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Michael W. Cresswell
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Gaithersburg, MD, US
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last 30 patents
Information
Patent Grant
Target configuration and method for extraction of overlay vectors f...
Patent number
6,146,910
Issue date
Nov 14, 2000
The United States of America, as represented by the Secretary of Commerce
Michael W. Cresswell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Overlay target and measurement procedure to enable self-correction...
Patent number
5,923,041
Issue date
Jul 13, 1999
Michael William Cresswell
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Monocrystalline test and reference structures, and use for calibrat...
Patent number
5,920,067
Issue date
Jul 6, 1999
The United States of America as represented by the Secretary of Commerce
Michael W. Cresswell
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Electrical test structure and method for measuring the relative loc...
Patent number
5,857,258
Issue date
Jan 12, 1999
The United States of America as represented by the Secretary of Commerce
William B. Penzes
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Overlay target and measurement procedure to enable self-correction...
Patent number
5,841,144
Issue date
Nov 24, 1998
The United States of America as represented by the Secretary of Commerce
Michael William Cresswell
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Methods and test structures for measuring overlay in multilayer dev...
Patent number
5,699,282
Issue date
Dec 16, 1997
The United States of America as represented by the Secretary of Commerce
Richard A. Allen
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Monocrystalline test structures, and use for calibrating instruments
Patent number
5,684,301
Issue date
Nov 4, 1997
The United States of America as represented by the Secretary of Commerce
Michael W. Cresswell
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and reference standards for measuring overlay in multilayer...
Patent number
5,617,340
Issue date
Apr 1, 1997
The United States of America as represented by the Secretary of Commerce
Michael W. Cresswell
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Electrical test structure and method for measuring the relative loc...
Patent number
5,602,492
Issue date
Feb 11, 1997
The United States of America as represented by the Secretary of Commerce
Michael W. Cresswell
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Monolithic microwave integrated circuit on high resistivity silicon
Patent number
5,449,953
Issue date
Sep 12, 1995
Westinghouse Electric Corporation
Harvey C. Nathanson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrical test structure and method for measuring the relative loc...
Patent number
5,383,136
Issue date
Jan 17, 1995
The United States of America as represented by the Secretary of Commerce
Michael Cresswell
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of and articles for accurately determining relative position...
Patent number
5,373,232
Issue date
Dec 13, 1994
The United States of America as represented by the Secretary of Commerce
Michael W. Cresswell
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Linewidth micro-bridge test structure
Patent number
5,247,262
Issue date
Sep 21, 1993
The United States of America as represented by the Secretary of Commerce
Michael Cresswell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for sampling the sizes, geometrical distribution, and freque...
Patent number
5,218,211
Issue date
Jun 8, 1993
The United States of America as represented by the Secretary of Commerce
Michael W. Cresswell
G01 - MEASURING TESTING
Information
Patent Grant
Thin film electroluminescent edge emitter structure on a silicon su...
Patent number
5,043,631
Issue date
Aug 27, 1991
Westinghouse Electric Corp.
Zoltan K. Kun
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Thin film electroluminescent edge emitter structure on a silcon sub...
Patent number
5,004,956
Issue date
Apr 2, 1991
Westinghouse Electric Corp.
Zoltan K. Kun
B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information
Patent Grant
Mitered mechanical switches
Patent number
4,904,831
Issue date
Feb 27, 1990
Westinghouse Electric Corp.
Harvey C. Nathanson
G01 - MEASURING TESTING
Information
Patent Grant
Process for producing vias in semiconductor
Patent number
4,894,114
Issue date
Jan 16, 1990
Westinghouse Electric Corp.
Harvey C. Nathanson
G01 - MEASURING TESTING
Information
Patent Grant
Transmit-receive means for phased-array active antenna system using...
Patent number
4,823,136
Issue date
Apr 18, 1989
Westinghouse Electric Corp.
Harvey C. Nathanson
G01 - MEASURING TESTING
Information
Patent Grant
Dynamic isolation of conductivity modulation states in integrated c...
Patent number
4,224,083
Issue date
Sep 23, 1980
Westinghouse Electric Corp.
Michael W. Cresswell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light activated switch system having high di/dt capability
Patent number
4,204,116
Issue date
May 20, 1980
Westinghouse Electric Corp.
Michael W. Cresswell
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Method of fabricating apertured deposition masks used for fabricati...
Patent number
4,086,127
Issue date
Apr 25, 1978
Westinghouse Electric Corporation
Michael W. Cresswell
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Low forward voltage drop thyristor
Patent number
4,043,837
Issue date
Aug 23, 1977
Westinghouse Electric Corporation
Michael W. Cresswell
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low forward voltage drop thyristor
Patent number
3,990,091
Issue date
Nov 2, 1976
Westinghouse Electric Corporation
Michael W. Cresswell
H01 - BASIC ELECTRIC ELEMENTS