Michael Okruss

Person

Potsdam, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Spectrometer arrangement
- Patent number 10,746,598
- Issue date Aug 18, 2020
- Analytik Jena AG
- Stefan Münch
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer arrangement, method for producing a two-dimensional sp...
- Patent number 10,718,666
- Issue date Jul 21, 2020
- Analytik Jena AG
- Stefan Münch
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer with two-dimensional spectrum
- Patent number 10,488,254
- Issue date Nov 26, 2019
- Analytik Jena AG
- Stefan Münch
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer arrangement
- Patent number 8,873,048
- Issue date Oct 28, 2014
- Leibniz-Institut fur Analytische Wissenschaften - ISAS - e.V.
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Grant
Echelle spectrometer arrangement using internal predispersion
- Patent number 8,681,329
- Issue date Mar 25, 2014
- Leibniz—Institut für Analytische Wissenschaften—ISAS—e.V.
- Helmut Becker-Roβ
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer assembly
- Patent number 8,102,527
- Issue date Jan 24, 2012
- Leibniz-Institut fur Analytische
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Grant
Method for determining background and correction of broadband backg...
- Patent number 7,876,435
- Issue date Jan 25, 2011
- Leibniz-Institut fur Analytische Wissenschaften - ISAS - e.V.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Grant
Echelle spectometer with improved use of the detector by means of t...
- Patent number 7,804,593
- Issue date Sep 28, 2010
- Leibniz-Institut fur Analytische Wissenschaften - ISAS - e.V.
- Helmut Becker-Roβ
- G01 - MEASURING TESTING
Information Patent Grant
Method for the analysis of echelle spectra
- Patent number 7,319,519
- Issue date Jan 15, 2008
- Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektron...
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution littrow spectrometer and method for the quasi-simul...
- Patent number 6,717,670
- Issue date Apr 6, 2004
- Gesellschaft zur Förderung der Spektrochemie und angewandten Spectroskopie e.V.
- Helmut Becker-Ross
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROMETER ARRANGEMENT
- Publication number 20200370957
- Publication date Nov 26, 2020
- Analytik Jena AG
- Stefan Münch
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER ARRANGEMENT
- Publication number 20190368933
- Publication date Dec 5, 2019
- Analytik Jena AG
- Stefan MÜNCH
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER ARRANGEMENT, METHOD FOR PRODUCING A TWO-DIMENSIONAL SP...
- Publication number 20190186992
- Publication date Jun 20, 2019
- Analytik Jena AG
- Stefan MÜNCH
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER WITH TWO-DIMENSIONAL SPECTRUM
- Publication number 20190025121
- Publication date Jan 24, 2019
- Analytik Jena AG
- Stefan MÜNCH
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER ARRANGEMENT
- Publication number 20120262713
- Publication date Oct 18, 2012
- Leibniz Institut fur Analytische Wissenschaften- ISAS-e.V.
- Stefan Florek
- G01 - MEASURING TESTING
Information Patent Application
ECHELLE SPECTROMETER ARRANGEMENT USING INTERNAL PREDISPERSION
- Publication number 20110285993
- Publication date Nov 24, 2011
- Leibniz Institut fur Analytische Wissenschaften- ISAS-e.V.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer Assembly
- Publication number 20100171953
- Publication date Jul 8, 2010
- Gesellschaft zur Forderung der analytischen Wissenschaften e.V.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Application
Method for determining background and correction of broadband backg...
- Publication number 20080106735
- Publication date May 8, 2008
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Application
Echelle Spectometer with Improved Use of the Detector by Means of T...
- Publication number 20080094626
- Publication date Apr 24, 2008
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Application
Method for the analysis of echelle spectra
- Publication number 20040114139
- Publication date Jun 17, 2004
- Stefan Florek
- G01 - MEASURING TESTING

Michael Okruss

Person

Patents Grantslast 30 patents

Spectrometer arrangement

Spectrometer arrangement, method for producing a two-dimensional sp...

Spectrometer with two-dimensional spectrum

Spectrometer arrangement

Echelle spectrometer arrangement using internal predispersion

Spectrometer assembly

Method for determining background and correction of broadband backg...

Echelle spectometer with improved use of the detector by means of t...

Method for the analysis of echelle spectra

High-resolution littrow spectrometer and method for the quasi-simul...

Patents Applicationslast 30 patents

SPECTROMETER ARRANGEMENT

SPECTROMETER ARRANGEMENT

SPECTROMETER ARRANGEMENT, METHOD FOR PRODUCING A TWO-DIMENSIONAL SP...

SPECTROMETER WITH TWO-DIMENSIONAL SPECTRUM

SPECTROMETER ARRANGEMENT

ECHELLE SPECTROMETER ARRANGEMENT USING INTERNAL PREDISPERSION

Spectrometer Assembly

Method for determining background and correction of broadband backg...

Echelle Spectometer with Improved Use of the Detector by Means of T...

Method for the analysis of echelle spectra