Meir Ben-Levy

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Haifa, IL

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Patents Grantslast 30 patents

Information Patent Grant
Device and method for inspecting an object
- Patent number 8,514,385
- Issue date Aug 20, 2013
- Camtek Ltd.
- Meir Ben-Levy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Imaging measurement system
- Patent number 5,867,604
- Issue date Feb 2, 1999
- Meir Ben-Levy
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
DUAL STRUCTURED ILLUMINATION MODULATED IN PHASE AND INTENSITY
- Publication number 20150377777
- Publication date Dec 31, 2015
- OPTICS 3D Ltd.
- Meir BEN-LEVY
- G01 - MEASURING TESTING
Information Patent Application
LIGHT GUIDE FOCUSSING DEVICE AND METHOD
- Publication number 20120106190
- Publication date May 3, 2012
- MGIC LIGHTING OPTICS LTD.
- Meir Ben-Levy
- G02 - OPTICS
Information Patent Application
DEVICE AND METHOD FOR INSPECTING AN OBJECT
- Publication number 20110310392
- Publication date Dec 22, 2011
- Camtek Ltd.
- Meir Ben-Levy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING MEASUREMENT SYSTEM WITH PERIODIC PATTERN ILLUMINATION AND TDI
- Publication number 20100260409
- Publication date Oct 14, 2010
- MACHVISION, Inc.
- Meir Ben-Levy
- G06 - COMPUTING CALCULATING COUNTING