Michael J. Haji-Sheikh

Person

De Kalb, IL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Hydrogen sensor
- Patent number 9,618,465
- Issue date Apr 11, 2017
- Board of Trustees of Northern Illinois University
- Martin Kocanda
- G01 - MEASURING TESTING
Information Patent Grant
Nano-porous alumina sensor
- Patent number 8,132,457
- Issue date Mar 13, 2012
- Northern Illinois University
- Michael Haji-Sheikh
- G01 - MEASURING TESTING
Information Patent Grant
Providing current control over wafer borne semiconductor devices us...
- Patent number 8,129,253
- Issue date Mar 6, 2012
- Finisar Corporation
- Michael J. Haji-Sheikh
- G01 - MEASURING TESTING
Information Patent Grant
Providing current control over wafer borne semiconductor devices us...
- Patent number 8,039,277
- Issue date Oct 18, 2011
- Finisar Corporation
- Michael J. Haji-Sheikh
- G01 - MEASURING TESTING
Information Patent Grant
Methods of conducting wafer level burn-in of electronic devices
- Patent number 7,700,379
- Issue date Apr 20, 2010
- Finisar Corporation
- Michael J. Haji-Sheikh
- G01 - MEASURING TESTING
Information Patent Grant
Providing photonic control over wafer borne semiconductor devices
- Patent number 7,662,650
- Issue date Feb 16, 2010
- Finisar Corporation
- Michael J. Haji-Sheikh
- G01 - MEASURING TESTING
Information Patent Grant
Systems for wafer level burn-in of electronic devices
- Patent number 7,190,184
- Issue date Mar 13, 2007
- Finisar Corporation
- Michael J. Haji-Sheikh
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic differential field sensor using hysteresis field in AMR films
- Patent number 6,831,458
- Issue date Dec 14, 2004
- Honeywell International Inc.
- Michael J. Haji-Sheikh
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HYDROGEN SENSOR
- Publication number 20140326615
- Publication date Nov 6, 2014
- BOARD OF TRUSTEES OF NORTHERN ILLINOIS UNIVERSITY
- Martin Kocanda
- G01 - MEASURING TESTING
Information Patent Application
PROVIDING CURRENT CONTROL OVER WAFER BORNE SEMICONDUCTOR DEVICES US...
- Publication number 20100264511
- Publication date Oct 21, 2010
- Michael J Haji-Sheikh
- G01 - MEASURING TESTING
Information Patent Application
Nano-porous alumina sensor
- Publication number 20100031745
- Publication date Feb 11, 2010
- Michael Haji-Sheikh
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Providing photonic control over wafer borne semiconductor devices
- Publication number 20070117242
- Publication date May 24, 2007
- Michael J. Haji-Sheikh
- G01 - MEASURING TESTING
Information Patent Application
Providing current control over wafer borne semiconductor devices us...
- Publication number 20070029549
- Publication date Feb 8, 2007
- Michael j HAJI-SHEIKH
- G01 - MEASURING TESTING
Information Patent Application
Methods of conducting wafer level burn-in of electronic devices
- Publication number 20060097337
- Publication date May 11, 2006
- Michael J Haji-Sheikh
- G01 - MEASURING TESTING
Information Patent Application
Systems for wafer level burn-in of electronic devices
- Publication number 20050024076
- Publication date Feb 3, 2005
- Michael J Haji-Sheikh
- G01 - MEASURING TESTING
Information Patent Application
Magnetic differential field sensor using hysteresis field in AMR films
- Publication number 20040075430
- Publication date Apr 22, 2004
- Michael J. Haji-Sheikh
- G01 - MEASURING TESTING

Michael J. Haji-Sheikh

Person

Patents Grantslast 30 patents

Hydrogen sensor

Nano-porous alumina sensor

Providing current control over wafer borne semiconductor devices us...

Providing current control over wafer borne semiconductor devices us...

Methods of conducting wafer level burn-in of electronic devices

Providing photonic control over wafer borne semiconductor devices

Systems for wafer level burn-in of electronic devices

Magnetic differential field sensor using hysteresis field in AMR films

Patents Applicationslast 30 patents

HYDROGEN SENSOR

PROVIDING CURRENT CONTROL OVER WAFER BORNE SEMICONDUCTOR DEVICES US...

Nano-porous alumina sensor

Providing photonic control over wafer borne semiconductor devices

Providing current control over wafer borne semiconductor devices us...

Methods of conducting wafer level burn-in of electronic devices

Systems for wafer level burn-in of electronic devices

Magnetic differential field sensor using hysteresis field in AMR films