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Michael J. Bennett
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Wellington, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for mapping a custom routine to an interface b...
Patent number
6,234,689
Issue date
May 22, 2001
Hewlett-Packard Co.
John G. Rohrbaugh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Forced conformance design-rule halos for computer aided design soft...
Patent number
6,077,307
Issue date
Jun 20, 2000
Hewlett-Packard Company
Jack D. Benzel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multilevel and beveled-corner design-rule halos for computer aided...
Patent number
6,045,584
Issue date
Apr 4, 2000
Hewlett-Packard Company
Jack D. Benzel
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Adjustable and snap back design-rule halos for computer aided desig...
Patent number
5,974,243
Issue date
Oct 26, 1999
Hewlett-Packard Company
David C. Moh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for scan control of a programmable fuse circuit i...
Patent number
5,668,818
Issue date
Sep 16, 1997
Hewlett-Packard Co.
Michael J. Bennett
G11 - INFORMATION STORAGE
Information
Patent Grant
System and method for disabling static current paths in fuse logic
Patent number
5,663,902
Issue date
Sep 2, 1997
Hewlett-Packard Company
Michael J. Bennett
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus and method for changing the behavior of a computer progra...
Patent number
5,495,578
Issue date
Feb 27, 1996
Hewlett-Packard Company
John G. Rohrbaugh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for specifying the flow of test execution and...
Patent number
5,400,263
Issue date
Mar 21, 1995
Hewlett-Packard Company
John G. Rohrbaugh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for displaying wafer test results in real time
Patent number
5,390,131
Issue date
Feb 14, 1995
Hewlett-Packard Company
John G. Rohrbaugh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for obtaining a list of numbers of wafers for...
Patent number
5,381,344
Issue date
Jan 10, 1995
Hewlett-Packard Company
John G. Rohrbaugh
G01 - MEASURING TESTING