Mayuka Oosaki

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Tool-to-tool matching control method and its system for scanning el...
- Patent number 8,502,144
- Issue date Aug 6, 2013
- Hitachi High-Technologies Corporation
- Mayuka Oosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and methods for capturing images us...
- Patent number 8,207,512
- Issue date Jun 26, 2012
- Hitachi High-Technologies Corporation
- Chie Shishido
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample and method for evaluating resolution of scanning electron mi...
- Patent number 8,022,356
- Issue date Sep 20, 2011
- Hitachi High-Technologies Corporation
- Mayuka Oosaki
- G01 - MEASURING TESTING
Information Patent Grant
Tool-to-tool matching control method and its system for scanning el...
- Patent number 8,003,940
- Issue date Aug 23, 2011
- Hitachi High-Technologies Corporation
- Mayuka Oosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and methods for capturing images us...
- Patent number 7,807,980
- Issue date Oct 5, 2010
- Hitachi High-Technologies Corporation
- Chie Shishido
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample and method for evaluating resolution of scanning electron mi...
- Patent number 7,605,364
- Issue date Oct 20, 2009
- Hitachi High-Technologies Corporation
- Mayuka Oosaki
- G01 - MEASURING TESTING
Information Patent Grant
Tool-to-tool matching control method and its system for scanning el...
- Patent number 7,476,857
- Issue date Jan 13, 2009
- Hitachi High-Technologies Corporation
- Mayuka Oosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring method and its apparatus
- Patent number 7,408,155
- Issue date Aug 5, 2008
- Hitachi High-Technologies Corporation
- Mayuka Oosaki
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope, method for measuring a dimension of a...
- Patent number 7,408,154
- Issue date Aug 5, 2008
- Hitachi High-Technologies Corporation
- Mayuka Oosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope, measuring method using the same, electron micr...
- Patent number 7,399,964
- Issue date Jul 15, 2008
- Hitachi High-Technologies Corporation
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope and a method for evaluating accuracy o...
- Patent number 7,164,127
- Issue date Jan 16, 2007
- Hitachi High-Technologies Corporation
- Ryo Nakagaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Tool-To-Tool Matching Control Method And Its System For Scanning El...
- Publication number 20110278453
- Publication date Nov 17, 2011
- Mayuka Oosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICEL BEAM APPARATUS AND METHODS FOR CAPTURING IMAGES US...
- Publication number 20110133080
- Publication date Jun 9, 2011
- Chie Shishido
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample and method for evaluating resolution of scanning electron mi...
- Publication number 20100133426
- Publication date Jun 3, 2010
- Mayuka Oosaki
- G01 - MEASURING TESTING
Information Patent Application
Tool-To-Tool Matching Control Method And its System For Scanning El...
- Publication number 20090121134
- Publication date May 14, 2009
- Mayuka Oosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE AND METHOD FOR EVALUATING RESOLUTION OF SCANNING ELECTRON MI...
- Publication number 20080067337
- Publication date Mar 20, 2008
- Mayuka Oosaki
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus and methods for capturing images us...
- Publication number 20070164219
- Publication date Jul 19, 2007
- Chie Shishido
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Tool-to-tool matching control method and its system for scanning el...
- Publication number 20070114405
- Publication date May 24, 2007
- Mayuka Oosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning electron microscope, method for measuring a dimension of a...
- Publication number 20060091309
- Publication date May 4, 2006
- Mayuka Oosaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mesuring method and its apparatus
- Publication number 20060060774
- Publication date Mar 23, 2006
- Mayuka Oosaki
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope, measuring method using the same, electron micr...
- Publication number 20050247860
- Publication date Nov 10, 2005
- Chie Shishido
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope and a method for evaluating accuracy o...
- Publication number 20050205780
- Publication date Sep 22, 2005
- Ryo Nakagaki
- G01 - MEASURING TESTING

Mayuka Oosaki

Person

Patents Grantslast 30 patents

Tool-to-tool matching control method and its system for scanning el...

Charged particle beam apparatus and methods for capturing images us...

Sample and method for evaluating resolution of scanning electron mi...

Tool-to-tool matching control method and its system for scanning el...

Charged particle beam apparatus and methods for capturing images us...

Sample and method for evaluating resolution of scanning electron mi...

Tool-to-tool matching control method and its system for scanning el...

Measuring method and its apparatus

Scanning electron microscope, method for measuring a dimension of a...

Electron microscope, measuring method using the same, electron micr...

Scanning electron microscope and a method for evaluating accuracy o...

Patents Applicationslast 30 patents

Tool-To-Tool Matching Control Method And Its System For Scanning El...

CHARGED PARTICEL BEAM APPARATUS AND METHODS FOR CAPTURING IMAGES US...

Sample and method for evaluating resolution of scanning electron mi...

Tool-To-Tool Matching Control Method And its System For Scanning El...

SAMPLE AND METHOD FOR EVALUATING RESOLUTION OF SCANNING ELECTRON MI...

Charged particle beam apparatus and methods for capturing images us...

Tool-to-tool matching control method and its system for scanning el...

Scanning electron microscope, method for measuring a dimension of a...

Mesuring method and its apparatus

Electron microscope, measuring method using the same, electron micr...

Scanning electron microscope and a method for evaluating accuracy o...