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Michael B. Krell
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Tucson, AZ, US
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last 30 patents
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Patent Grant
Alignment and correction template for optical profilometric measure...
Patent number
6,847,460
Issue date
Jan 25, 2005
Veeco Instruments, Inc.
Colin T. Farrell
G11 - INFORMATION STORAGE
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last 30 patents
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Patent Application
Method and Apparatus of Analyzing Sample Surface Data
Publication number
20120265487
Publication date
Oct 18, 2012
Bruker Nano, Inc.
Emilio Yanine
G01 - MEASURING TESTING
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Patent Application
Alignment and correction template for optical profilometric measure...
Publication number
20030035115
Publication date
Feb 20, 2003
Colin T. Farrell
G11 - INFORMATION STORAGE