Michael J. Mende

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe head
- Patent number D1031997
- Issue date Jun 18, 2024
- PMK Mess- und Kommunikationstechnik, GmbH
- Michael J Mende
- D24 - Medical and laboratory equipment
Information Patent Grant
Tip cable component of a measurement probe head assembly
- Patent number D992437
- Issue date Jul 18, 2023
- Tektronix, Inc.
- David Thomas Engquist
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Systems, devices, and methods for measuring direct current/low freq...
- Patent number 11,635,452
- Issue date Apr 25, 2023
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Measurement probe head assembly
- Patent number D947693
- Issue date Apr 5, 2022
- Tektronix, Inc.
- David Thomas Engquist
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Shielded probe tip interface
- Patent number 10,753,961
- Issue date Aug 25, 2020
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
High input impedance electro-optic sensor
- Patent number 10,684,311
- Issue date Jun 16, 2020
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Wide range compensation of low frequency response passive probe
- Patent number 10,585,118
- Issue date Mar 10, 2020
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic output clamping for a probe or accessory
- Patent number 10,514,394
- Issue date Dec 24, 2019
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Flexible resistive tip cable assembly for differential probing
- Patent number 10,302,676
- Issue date May 28, 2019
- Tektronix, Inc.
- Michael J. Mende
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active noise suppression for optical voltage sensor
- Patent number 10,234,501
- Issue date Mar 19, 2019
- Tektronix, Inc.
- Michael J. Mende
- G02 - OPTICS
Information Patent Grant
Electro-optic sensor system
- Patent number 10,225,022
- Issue date Mar 5, 2019
- Tektronix, Inc.
- Richard A. Booman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Electro-optic probe with multiple sensitivity ranges
- Patent number 9,933,456
- Issue date Apr 3, 2018
- Tektronix, Inc.
- Michael J. Mende
- G02 - OPTICS
Information Patent Grant
High bandwidth and input impedance electro-optic probe
- Patent number 9,804,473
- Issue date Oct 31, 2017
- Tektronix, Inc.
- Michael J. Mende
- G02 - OPTICS
Information Patent Grant
Differential pin to RF adaptor for probing applications
- Patent number 9,793,661
- Issue date Oct 17, 2017
- Tektronix, Inc.
- Michael J. Mende
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Isolated probe with digital multimeter or digital voltmeter
- Patent number 9,625,495
- Issue date Apr 18, 2017
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic compensation circuit
- Patent number 9,557,399
- Issue date Jan 31, 2017
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system including accessory with internal calibration si...
- Patent number 9,476,960
- Issue date Oct 25, 2016
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Extended range electro-optic voltage accessory
- Patent number 9,331,776
- Issue date May 3, 2016
- Tektronix, Inc.
- Michael J. Mende
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method of controlling electro-optical probe gain and sensitivity
- Patent number 9,209,593
- Issue date Dec 8, 2015
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Host controlled voltage input system for an accessory device
- Patent number 7,532,492
- Issue date May 12, 2009
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Time shifting signal acquisition probe system
- Patent number 7,463,015
- Issue date Dec 9, 2008
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Input by-pass circuit for a current probe
- Patent number 7,358,717
- Issue date Apr 15, 2008
- Tektronix, Inc.
- Jonathan S. Dandy
- G01 - MEASURING TESTING
Information Patent Grant
Current sensing circuit for use in a current measurement probe
- Patent number 7,309,980
- Issue date Dec 18, 2007
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Communications bus management circuit
- Patent number 7,308,519
- Issue date Dec 11, 2007
- Tektronix, Inc.
- Jonathan S. Dandy
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Current probing system
- Patent number 7,294,995
- Issue date Nov 13, 2007
- Tektronix, Inc.
- Kerry A. Stevens
- G01 - MEASURING TESTING
Information Patent Grant
Output termination auto detection circuit for an input device
- Patent number 6,963,196
- Issue date Nov 8, 2005
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Constant input impedance AC coupling circuit for a current probe sy...
- Patent number 6,836,107
- Issue date Dec 28, 2004
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Grant
Method of monitoring current probe transformer temperature
- Patent number 6,817,760
- Issue date Nov 16, 2004
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multipurpose Spacer
- Publication number 20240175719
- Publication date May 30, 2024
- PMK Mess- und Kommunikationstechnik GmbH
- Michael J. Mende
- G02 - OPTICS
Information Patent Application
Probe Head
- Publication number 20240125816
- Publication date Apr 18, 2024
- PMK Mess- und Kommunikationstechnik, GmbH
- Michael J Mende
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MEASURING DIRECT CURRENT/LOW FREQ...
- Publication number 20230266369
- Publication date Aug 24, 2023
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
Temperature-independent Optical Link
- Publication number 20230155679
- Publication date May 18, 2023
- PMK Mess- und Kommunikationstechnik GmbH
- Michael J Mende
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MEASURING DIRECT CURRENT/LOW FREQ...
- Publication number 20200132731
- Publication date Apr 30, 2020
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
Large Dynamic Range Electro-Optic Probe
- Publication number 20190204356
- Publication date Jul 4, 2019
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
Shielded Probe Tip Interface
- Publication number 20180328962
- Publication date Nov 15, 2018
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
High Input Impedance Electro-Optic Sensor
- Publication number 20180328964
- Publication date Nov 15, 2018
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
Wide Range Compensation of Low Frequency Response Passive Probe
- Publication number 20180328961
- Publication date Nov 15, 2018
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTIC SENSOR SYSTEM
- Publication number 20170353248
- Publication date Dec 7, 2017
- Tektronix, Inc.
- Richard A. Booman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
FLEXIBLE RESISTIVE TIP CABLE ASSEMBLY FOR DIFFERENTIAL PROBING
- Publication number 20170271826
- Publication date Sep 21, 2017
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL PIN TO RF ADAPTOR FOR PROBING APPLICATIONS
- Publication number 20170271828
- Publication date Sep 21, 2017
- Tektronix, Inc.
- Michael J. Mende
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACTIVE NOISE SUPPRESSION FOR OPTICAL VOLTAGE SENSOR
- Publication number 20170248653
- Publication date Aug 31, 2017
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC OUTPUT CLAMPING FOR A PROBE OR ACCESSORY
- Publication number 20170248631
- Publication date Aug 31, 2017
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
HIGH BANDWIDTH AND INPUT IMPEDANCE ELECTRO-OPTIC PROBE
- Publication number 20160363833
- Publication date Dec 15, 2016
- Tektronix, Inc.
- Michael J. Mende
- G02 - OPTICS
Information Patent Application
ELECTRO-OPTIC PROBE WITH MULTIPLE SENSITIVITY RANGES
- Publication number 20160349287
- Publication date Dec 1, 2016
- Tektronix, Inc.
- Michael J. Mende
- G02 - OPTICS
Information Patent Application
DYNAMIC COMPENSATION CIRCUIT
- Publication number 20150241543
- Publication date Aug 27, 2015
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM INCLUDING ACCESSORY WITH INTERNAL CALIBRATION SI...
- Publication number 20150168530
- Publication date Jun 18, 2015
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CONTROLLING ELECTRO-OPTICAL PROBE GAIN AND SENSITIVITY
- Publication number 20150171589
- Publication date Jun 18, 2015
- Tektronix, Inc.
- Michael J. Mende
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXTENDED RANGE ELECTRO-OPTIC VOLTAGE ACCESSORY
- Publication number 20150171960
- Publication date Jun 18, 2015
- Tektronix, Inc.
- Michael J. Mende
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ISOLATED PROBE WITH DIGITAL MULTIMETER OR DIGITAL VOLTMETER
- Publication number 20150054492
- Publication date Feb 26, 2015
- Tektronix, Inc.
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
Time shifting signal acquisition probe system
- Publication number 20080159368
- Publication date Jul 3, 2008
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
Input by-pass circuit for a current probe
- Publication number 20070273361
- Publication date Nov 29, 2007
- Jonathan S. Dandy
- G01 - MEASURING TESTING
Information Patent Application
Current probing system
- Publication number 20070257661
- Publication date Nov 8, 2007
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
CURRENT PROBING SYSTEM
- Publication number 20070257657
- Publication date Nov 8, 2007
- Kerry A. Stevens
- G01 - MEASURING TESTING
Information Patent Application
Current sensing circuit for use in a current measurement probe
- Publication number 20070257663
- Publication date Nov 8, 2007
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
Current probe
- Publication number 20070257662
- Publication date Nov 8, 2007
- Michael J. Mende
- G01 - MEASURING TESTING
Information Patent Application
Accessory device voltage management system controlled by a host
- Publication number 20070143638
- Publication date Jun 21, 2007
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Application
Communications bus management circuit
- Publication number 20040151201
- Publication date Aug 5, 2004
- Jonathan S. Dandy
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Constant input impedance AC coupling circuit for a current probe sy...
- Publication number 20040100248
- Publication date May 27, 2004
- Michael J. Mende
- G01 - MEASURING TESTING

Michael J. Mende

Person

Patents Grantslast 30 patents

Probe head

Tip cable component of a measurement probe head assembly

Systems, devices, and methods for measuring direct current/low freq...

Measurement probe head assembly

Shielded probe tip interface

High input impedance electro-optic sensor

Wide range compensation of low frequency response passive probe

Dynamic output clamping for a probe or accessory

Flexible resistive tip cable assembly for differential probing

Active noise suppression for optical voltage sensor

Electro-optic sensor system

Electro-optic probe with multiple sensitivity ranges

High bandwidth and input impedance electro-optic probe

Differential pin to RF adaptor for probing applications

Isolated probe with digital multimeter or digital voltmeter

Dynamic compensation circuit

Measurement system including accessory with internal calibration si...

Extended range electro-optic voltage accessory

Method of controlling electro-optical probe gain and sensitivity

Host controlled voltage input system for an accessory device

Time shifting signal acquisition probe system

Input by-pass circuit for a current probe

Current sensing circuit for use in a current measurement probe

Communications bus management circuit

Current probing system

Output termination auto detection circuit for an input device

Constant input impedance AC coupling circuit for a current probe sy...

Method of monitoring current probe transformer temperature

Patents Applicationslast 30 patents

Multipurpose Spacer

Probe Head

SYSTEMS, DEVICES, AND METHODS FOR MEASURING DIRECT CURRENT/LOW FREQ...

Temperature-independent Optical Link

SYSTEMS, DEVICES, AND METHODS FOR MEASURING DIRECT CURRENT/LOW FREQ...

Large Dynamic Range Electro-Optic Probe

Shielded Probe Tip Interface

High Input Impedance Electro-Optic Sensor

Wide Range Compensation of Low Frequency Response Passive Probe

ELECTRO-OPTIC SENSOR SYSTEM

FLEXIBLE RESISTIVE TIP CABLE ASSEMBLY FOR DIFFERENTIAL PROBING

DIFFERENTIAL PIN TO RF ADAPTOR FOR PROBING APPLICATIONS

ACTIVE NOISE SUPPRESSION FOR OPTICAL VOLTAGE SENSOR

DYNAMIC OUTPUT CLAMPING FOR A PROBE OR ACCESSORY

HIGH BANDWIDTH AND INPUT IMPEDANCE ELECTRO-OPTIC PROBE

ELECTRO-OPTIC PROBE WITH MULTIPLE SENSITIVITY RANGES

DYNAMIC COMPENSATION CIRCUIT

MEASUREMENT SYSTEM INCLUDING ACCESSORY WITH INTERNAL CALIBRATION SI...

METHOD OF CONTROLLING ELECTRO-OPTICAL PROBE GAIN AND SENSITIVITY

EXTENDED RANGE ELECTRO-OPTIC VOLTAGE ACCESSORY

ISOLATED PROBE WITH DIGITAL MULTIMETER OR DIGITAL VOLTMETER

Time shifting signal acquisition probe system

Input by-pass circuit for a current probe

Current probing system

CURRENT PROBING SYSTEM

Current sensing circuit for use in a current measurement probe

Current probe

Accessory device voltage management system controlled by a host

Communications bus management circuit

Constant input impedance AC coupling circuit for a current probe sy...