Matthias Brunner

Person

Kirchheim-Heimstetten, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Roll to roll tester and method of testing flexible substrates roll...
- Patent number 9,366,696
- Issue date Jun 14, 2016
- Applied Materials, Inc.
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Grant
Light-assisted testing of an optoelectronic module
- Patent number 8,222,911
- Issue date Jul 17, 2012
- Applied Materials GmbH
- Bernhard Gunter Mueller
- G02 - OPTICS
Information Patent Grant
Method and device for fastening an airbag in a motor vehicle
- Patent number 8,220,825
- Issue date Jul 17, 2012
- GM Global Technology Operations LLC
- Frank Bonarens
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Drive apparatus with improved testing properties
- Patent number 8,208,114
- Issue date Jun 26, 2012
- AKT Electron Beam Technology GmbH
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Localization of driver failures within liquid crystal displays
- Patent number 8,115,506
- Issue date Feb 14, 2012
- Applied Materials, Inc.
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method for beam calibration and usage of a calibration body
- Patent number 8,009,299
- Issue date Aug 30, 2011
- Applied Materials GmbH
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Grant
In-line electron beam test system
- Patent number 7,973,546
- Issue date Jul 5, 2011
- Applied Materials, Inc.
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Configurable prober for TFT LCD array test
- Patent number 7,847,566
- Issue date Dec 7, 2010
- Applied Materials, Inc.
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Grant
Prober for electronic device testing on large area substrates
- Patent number 7,786,742
- Issue date Aug 31, 2010
- Applied Materials, Inc.
- Sriram Krishnaswami
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
In-line electron beam test system
- Patent number 7,746,088
- Issue date Jun 29, 2010
- Applied Materials, Inc.
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mini-prober for TFT-LCD testing
- Patent number 7,602,199
- Issue date Oct 13, 2009
- Applied Materials, Inc.
- Benjamin M. Johnston
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
In-line electron beam test system
- Patent number 7,535,238
- Issue date May 19, 2009
- Applied Materials, Inc.
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for contacting of test objects
- Patent number 7,474,108
- Issue date Jan 6, 2009
- Applied Materials, GmbH
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method and apparatus for testing function of active microstructural...
- Patent number 7,375,505
- Issue date May 20, 2008
- Applied Materials, Inc.
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for determining a position of a substrate rel...
- Patent number 7,372,250
- Issue date May 13, 2008
- Applied Materials, Inc.
- Shinichi Kurita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Configurable prober for TFT LCD array test
- Patent number 7,355,418
- Issue date Apr 8, 2008
- Applied Materials, Inc.
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Clutch lever arrangement
- Patent number 7,353,929
- Issue date Apr 8, 2008
- ZF Friedrichshafen AG
- Matthias Brunner
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Configurable prober for TFT LCD array testing
- Patent number 7,319,335
- Issue date Jan 15, 2008
- Applied Materials, Inc.
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Line short localization in LCD pixel arrays
- Patent number 7,317,325
- Issue date Jan 8, 2008
- Applied Materials, Inc.
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method for testing pixels for LCD TFT displays
- Patent number 7,256,606
- Issue date Aug 14, 2007
- Applied Materials, Inc.
- Axel Wenzel
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for contacting of test objects
- Patent number 7,135,875
- Issue date Nov 14, 2006
- Applied Materials GmbH
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Large substrate test system
- Patent number 7,129,694
- Issue date Oct 31, 2006
- Applied Materials, Inc.
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Grant
Deflection system for a particle beam device
- Patent number 7,105,833
- Issue date Sep 12, 2006
- AKT Electron Beam Technology GmbH
- Matthias Brunner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Large substrate test system
- Patent number 7,075,323
- Issue date Jul 11, 2006
- Applied Materials, Inc.
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Grant
Release mechanism with a device for compensating for inaccuracies i...
- Patent number 6,845,856
- Issue date Jan 25, 2005
- ZF Sachs AG
- Herbert Voit
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Method and apparatus for testing a substrate
- Patent number 6,730,906
- Issue date May 4, 2004
- Applied Materials, Inc.
- Matthias Brunner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge neutralization of electron beam systems
- Patent number 6,465,795
- Issue date Oct 15, 2002
- Applied Materials, Inc.
- Juan R. Madonado
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing the function of microstructure ele...
- Patent number 5,834,773
- Issue date Nov 10, 1998
- Ebetech Electron-Beam Technology Vertriebs GmbH
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method for particle beam testing of substrates for liquid crystal d...
- Patent number 5,414,374
- Issue date May 9, 1995
- Siemens Aktiengesellschaft
- Matthias Brunner
- G02 - OPTICS
Information Patent Grant
Method for the recognition of testing errors in the test of microwi...
- Patent number 5,373,233
- Issue date Dec 13, 1994
- Siemens Aktiengesellschaft
- Matthias Brunner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Methods for the Biomethanation of H2 and CO2
- Publication number 20160369303
- Publication date Dec 22, 2016
- Matthias Brunner
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
ROLL TO ROLL TESTER AND METHOD OF TESTING FLEXIBLE SUBSTRATES ROLL...
- Publication number 20140253160
- Publication date Sep 11, 2014
- Applied Materials, Inc.
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Application
ELECTROSTATIC DISCHARGE PREVENTION FOR LARGE AREA SUBSTRATE PROCESS...
- Publication number 20120113559
- Publication date May 10, 2012
- Applied Materials, Inc.
- Hung T. Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IN-LINE ELECTRON BEAM TEST SYSTEM
- Publication number 20100327162
- Publication date Dec 30, 2010
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND DEVICE FOR FASTENING AN AIRBAG IN A MOTOR VEHICLE
- Publication number 20100230936
- Publication date Sep 16, 2010
- GM Global Technology Operations, Inc.
- Frank Bonarens
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD FOR BEAM CALIBRATION AND USAGE OF A CALIBRATION BODY
- Publication number 20100188666
- Publication date Jul 29, 2010
- APPLIED MATERIALS GMBH
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
IN-LINE ELECTRON BEAM TEST SYSTEM
- Publication number 20090195262
- Publication date Aug 6, 2009
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT-ASSISTED TESTING OF AN OPTOELECTRONIC MODULE
- Publication number 20090179656
- Publication date Jul 16, 2009
- APPLIED MATERIALS GMBH
- Bernhard Gunter Mueller
- G02 - OPTICS
Information Patent Application
DRIVE APPARATUS WITH IMPROVED TESTING PROPERTIES
- Publication number 20090122056
- Publication date May 14, 2009
- AKT Electron Beam Technology GmbH
- Matthias BRUNNER
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
LOCALIZATION OF DRIVER FAILURES WITHIN LIQUID CRYSTAL DISPLAYS
- Publication number 20080284760
- Publication date Nov 20, 2008
- MATTHIAS BRUNNER
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
SYSTEM AND METHOD FOR TRANSFERRING A SUBSTRATE INTO AND OUT OF A RE...
- Publication number 20080251019
- Publication date Oct 16, 2008
- SRIRAM KRISHNASWAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Configurable Prober for TFT LCD Array Test
- Publication number 20080061807
- Publication date Mar 13, 2008
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
PROBER FOR ELECTRONIC DEVICE TESTING ON LARGE AREA SUBSTRATES
- Publication number 20070296426
- Publication date Dec 27, 2007
- APPLIED MATERIALS, INC.
- SRIRAM KRISHNASWAMI
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
MINI-PROBER FOR TFT-LCD TESTING
- Publication number 20070296437
- Publication date Dec 27, 2007
- Benjamin M. Johnston
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
In-line electron beam test system
- Publication number 20060244467
- Publication date Nov 2, 2006
- APPLIED MATERIALS, INC.
- Fayez E. Abboud
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for contacting of test objects
- Publication number 20060181290
- Publication date Aug 17, 2006
- APPLIED MATERIALS, INC. (GmbH)
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Line short localization in LCD pixel arrays
- Publication number 20060125510
- Publication date Jun 15, 2006
- APPLIED MATERIALS, INC.
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Clutch lever arrangement
- Publication number 20060076211
- Publication date Apr 13, 2006
- ZF Friedrichshafen AG
- Matthias Brunner
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Method for testing pixels for LCD TFT displays
- Publication number 20060028230
- Publication date Feb 9, 2006
- APPLIED MATERIALS, INC.
- Axel Wenzel
- G02 - OPTICS
Information Patent Application
Large substrate test system
- Publication number 20060022694
- Publication date Feb 2, 2006
- APPLIED MATERIALS, INC.
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing function of active microstructural...
- Publication number 20050212545
- Publication date Sep 29, 2005
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Application
Control device having improved testing properties
- Publication number 20050212782
- Publication date Sep 29, 2005
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Configurable prober for TFT LCD array testing
- Publication number 20050179451
- Publication date Aug 18, 2005
- APPLIED MATERIALS, INC.
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Configurable prober for TFT LCD array test
- Publication number 20050179452
- Publication date Aug 18, 2005
- APPLIED MATERIALS, INC.
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Methods and apparatus for determining a position of a substrate rel...
- Publication number 20040218193
- Publication date Nov 4, 2004
- APPLIED MATERIALS, INC.
- Shinichi Kurita
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Deflection system for a particle beam device
- Publication number 20040188630
- Publication date Sep 30, 2004
- Matthias Brunner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for contacting of test objects
- Publication number 20040145383
- Publication date Jul 29, 2004
- Matthias Brunner
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Release mechanism with a device for compensating for inaccuracies i...
- Publication number 20030230462
- Publication date Dec 18, 2003
- ZF Sachs AG
- Herbert Voit
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Large substrate test system
- Publication number 20030218456
- Publication date Nov 27, 2003
- APPLIED MATERIALS, INC.
- Matthias Brunner
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for testing a substrate
- Publication number 20020024023
- Publication date Feb 28, 2002
- Matthias Brunner
- H01 - BASIC ELECTRIC ELEMENTS

Matthias Brunner

Person

Patents Grantslast 30 patents

Roll to roll tester and method of testing flexible substrates roll...

Light-assisted testing of an optoelectronic module

Method and device for fastening an airbag in a motor vehicle

Drive apparatus with improved testing properties

Localization of driver failures within liquid crystal displays

Method for beam calibration and usage of a calibration body

In-line electron beam test system

Configurable prober for TFT LCD array test

Prober for electronic device testing on large area substrates

In-line electron beam test system

Mini-prober for TFT-LCD testing

In-line electron beam test system

Apparatus and method for contacting of test objects

Method and apparatus for testing function of active microstructural...

Methods and apparatus for determining a position of a substrate rel...

Configurable prober for TFT LCD array test

Clutch lever arrangement

Configurable prober for TFT LCD array testing

Line short localization in LCD pixel arrays

Method for testing pixels for LCD TFT displays

Apparatus and method for contacting of test objects

Large substrate test system

Deflection system for a particle beam device

Large substrate test system

Release mechanism with a device for compensating for inaccuracies i...

Method and apparatus for testing a substrate

Charge neutralization of electron beam systems

Method and apparatus for testing the function of microstructure ele...

Method for particle beam testing of substrates for liquid crystal d...

Method for the recognition of testing errors in the test of microwi...

Patents Applicationslast 30 patents

Methods for the Biomethanation of H2 and CO2

ROLL TO ROLL TESTER AND METHOD OF TESTING FLEXIBLE SUBSTRATES ROLL...

ELECTROSTATIC DISCHARGE PREVENTION FOR LARGE AREA SUBSTRATE PROCESS...

IN-LINE ELECTRON BEAM TEST SYSTEM

METHOD AND DEVICE FOR FASTENING AN AIRBAG IN A MOTOR VEHICLE

METHOD FOR BEAM CALIBRATION AND USAGE OF A CALIBRATION BODY

IN-LINE ELECTRON BEAM TEST SYSTEM

LIGHT-ASSISTED TESTING OF AN OPTOELECTRONIC MODULE

DRIVE APPARATUS WITH IMPROVED TESTING PROPERTIES

LOCALIZATION OF DRIVER FAILURES WITHIN LIQUID CRYSTAL DISPLAYS

SYSTEM AND METHOD FOR TRANSFERRING A SUBSTRATE INTO AND OUT OF A RE...

Configurable Prober for TFT LCD Array Test

PROBER FOR ELECTRONIC DEVICE TESTING ON LARGE AREA SUBSTRATES

MINI-PROBER FOR TFT-LCD TESTING

In-line electron beam test system

Apparatus and method for contacting of test objects

Line short localization in LCD pixel arrays

Clutch lever arrangement

Method for testing pixels for LCD TFT displays

Large substrate test system

Method and apparatus for testing function of active microstructural...

Control device having improved testing properties

Configurable prober for TFT LCD array testing

Configurable prober for TFT LCD array test

Methods and apparatus for determining a position of a substrate rel...

Deflection system for a particle beam device

Apparatus and method for contacting of test objects

Release mechanism with a device for compensating for inaccuracies i...

Large substrate test system

Method and apparatus for testing a substrate