Michael Andres

Person

Inver Grove Heights, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test pin
- Patent number D1042345
- Issue date Sep 17, 2024
- Johnstech International Corporation
- Mike Andres
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Contact pin for integrated circuit testing
- Patent number D1042346
- Issue date Sep 17, 2024
- Johnstech International Corporation
- Melissa Hasskamp
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Over the air (OTA) chip testing system
- Patent number 11,879,925
- Issue date Jan 23, 2024
- Johnstech International Corporation
- Mike Andres
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self flattening test socket with anti-bowing and elastomer retention
- Patent number 11,709,183
- Issue date Jul 25, 2023
- Johnstech International Corporation
- David T. Skodje
- G01 - MEASURING TESTING
Information Patent Grant
Housing with anti-dislodge capability
- Patent number 11,674,998
- Issue date Jun 13, 2023
- Johnstech International Corporation
- Bob Chartrand
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit contactor for testing ICs and method of construc...
- Patent number 11,209,458
- Issue date Dec 28, 2021
- Johnstech International Corporation
- John Nelson
- G01 - MEASURING TESTING
Information Patent Grant
High isolation contactor with test pin and housing for integrated c...
- Patent number 11,183,783
- Issue date Nov 23, 2021
- Johnstech International Corporation
- Jeffrey Sherry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selectively geometric shaped contact pin for electronic component t...
- Patent number 11,029,335
- Issue date Jun 8, 2021
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit testing with conical...
- Patent number 10,928,423
- Issue date Feb 23, 2021
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Self flattening test socket with anti-bowing and elastomer retention
- Patent number 10,761,112
- Issue date Sep 1, 2020
- Johnstech International Corporation
- David T. Skodje
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit contactor for testing ICs and method of construc...
- Patent number 10,725,069
- Issue date Jul 28, 2020
- Johnstech International Corporation
- John Nelson
- G01 - MEASURING TESTING
Information Patent Grant
High isolation contactor with test pin and housing for integrated c...
- Patent number 10,686,269
- Issue date Jun 16, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Grant
Low resistance low wear test pin for test contactor
- Patent number 10,551,412
- Issue date Feb 4, 2020
- Johnstech International Corporation
- Michael Andres
- G01 - MEASURING TESTING
Information Patent Grant
On-center electrically conductive pins for integrated testing
- Patent number 10,401,386
- Issue date Sep 3, 2019
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Selectively geometric shaped contact pin for electronic component t...
- Patent number 10,114,039
- Issue date Oct 30, 2018
- Johnstech International Corporation
- David Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing apparatus and method for microcircuit testing with conical...
- Patent number 10,067,164
- Issue date Sep 4, 2018
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
Low resistance low wear test pin for test contactor
- Patent number 9,804,194
- Issue date Oct 31, 2017
- Johnstech International Corporation
- Michael Andres
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and method for microcircuit and wafer level IC te...
- Patent number 9,696,347
- Issue date Jul 4, 2017
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Grant
On-center electrically conductive pins for integrated testing
- Patent number 9,638,714
- Issue date May 2, 2017
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
On-center electrically conductive pins for integrated testing
- Patent number 9,429,591
- Issue date Aug 30, 2016
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
On-center electrically conductive pins for integrated testing
- Patent number 9,341,649
- Issue date May 17, 2016
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Low resistance low wear test pin for test contactor
- Patent number 9,274,141
- Issue date Mar 1, 2016
- Johnstech International Corporation
- Michael Andres
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Articulating contact pin
- Patent number D719923
- Issue date Dec 23, 2014
- Johnstech International Corporation
- David Johnson
- D13 - Equipment for production, distribution, or transformation of energy

Patents Applicationslast 30 patents

Information Patent Application
HOUSING WITH VERTICAL BACKSTOP
- Publication number 20230184826
- Publication date Jun 15, 2023
- Johnstech International Corporation
- Melissa Hasskamp
- G01 - MEASURING TESTING
Information Patent Application
HOUSING WITH ANTI-DISLODGE CAPABILITY
- Publication number 20220107357
- Publication date Apr 7, 2022
- Johnstech International Corporation
- Bob Chartrand
- G01 - MEASURING TESTING
Information Patent Application
Self Flattening Test Socket With Anti-Bowing And Elastomer Retention
- Publication number 20200400718
- Publication date Dec 24, 2020
- Johnstech International Corporation
- David T. Skodje
- G01 - MEASURING TESTING
Information Patent Application
Integrated Circuit Contactor For Testing ICs And Method Of Construc...
- Publication number 20200363451
- Publication date Nov 19, 2020
- Johnstech International Corporation
- John Nelson
- G01 - MEASURING TESTING
Information Patent Application
High Isolation Contactor with Test Pin and Housing For Integrated C...
- Publication number 20200313322
- Publication date Oct 1, 2020
- Johnstech International Corporation
- Jeffrey Sherry
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High Isolation Contactor with Test Pin and Housing For Integrated C...
- Publication number 20190097333
- Publication date Mar 28, 2019
- Johnstech International Corporation
- Jeffrey Sherry
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...
- Publication number 20190004093
- Publication date Jan 3, 2019
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Low Resistance Low Wear Test Pin For Test Contactor
- Publication number 20180067145
- Publication date Mar 8, 2018
- Johnstech International Corporation
- Michael Andres
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...
- Publication number 20170059616
- Publication date Mar 2, 2017
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING
Information Patent Application
Low Resistance Low Wear Test Pin For Test Contactor
- Publication number 20170023613
- Publication date Jan 26, 2017
- Johnstech International Corporation
- Michael Andres
- G01 - MEASURING TESTING
Information Patent Application
On-Center Electrically Conductive Pins For Integrated Testing
- Publication number 20160370406
- Publication date Dec 22, 2016
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Application
On-Center Electrically Conductive Pins For Integrated Testing
- Publication number 20150015293
- Publication date Jan 15, 2015
- Johnstech International Corporation
- David Johnson
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TE...
- Publication number 20150015287
- Publication date Jan 15, 2015
- Johnstech International Corporation
- John DeBauche
- G01 - MEASURING TESTING

Michael Andres

Person

Patents Grantslast 30 patents

Test pin

Contact pin for integrated circuit testing

Over the air (OTA) chip testing system

Self flattening test socket with anti-bowing and elastomer retention

Housing with anti-dislodge capability

Integrated circuit contactor for testing ICs and method of construc...

High isolation contactor with test pin and housing for integrated c...

Selectively geometric shaped contact pin for electronic component t...

Testing apparatus and method for microcircuit testing with conical...

Self flattening test socket with anti-bowing and elastomer retention

Integrated circuit contactor for testing ICs and method of construc...

High isolation contactor with test pin and housing for integrated c...

Low resistance low wear test pin for test contactor

On-center electrically conductive pins for integrated testing

Selectively geometric shaped contact pin for electronic component t...

Testing apparatus and method for microcircuit testing with conical...

Low resistance low wear test pin for test contactor

Testing apparatus and method for microcircuit and wafer level IC te...

On-center electrically conductive pins for integrated testing

On-center electrically conductive pins for integrated testing

On-center electrically conductive pins for integrated testing

Low resistance low wear test pin for test contactor

Articulating contact pin

Patents Applicationslast 30 patents

HOUSING WITH VERTICAL BACKSTOP

HOUSING WITH ANTI-DISLODGE CAPABILITY

Self Flattening Test Socket With Anti-Bowing And Elastomer Retention

Integrated Circuit Contactor For Testing ICs And Method Of Construc...

High Isolation Contactor with Test Pin and Housing For Integrated C...

High Isolation Contactor with Test Pin and Housing For Integrated C...

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...

Low Resistance Low Wear Test Pin For Test Contactor

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT TESTING WITH CONICAL...

Low Resistance Low Wear Test Pin For Test Contactor

On-Center Electrically Conductive Pins For Integrated Testing

On-Center Electrically Conductive Pins For Integrated Testing

TESTING APPARATUS AND METHOD FOR MICROCIRCUIT AND WAFER LEVEL IC TE...