Michael Lines

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Cedar Hills, UT, US

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Patents Grantslast 30 patents

Information Patent Grant
Radiation window with support structure
- Patent number 9,299,469
- Issue date Mar 29, 2016
- Mark Larson
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Nano fractal diffuser
- Patent number 8,248,696
- Issue date Aug 21, 2012
- Moxtek, Inc.
- Michael Lines
- G02 - OPTICS
Information Patent Grant
Radiation window with coated silicon support structure
- Patent number 7,709,820
- Issue date May 4, 2010
- Moxtek, Inc.
- Keith W. Decker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Corrosion resistant wire-grid polarizer and method of fabrication
- Patent number 6,785,050
- Issue date Aug 31, 2004
- Moxtek, Inc.
- Michael Lines
- G02 - OPTICS
Information Patent Grant
Mobile miniature X-ray source
- Patent number 6,661,876
- Issue date Dec 9, 2003
- Moxtek, Inc.
- Clark Turner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RADIATION WINDOW WITH SUPPORT STRUCTURE
- Publication number 20150016593
- Publication date Jan 15, 2015
- Mark Larson
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
NANO FRACTAL DIFFUSER
- Publication number 20130155516
- Publication date Jun 20, 2013
- Michael Lines
- G02 - OPTICS
Information Patent Application
NANO FRACTAL DIFFUSER
- Publication number 20100328768
- Publication date Dec 30, 2010
- Michael Lines
- G02 - OPTICS
Information Patent Application
Radiation Window With Coated Silicon Support Structure
- Publication number 20090173897
- Publication date Jul 9, 2009
- Keith W. Decker
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Corrosion resistant wire-grid polarizer and method of fabrication
- Publication number 20030227678
- Publication date Dec 11, 2003
- Moxtek, Inc.
- Michael Lines
- G02 - OPTICS
Information Patent Application
Mobile miniature X-ray source
- Publication number 20030021377
- Publication date Jan 30, 2003
- Moxtek, Inc.
- Clark Turner
- G01 - MEASURING TESTING