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Michael J. McNutt
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El Toro, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for measuring a capacitance of a conductor
Patent number
6,856,143
Issue date
Feb 15, 2005
Texas Instruments Incorporated
Michael J. McNutt
G01 - MEASURING TESTING
Information
Patent Grant
System and method for using a capacitance measurement to monitor th...
Patent number
6,788,074
Issue date
Sep 7, 2004
Texas Instruments Incorporated
Robin C. Sarma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charge skimming and variable integration time in focal plane arrays
Patent number
5,326,996
Issue date
Jul 5, 1994
Loral Fairchild Corp.
Michael J. McNutt
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Layout scheme for precise capacitance ratios
Patent number
5,322,438
Issue date
Jun 21, 1994
Silicon Systems, Inc.
Michael McNutt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Platinum silicide imager
Patent number
4,857,979
Issue date
Aug 15, 1989
Ford Aerospace and Communications Corporation
Michael J. McNutt
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Programmable voltage offset circuit
Patent number
4,852,063
Issue date
Jul 25, 1989
Ford Aerospace and Communications Corporation
Michael J. McNutt
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Programmable voltage offset circuit
Patent number
4,829,459
Issue date
May 9, 1989
Ford Aerospace & Communications Corporation
Michael J. McNutt
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
System and method for using a capacitance measurement to monitor th...
Publication number
20030234655
Publication date
Dec 25, 2003
TEXAS INSTRUMENTS INCORPORATED
Robin C. Sarma
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System and method for measuring a capacitance of a conductor
Publication number
20030231025
Publication date
Dec 18, 2003
TEXAS INSTRUMENTS INCORPORATED
Michael J. McNutt
G01 - MEASURING TESTING