining common failure modes for integrat...
- Patent number 6,557,132
- Issue date Apr 29, 2003
- International Business Machines Corporation
- David V. Gangl
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
REAL-TIME RULE ENGINE FOR ADAPTIVE TESTING OF INTEGRATED CIRCUITS
- Publication number 20140059382
- Publication date Feb 27, 2014
- International Business Machines Corporation
- David E. Atkinson
- G01 - MEASURING TESTING
Information Patent Application
REAL-TIME RULE ENGINE FOR ADAPTIVE TESTING OF INTEGRATED CIRCUITS
- Publication number 20140059386
- Publication date Feb 27, 2014
- International Business Machines Corporation
- David E. Atkinson
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TEST OPTIMIZATION USING ADAPTIVE TEST PATTERN SA...
- Publication number 20130007546
- Publication date Jan 3, 2013
- International Business Machines Corporation
- Matthew S. Grady
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MONITORING THERMAL CONTROL
- Publication number 20100042355
- Publication date Feb 18, 2010
- Francois Aube
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS
- Publication number 20080017857
- Publication date Jan 24, 2008
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS
- Publication number 20070160920
- Publication date Jul 12, 2007
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS
- Publication number 20060225023
- Publication date Oct 5, 2006
- International Business Machines Corporation
- James W. Adkisson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Designing Scan Chains With Specific Parameter Sensitivities to Iden...
- Publication number 20060026472
- Publication date Feb 2, 2006
- International Business Machines Corporation
- James W. Adkisson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CIRCUIT AND METHOD FOR MONITORING DEFECTS
- Publication number 20060022693
- Publication date Feb 2, 2006
- International Business Machines Corporation
- Greg Bazan
- G01 - MEASURING TESTING
Information Patent Application
Signal pin tester for AC defects in integrated circuits
- Publication number 20050172187
- Publication date Aug 4, 2005
- Frank W. Angelotti
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING MINIMUM POST PRODUCTION TEST TIME...
- Publication number 20050049810
- Publication date Mar 3, 2005
- International Business Machines Corporation
- Tange Nan Barbour
- G11 - INFORMATION STORAGE
Information Patent Application
Signal pin tester for AC defects in integrated circuits
- Publication number 20040153919
- Publication date Aug 5, 2004
- Frank W. Angelotti
- G01 - MEASURING TESTING
Information Patent Application
Method for burn-in testing
- Publication number 20030151422
- Publication date Aug 14, 2003
- Thomas S. Barnett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of statistical binning for reliability selection
- Publication number 20030120445
- Publication date Jun 26, 2003
- International Business Machines Corporation
- Tange N. Barbour
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method to predetermine a bitmap of a self-tested embedde...
- Publication number 20020116676
- Publication date Aug 22, 2002
- International Business Machines Corporation
- David V. Gangl
- G11 - INFORMATION STORAGE
Information Patent Application
Method and system for determining common failure modes for integrat...
- Publication number 20020116675
- Publication date Aug 22, 2002
- International Business Machines Corporation
- David V. Gangl
- G01 - MEASURING TESTING
Information Patent Application
Signal pin tester for AC defects in integrated circuits
- Publication number 20020079880
- Publication date Jun 27, 2002
- International Business Machines Corporation
- Frank W. Angelotti
- G01 - MEASURING TESTING

Matthew S. Grady

Person

Patents Grantslast 30 patents

Real-time rule engine for adaptive testing of integrated circuits

Real-time rule engine for adaptive testing of integrated circuits

Integrated circuit test optimization using adaptive test pattern sa...

Method for monitoring thermal control

Method of adding fabrication monitors to integrated circuit chips

Method of adding fabrication monitors to integrated circuit chips

Method of adding fabrication monitors to integrated circuit chips

Designing scan chains with specific parameter sensitivities to iden...

Method and system for determining minimum post production test time...

Circuit and method for monitoring defects

Signal pin tester for AC defects in integrated circuits

Method of statistical binning for reliability selection

System and method to predetermine a bitmap of a self-tested embedde...

Signal pin tester for AC defects in integrated circuits

Method and system for determining common failure modes for integrat...

Patents Applicationslast 30 patents

REAL-TIME RULE ENGINE FOR ADAPTIVE TESTING OF INTEGRATED CIRCUITS

REAL-TIME RULE ENGINE FOR ADAPTIVE TESTING OF INTEGRATED CIRCUITS

INTEGRATED CIRCUIT TEST OPTIMIZATION USING ADAPTIVE TEST PATTERN SA...

METHOD FOR MONITORING THERMAL CONTROL

METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS

METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS

METHOD OF ADDING FABRICATION MONITORS TO INTEGRATED CIRCUIT CHIPS

Designing Scan Chains With Specific Parameter Sensitivities to Iden...

CIRCUIT AND METHOD FOR MONITORING DEFECTS

Signal pin tester for AC defects in integrated circuits

METHOD AND SYSTEM FOR DETERMINING MINIMUM POST PRODUCTION TEST TIME...

Signal pin tester for AC defects in integrated circuits

Method for burn-in testing

Method of statistical binning for reliability selection

System and method to predetermine a bitmap of a self-tested embedde...

Method and system for determining common failure modes for integrat...

Signal pin tester for AC defects in integrated circuits