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Michael Lehmann
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Winterthur, CH
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Patents Grants
last 30 patents
Information
Patent Grant
Optoelectronic modules operable to recognize spurious reflections a...
Patent number
11,543,505
Issue date
Jan 3, 2023
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic modules operable to recognize spurious reflections a...
Patent number
11,536,815
Issue date
Dec 27, 2022
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-light-based systems using reduced illumination duty cycles
Patent number
10,712,432
Issue date
Jul 14, 2020
ams Sensors Singapore Pte. Ltd.
Michael Lehmann
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic modules operable to recognize spurious reflections a...
Patent number
10,705,192
Issue date
Jul 7, 2020
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Grant
Optical imaging modules and optical detection modules including a t...
Patent number
10,359,505
Issue date
Jul 23, 2019
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Grant
Demodulation pixel incorporating majority carrier current, buried c...
Patent number
9,698,196
Issue date
Jul 4, 2017
Heptagon Micro Optics Pte. Ltd.
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
PN-structured gate demodulation pixel
Patent number
9,343,607
Issue date
May 17, 2016
Heptagon Micro Optics Pte. Ltd.
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Solid-state photodetector pixel and photodetecting method
Patent number
9,209,327
Issue date
Dec 8, 2015
Heptagon Micro Optics Pte. Ltd.
Simon Neukom
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Time of flight sensor with subframe compression and method
Patent number
9,140,795
Issue date
Sep 22, 2015
Mesa Imaging AG
Michael Lehmann
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Demodulation pixel with backside illumination and charge barrier
Patent number
9,117,712
Issue date
Aug 25, 2015
Mesa Imaging AG
Thierry Oggier
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
3D CCD-style imaging sensor with rolling readout
Patent number
9,076,709
Issue date
Jul 7, 2015
Mesa Imaging AG
Jonas Felber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sense node capacitive structure for time of flight sensor
Patent number
9,000,349
Issue date
Apr 7, 2015
Mesa Imaging AG
Michael Lehmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Demodulation pixel with daisy chain charge storage sites and method...
Patent number
8,760,549
Issue date
Jun 24, 2014
Mesa Imaging AG
Michael Lehmann
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Multistage demodulation pixel and method
Patent number
8,754,939
Issue date
Jun 17, 2014
Mesa Imaging AG
Thierry Oggier
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Image sensor with large-area, high-sensitivity and high-speed pixels
Patent number
8,106,472
Issue date
Jan 31, 2012
Mesa Imaging AG
Rolf Kaufmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Solid-state photodetector pixel and photodetecting method
Patent number
7,897,928
Issue date
Mar 1, 2011
Mesa Imaging AG
Rolf Kaufmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
On-chip time-based digital conversion of pixel outputs
Patent number
7,889,257
Issue date
Feb 15, 2011
Mesa Imaging AG
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Grant
Image sensor with large-area, high-sensitivity and high-speed pixels
Patent number
7,701,028
Issue date
Apr 20, 2010
Mesa Imaging AG
Rolf Kaufmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for the demodulation of modulated electric signals
Patent number
7,671,671
Issue date
Mar 2, 2010
Mesa Imaging AG
Bernhard Buettgen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Reference pixel array with varying sensitivities for time of flight...
Patent number
7,586,077
Issue date
Sep 8, 2009
Mesa Imaging AG
Michael Lehmann
G01 - MEASURING TESTING
Information
Patent Grant
Highly sensitive, fast pixel for use in an image sensor
Patent number
7,560,701
Issue date
Jul 14, 2009
Mesa Imaging AG
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Grant
Photon detection device
Patent number
7,547,889
Issue date
Jun 16, 2009
CSEM Centre Suisse D'Electronique et de Microtechnique SA
Michael Lehmann
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO RECOGNIZE SPURIOUS REFLECTIONS A...
Publication number
20200319320
Publication date
Oct 8, 2020
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO RECOGNIZE SPURIOUS REFLECTIONS A...
Publication number
20200319321
Publication date
Oct 8, 2020
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL IMAGING MODULES AND OPTICAL DETECTION MODULES INCLUDING A T...
Publication number
20170090018
Publication date
Mar 30, 2017
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO RECOGNIZE SPURIOUS REFLECTIONS A...
Publication number
20170038459
Publication date
Feb 9, 2017
Heptogaon Micro Optics Pte Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Application
TIME-OF-LIGHT-BASED SYSTEMS USING REDUCED ILLUMINATION DUTY CYCLES
Publication number
20160299218
Publication date
Oct 13, 2016
HEPTAGON MICRO OPTICS PTE. LTD.
Michael LEHMANN
G01 - MEASURING TESTING
Information
Patent Application
Solid-State Photodetector Pixel and Photodetecting Method
Publication number
20140203389
Publication date
Jul 24, 2014
MESA IMAGING AG
Simon Neukom
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PN-Structured Gate Demodulation Pixel
Publication number
20130248938
Publication date
Sep 26, 2013
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Time of Flight Sensor with Subframe Compression and Method
Publication number
20130070132
Publication date
Mar 21, 2013
Michael Lehmann
G01 - MEASURING TESTING
Information
Patent Application
Multistage Demodulation Pixel and Method
Publication number
20110273561
Publication date
Nov 10, 2011
MESA IMAGING AG
Thierry Oggier
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
3D CCD-Style Imaging Sensor with Rolling Readout
Publication number
20110114821
Publication date
May 19, 2011
MESA IMAGING AG
Jonas Felber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Solid-State Photodetector Pixel and Photodetecting Method
Publication number
20110101241
Publication date
May 5, 2011
MESA IMAGING AG
Kaspar Cottier
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Demodulation Pixel Incorporating Majority Carrier Current, Buried C...
Publication number
20110089471
Publication date
Apr 21, 2011
MESA IMAGING AG
Bernhard Buettgen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System for Charge-Domain Electron Subtraction in Demodulation Pixel...
Publication number
20100308209
Publication date
Dec 9, 2010
MESA IMAGING AG
Berhard Buettgen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Image Sensor with Large-Area, High-Sensitivity and High-Speed Pixels
Publication number
20100193666
Publication date
Aug 5, 2010
MESA IMAGING AG
Rolf Kaufmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Demodulation Pixel with Daisy Chain Charge Storage Sites and Method...
Publication number
20100053405
Publication date
Mar 4, 2010
MESA IMAGING AG
Michael Lehmann
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Drift Field Demodulation Pixel with Pinned Photo Diode
Publication number
20090224139
Publication date
Sep 10, 2009
MESA IMAGING AG
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
Reference Pixel Array with Varying Sensitivities for TOF Sensor
Publication number
20090020687
Publication date
Jan 22, 2009
MESA IMAGING AG
Michael Lehmann
G01 - MEASURING TESTING
Information
Patent Application
On-chip time-based digital conversion of pixel outputs
Publication number
20090021617
Publication date
Jan 22, 2009
MESA IMAGING AG
Thierry Oggier
G01 - MEASURING TESTING
Information
Patent Application
Solid-state photodetector pixel and photodetecting method
Publication number
20090014658
Publication date
Jan 15, 2009
Mesa Inaging AG
Kaspar Cottier
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Device and Method for the Demodulation of Modulated Electric Signals
Publication number
20080247033
Publication date
Oct 9, 2008
MESA IMAGING AG
Bernhard Buettgen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Photon detection device
Publication number
20080224054
Publication date
Sep 18, 2008
CSEM Centre Suisse d'Electronique et de Microtechnique SA
Michael Lehmann
G01 - MEASURING TESTING
Information
Patent Application
Image sensor with large-area, high-sensitivity and high-speed pixels
Publication number
20070187724
Publication date
Aug 16, 2007
Rolf Kaufmann
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Highly sensitive, fast pixel for use in an image sensor
Publication number
20070034779
Publication date
Feb 15, 2007
Thierry Oggier
G01 - MEASURING TESTING