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Michael J. Dorough
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Meridian, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
Dynamically adaptable semiconductor parametric testing
Patent number
7,383,147
Issue date
Jun 3, 2008
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Grant
Intelligent measurement modular semiconductor parametric test system
Patent number
7,337,088
Issue date
Feb 26, 2008
Micron Technology, Inc.
Sergey A. Velichko
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically adaptable semiconductor parametric testing
Patent number
7,165,004
Issue date
Jan 16, 2007
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically adaptable semiconductor parametric testing
Patent number
7,162,386
Issue date
Jan 9, 2007
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically adaptable semiconductor parametric testing
Patent number
7,139,672
Issue date
Nov 21, 2006
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic creation and modification of wafer test maps during wafer t...
Patent number
7,010,451
Issue date
Mar 7, 2006
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Grant
Remote semiconductor microscopy
Patent number
6,859,760
Issue date
Feb 22, 2005
Micron Technology, Inc.
Michael J. Dorough
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Remote semiconductor microscopy
Patent number
6,567,770
Issue date
May 20, 2003
Micron Technology, Inc.
Michael J. Dorough
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Remote semiconductor microscopy
Patent number
6,370,487
Issue date
Apr 9, 2002
Micron Technology, Inc.
Michael J. Dorough
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR DETERMINING DEVICE PARTICIPATION IN AN ENE...
Publication number
20150005968
Publication date
Jan 1, 2015
ENERNOC, INC.
Michael J. DOROUGH
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Concurrent control of semiconductor parametric testing
Publication number
20070112538
Publication date
May 17, 2007
Micron Technology, Inc.
Sergey A. Velichko
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTELLIGENT MEASUREMENT MODULAR SEMICONDUCTOR PARAMETRIC TEST SYSTEM
Publication number
20060212253
Publication date
Sep 21, 2006
Micron Technology, Inc.
Sergey A. Velichko
G01 - MEASURING TESTING
Information
Patent Application
Dynamically adaptable semiconductor parametric testing
Publication number
20060125509
Publication date
Jun 15, 2006
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Application
Dynamically adaptable semiconductor parametric testing
Publication number
20060122803
Publication date
Jun 8, 2006
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Application
Dynamic creation and modification of wafer test maps during wafer t...
Publication number
20060064268
Publication date
Mar 23, 2006
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Application
Dynamically adaptable semiconductor parametric testing
Publication number
20050021273
Publication date
Jan 27, 2005
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Application
Dynamic creation and modification of wafer test maps during wafer t...
Publication number
20040210413
Publication date
Oct 21, 2004
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Application
Dynamically adaptable semiconductor parametric testing
Publication number
20030212523
Publication date
Nov 13, 2003
Micron Technology, Inc.
Michael J. Dorough
G01 - MEASURING TESTING
Information
Patent Application
Remote semiconductor microscopy
Publication number
20030208340
Publication date
Nov 6, 2003
Micron Technology, Inc.
Michael J. Dorough
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Intelligent measurement modular semiconductor parametric test system
Publication number
20030028343
Publication date
Feb 6, 2003
Micron Technology, Inc.
Sergey A. Velichko
G01 - MEASURING TESTING
Information
Patent Application
Concurrent control of semiconductor parametric testing
Publication number
20020152046
Publication date
Oct 17, 2002
Sergey A. Velichko
G01 - MEASURING TESTING
Information
Patent Application
Remote semiconductor microscopy
Publication number
20020111775
Publication date
Aug 15, 2002
Micron Technology, Inc.
Michael J. Dorough
G02 - OPTICS