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HITACHI-SHI, JP
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Patents Grants
last 30 patents
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Patent Grant
Charged particle beam device, position specification method used fo...
Patent number
8,912,487
Issue date
Dec 16, 2014
Hitachi High-Technologies Corporation
Kunio Sakamoto
G01 - MEASURING TESTING
Information
Patent Grant
Specimen preparation device, and control method in specimen prepara...
Patent number
8,710,464
Issue date
Apr 29, 2014
Hitachi High-Technologies Corporation
Yuichi Madokoro
G01 - MEASURING TESTING
Information
Patent Grant
Charged particle beam device and method for correcting position wit...
Patent number
8,629,394
Issue date
Jan 14, 2014
Hitachi High-Technologies Corporation
Yuichi Madokoro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focused ion beam machining method and focused ion beam machining ap...
Patent number
6,521,890
Issue date
Feb 18, 2003
Hitachi, Ltd.
Tohru Ishitani
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Charged Particle Beam Device, Position Specification Method Used fo...
Publication number
20120211652
Publication date
Aug 23, 2012
Kunio Sakamoto
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN PREPARATION DEVICE, AND CONTROL METHOD IN SPECIMEN PREPARA...
Publication number
20110309245
Publication date
Dec 22, 2011
Yuichi Madokoro
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM DEVICE AND METHOD FOR CORRECTING POSITION WIT...
Publication number
20110297826
Publication date
Dec 8, 2011
Yuichi Madokoro
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Apparatus
Publication number
20080203299
Publication date
Aug 28, 2008
Hitachi High-Technologies Corporation
Toshiaki Kozuma
G01 - MEASURING TESTING
Information
Patent Application
FOCUSED ION BEAM MACHINING METHOD AND FOCUSED ION BEAM MACHINING AP...
Publication number
20020092985
Publication date
Jul 18, 2002
TOHRU ISHITANI
G01 - MEASURING TESTING