Michael R. Conboy

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
System for brokering fault detection data
- Patent number 8,180,587
- Issue date May 15, 2012
- GlobalFoundries Inc.
- Elfido Cross, Jr.
- G05 - CONTROLLING REGULATING
Information Patent Grant
Fault notification based on a severity level
- Patent number 7,200,779
- Issue date Apr 3, 2007
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mask identification database server
- Patent number 7,162,326
- Issue date Jan 9, 2007
- Advanced Micro Devices, Inc.
- Russel Shirley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of dynamically designing a preventative maintenance schedule...
- Patent number 7,130,769
- Issue date Oct 31, 2006
- Advanced Micro Devices, Inc.
- Sam H. Allen, Jr.
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automated material handling system for a manufacturing facility div...
- Patent number 7,092,779
- Issue date Aug 15, 2006
- Michael R. Conboy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Routing workpieces based upon detecting a fault
- Patent number 7,051,250
- Issue date May 23, 2006
- Advanced Micro Devices, Inc.
- Sam H. Allen, Jr.
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Management of multiple types of empty carriers in automated materia...
- Patent number 7,039,495
- Issue date May 2, 2006
- Advance Micro Devices, Inc.
- Michael R. Conboy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Management of move requests from a factory system to an automated m...
- Patent number 6,985,794
- Issue date Jan 10, 2006
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for performing fault detection using data from...
- Patent number 6,954,883
- Issue date Oct 11, 2005
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Scheduling method for automated work-cell transfer system
- Patent number 6,928,333
- Issue date Aug 9, 2005
- Advance Micro Devices, Inc.
- Michael R. Conboy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for controlling a multi-chamber processing tool
- Patent number 6,895,295
- Issue date May 17, 2005
- Advanced Micro Devices, Inc.
- Jason A. Grover
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle sorter
- Patent number 6,878,895
- Issue date Apr 12, 2005
- Advance Micro Devices, Inc.
- Patrick J. Ryan
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method for requesting trace data reports from FDC semiconductor fab...
- Patent number 6,871,112
- Issue date Mar 22, 2005
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining a possible cause of a fault in a semiconductor fabricat...
- Patent number 6,790,680
- Issue date Sep 14, 2004
- Advanced Micro Devices, Inc.
- Jason A. Grover
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of dynamically enabling additional sensors based upon initia...
- Patent number 6,792,389
- Issue date Sep 14, 2004
- Advanced Micro Devices, Inc.
- Sam H. Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Predictive processing method in a semiconductor processing facility
- Patent number 6,766,285
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Sam H. Allen
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for proactive dispatch system to improve line...
- Patent number 6,763,277
- Issue date Jul 13, 2004
- Advanced Micro Devices, Inc.
- Sam H. Allen
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Operating a processing tool in a degraded mode upon detecting a fault
- Patent number 6,763,278
- Issue date Jul 13, 2004
- Advanced Micro Devices, Inc.
- Elfido Coss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Integration of business rule parameters in priority setting of wafe...
- Patent number 6,711,450
- Issue date Mar 23, 2004
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer rotation in wafer handling devices
- Patent number 6,699,004
- Issue date Mar 2, 2004
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining wafer identity and orientation
- Patent number 6,666,337
- Issue date Dec 23, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer rotation randomization in cluster tool processing
- Patent number 6,662,070
- Issue date Dec 9, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Management of move requests from a factory system to an automated m...
- Patent number 6,662,076
- Issue date Dec 9, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method for determining, tracking and/or controlling processing base...
- Patent number 6,638,778
- Issue date Oct 28, 2003
- Advanced Micro Devices, Inc.
- Anastasia Oshelski Peterson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer-less qualification of a processing tool
- Patent number 6,629,012
- Issue date Sep 30, 2003
- Advanced Micro Devices Inc.
- Terrence J. Riley
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Wafer rotation randomization for process defect detection in semico...
- Patent number 6,625,556
- Issue date Sep 23, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer rotation in semiconductor processing
- Patent number 6,622,111
- Issue date Sep 16, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for using latency time as a run-to-run control...
- Patent number 6,571,371
- Issue date May 27, 2003
- Advanced Micro Devices, Inc.
- Elfido Coss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for monitoring consumable performance
- Patent number 6,567,718
- Issue date May 20, 2003
- Advanced Micro Devices, Inc.
- William J. Campbell
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for generating real-time data from static files
- Patent number 6,556,882
- Issue date Apr 29, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
System for brokering fault detection data
- Publication number 20030171885
- Publication date Sep 11, 2003
- Elfido Coss
- G05 - CONTROLLING REGULATING

Michael R. Conboy

Person

Patents Grantslast 30 patents

System for brokering fault detection data

Fault notification based on a severity level

Mask identification database server

Method of dynamically designing a preventative maintenance schedule...

Automated material handling system for a manufacturing facility div...

Routing workpieces based upon detecting a fault

Management of multiple types of empty carriers in automated materia...

Management of move requests from a factory system to an automated m...

Method and apparatus for performing fault detection using data from...

Scheduling method for automated work-cell transfer system

Method and apparatus for controlling a multi-chamber processing tool

Reticle sorter

Method for requesting trace data reports from FDC semiconductor fab...

Determining a possible cause of a fault in a semiconductor fabricat...

Method of dynamically enabling additional sensors based upon initia...

Predictive processing method in a semiconductor processing facility

Method and apparatus for proactive dispatch system to improve line...

Operating a processing tool in a degraded mode upon detecting a fault

Integration of business rule parameters in priority setting of wafe...

Wafer rotation in wafer handling devices

Method and apparatus for determining wafer identity and orientation

Wafer rotation randomization in cluster tool processing

Management of move requests from a factory system to an automated m...

Method for determining, tracking and/or controlling processing base...

Wafer-less qualification of a processing tool

Wafer rotation randomization for process defect detection in semico...

Wafer rotation in semiconductor processing

Method and apparatus for using latency time as a run-to-run control...

Method and apparatus for monitoring consumable performance

Method and apparatus for generating real-time data from static files

Patents Applicationslast 30 patents

System for brokering fault detection data