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Michael D. Lowell
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Endicott, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method of making a parallel capacitor laminate
Patent number
6,524,352
Issue date
Feb 25, 2003
International Business Machines Corporation
Sylvia Adae-Amoakoh
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Capacitor laminate for use in printed circuit board and as an inter...
Patent number
6,370,012
Issue date
Apr 9, 2002
International Business Machines Corporation
Sylvia Adae-Amoakoh
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for testing integrated circuit chips
Patent number
5,672,980
Issue date
Sep 30, 1997
International Business Machines Corporation
Richard Gordon Charlton
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing integrated circuit chips
Patent number
5,659,256
Issue date
Aug 19, 1997
International Business Machines Corporation
Richard Gordon Charlton
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing integrated circuit chips
Patent number
5,528,159
Issue date
Jun 18, 1996
International Business Machine Corp.
Richard G. Charlton
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing integrated circuit chips
Patent number
5,523,696
Issue date
Jun 4, 1996
International Business Machines Corp.
Richard G. Charlton
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing of integrated circuit chips
Patent number
5,420,520
Issue date
May 30, 1995
International Business Machines Corporation
Morris Anschel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Method of making a parallel capacitor laminate
Publication number
20020054471
Publication date
May 9, 2002
International Business Machines Corporation
Sylvia Adae-Amoakoh
H01 - BASIC ELECTRIC ELEMENTS