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Michael V. Williamson
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San Jose, CA, US
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last 30 patents
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Patent Grant
Identifying yield-relevant process parameters in integrated circuit...
Patent number
7,494,893
Issue date
Feb 24, 2009
PDF Solutions, Inc.
Anand Inani
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
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last 30 patents
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Monitoring and control of integrated circuit device fabrication pro...
Publication number
20080312875
Publication date
Dec 18, 2008
Guanyuan M. Yu
G05 - CONTROLLING REGULATING