Michael Reeve

Person

London, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Dosage monitoring based on signal presence
- Patent number 10,759,591
- Issue date Sep 1, 2020
- OES, Inc.
- Kiet Ngo
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Wire processing machine including a conductor monitor device
- Patent number 9,945,892
- Issue date Apr 17, 2018
- OES, Inc.
- Kiet Ngo
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Conductor monitor device and method
- Patent number 9,880,213
- Issue date Jan 30, 2018
- OES, Inc.
- Kiet Ngo
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Quality analysis of tube bending processes including mandrel fault...
- Patent number 7,765,841
- Issue date Aug 3, 2010
- OES, Inc.
- Paul Hogendoorn
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Sensor device with a radiation directing surface
- Patent number 7,719,695
- Issue date May 18, 2010
- OES, Inc.
- Klet Ngo
- G01 - MEASURING TESTING
Information Patent Grant
Piezoelectric polymer sensor device
- Patent number 7,603,909
- Issue date Oct 20, 2009
- OES, Inc.
- Kiet Ngo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Quality analysis including cumulative deviation determination
- Patent number 7,333,906
- Issue date Feb 19, 2008
- OES, Inc.
- Michael Reeve
- G05 - CONTROLLING REGULATING
Information Patent Grant
Strain monitoring for part quality analysis
- Patent number 7,216,519
- Issue date May 15, 2007
- OES, Inc.
- Kiet Ngo
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...

Patents Applicationslast 30 patents

Information Patent Application
DOSAGE MONITORING BASED ON SIGNAL PRESENCE
- Publication number 20190352082
- Publication date Nov 21, 2019
- OES Inc.
- Kiet Ngo
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
WIRE PROCESSING MACHINE INCLUDING A CONDUCTOR MONITOR DEVICE
- Publication number 20150185269
- Publication date Jul 2, 2015
- OES, INC.
- Kiet Ngo
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTOR MONITOR DEVICE AND METHOD
- Publication number 20150048842
- Publication date Feb 19, 2015
- OES, INC.
- Kiet NGO
- G01 - MEASURING TESTING
Information Patent Application
PIEZOELECTRIC POLYMER SENSOR DEVICE
- Publication number 20080078255
- Publication date Apr 3, 2008
- Kiet Ngo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
QUALITY ANALYSIS OF TUBE BENDING PROCESSES INCLUDING MANDREL FAULT...
- Publication number 20070186603
- Publication date Aug 16, 2007
- Paul Hogendoorn
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
Sensor device with a radiation directing surface
- Publication number 20060227339
- Publication date Oct 12, 2006
- Klet Ngo
- G01 - MEASURING TESTING
Information Patent Application
Quality analysis including cumulative deviation determination
- Publication number 20060047453
- Publication date Mar 2, 2006
- Michael Reeve
- G05 - CONTROLLING REGULATING

Michael Reeve

Person

Patents Grantslast 30 patents

Dosage monitoring based on signal presence

Wire processing machine including a conductor monitor device

Conductor monitor device and method

Quality analysis of tube bending processes including mandrel fault...

Sensor device with a radiation directing surface

Piezoelectric polymer sensor device

Quality analysis including cumulative deviation determination

Strain monitoring for part quality analysis

Patents Applicationslast 30 patents

DOSAGE MONITORING BASED ON SIGNAL PRESENCE

WIRE PROCESSING MACHINE INCLUDING A CONDUCTOR MONITOR DEVICE

CONDUCTOR MONITOR DEVICE AND METHOD

PIEZOELECTRIC POLYMER SENSOR DEVICE

QUALITY ANALYSIS OF TUBE BENDING PROCESSES INCLUDING MANDREL FAULT...

Sensor device with a radiation directing surface

Quality analysis including cumulative deviation determination