Michihiko NISHIGAKI

Person

Kawasaki Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Monitoring device and monitoring system
- Patent number 11,841,312
- Issue date Dec 12, 2023
- CYTORONIX INC.
- Kaita Imai
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring device and monitoring system
- Patent number 11,592,385
- Issue date Feb 28, 2023
- CYTORONIX INC.
- Kaita Imai
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring device and monitoring system
- Patent number 11,561,163
- Issue date Jan 24, 2023
- CYTORONIX INC.
- Kaita Imai
- G01 - MEASURING TESTING
Information Patent Grant
Cell sorter
- Patent number 10,646,899
- Issue date May 12, 2020
- Kabushiki Kaisha Toshiba
- Kaita Imai
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Particle inspection system and driving method employed therein
- Patent number 10,533,934
- Issue date Jan 14, 2020
- Kabushiki Kaisha Toshiba
- Michihiko Nishigaki
- G01 - MEASURING TESTING
Information Patent Grant
Pattern forming method, semiconductor device, and manufacturing met...
- Patent number 10,379,440
- Issue date Aug 13, 2019
- Kabushiki Kashia Toshiba
- Michihiko Nishigaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Sample liquid measuring device and measuring method
- Patent number 10,337,994
- Issue date Jul 2, 2019
- Kabushiki Kaisha Toshiba
- Kaita Imai
- G01 - MEASURING TESTING
Information Patent Grant
Microanalysis chip
- Patent number 10,337,976
- Issue date Jul 2, 2019
- Kabushiki Kaisha Toshiba
- Michihiko Nishigaki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Semiconductor micro-analysis chip and method of manufacturing the same
- Patent number 10,281,429
- Issue date May 7, 2019
- Kabushiki Kaisha Toshiba
- Kentaro Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensor
- Patent number 10,126,168
- Issue date Nov 13, 2018
- Kabushiki Kaisha Toshiba
- Yosuke Akimoto
- G01 - MEASURING TESTING
Information Patent Grant
Analysis package for detecting particles in a sample liquid
- Patent number 9,895,691
- Issue date Feb 20, 2018
- Kabushiki Kaisha Toshiba
- Hiroshi Hamasaki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis package for detecting particles in a sample liquid includi...
- Patent number 9,885,680
- Issue date Feb 6, 2018
- Kabushiki Kaisha Toshiba
- Hiroshi Hamasaki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Analysis package for detecting particles in a sample liquid, and in...
- Patent number 9,770,714
- Issue date Sep 26, 2017
- Kabushiki Kaisha Toshiba
- Hiroshi Hamasaki
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Acceleration sensor
- Patent number 8,497,672
- Issue date Jul 30, 2013
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- G01 - MEASURING TESTING
Information Patent Grant
Resonator and oscillator with a tuning fork vibrator in a cut-out p...
- Patent number 8,395,462
- Issue date Mar 12, 2013
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
MEMS variable capacitor having a piezoelectric actuation mechanism...
- Patent number 8,189,319
- Issue date May 29, 2012
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiaxial acceleration sensor and angular velocity sensor
- Patent number 8,117,912
- Issue date Feb 21, 2012
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- G01 - MEASURING TESTING
Information Patent Grant
Inertia sensor
- Patent number 8,109,144
- Issue date Feb 7, 2012
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- G01 - MEASURING TESTING
Information Patent Grant
Piezoelectric-driven MEMS element
- Patent number 8,102,098
- Issue date Jan 24, 2012
- Kabushiki Kaisha Toshiba
- Michihiko Nishigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Piezoelectric-driven MEMS device and method for manufacturing the same
- Patent number 8,038,890
- Issue date Oct 18, 2011
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Actuator
- Patent number 8,022,599
- Issue date Sep 20, 2011
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS apparatus and method of manufacturing the same
- Patent number 7,906,823
- Issue date Mar 15, 2011
- Kabushiki Kaisha Toshiba
- Kazuhiro Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Infrared-detecting element and infrared image sensor using the same
- Patent number 7,847,252
- Issue date Dec 7, 2010
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- G01 - MEASURING TESTING
Information Patent Grant
Surface emitting type optical semiconductor device
- Patent number 7,830,937
- Issue date Nov 9, 2010
- Kabushiki Kaisha Toshiba
- Mitsuhiro Kushibe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Actuator and electronic hardware using the same
- Patent number 7,830,068
- Issue date Nov 9, 2010
- Kabushiki Kaisha Toshiba
- Michihiko Nishigaki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Piezoelectric driven MEMS apparatus and portable terminal
- Patent number 7,816,841
- Issue date Oct 19, 2010
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digital signal demodulator and wireless receiver using the same
- Patent number 7,796,710
- Issue date Sep 14, 2010
- Kabushiki Kaisha Toshiba
- Kazuhide Abe
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Antenna sharing device and portable telephone
- Patent number 7,777,592
- Issue date Aug 17, 2010
- Kabushiki Kaisha Toshiba
- Michihiko Nishigaki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Piezoelectric thin film device and method for manufacturing the same
- Patent number 7,770,274
- Issue date Aug 10, 2010
- Kabushiki Kaisha Toshiba
- Kenya Sano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
MEMS device with low operation voltage, large contact pressure forc...
- Patent number 7,772,745
- Issue date Aug 10, 2010
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
MONITORING DEVICE AND MONITORING SYSTEM
- Publication number 20230118112
- Publication date Apr 20, 2023
- Cytoronix Inc.
- Kaita IMAI
- G01 - MEASURING TESTING
Information Patent Application
MONITORING DEVICE AND MONITORING SYSTEM
- Publication number 20200408663
- Publication date Dec 31, 2020
- Kabushiki Kaisha Toshiba
- Kaita IMAI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING MICROCHANNEL
- Publication number 20190283284
- Publication date Sep 19, 2019
- Kabushiki Kaisha Toshiba
- Michihiko NISHIGAKI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CELL SORTER
- Publication number 20190084011
- Publication date Mar 21, 2019
- KABUSHIKI KAISHA TOSHIBA
- Kaita IMAI
- B03 - SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES O...
Information Patent Application
PATTERN FORMING METHOD, SEMICONDUCTOR DEVICE, AND MANUFACTURING MET...
- Publication number 20180217500
- Publication date Aug 2, 2018
- Kabushiki Kaisha Toshiba
- Michihiko NISHIGAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE LIQUID MEASURING DEVICE AND MEASURING METHOD
- Publication number 20180080871
- Publication date Mar 22, 2018
- Kabushiki Kaisha Toshiba
- Kaita Imai
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE INSPECTION SYSTEM AND DRIVING METHOD EMPLOYED THEREIN
- Publication number 20170122859
- Publication date May 4, 2017
- Kabushiki Kaisha Toshiba
- Michihiko NISHIGAKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME
- Publication number 20170122905
- Publication date May 4, 2017
- Kabushiki Kaisha Toshiba
- Kentaro KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE INSPECTION UNIT AND PARTICLE INSPECTION SYSTEM
- Publication number 20160320286
- Publication date Nov 3, 2016
- Kabushiki Kaisha Toshiba
- Hiroko MIKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS PACKAGE
- Publication number 20160231265
- Publication date Aug 11, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi HAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS PACKAGE
- Publication number 20160231262
- Publication date Aug 11, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi HAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS PACKAGE
- Publication number 20160231263
- Publication date Aug 11, 2016
- Kabushiki Kaisha Toshiba
- Hiroshi HAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
MICROANALYSIS CHIP
- Publication number 20160153935
- Publication date Jun 2, 2016
- Kabushiki Kaisha Toshiba
- Michihiko NISHIGAKI
- G01 - MEASURING TESTING
Information Patent Application
PLASTIC FIBER RIBBON AND COVER REMOVAL METHOD THEREOF
- Publication number 20140023332
- Publication date Jan 23, 2014
- Kabushiki Kaisha Toshiba
- Michihiko NISHIGAKI
- G02 - OPTICS
Information Patent Application
OPTICAL MODULE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20130064511
- Publication date Mar 14, 2013
- Michihiko NISHIGAKI
- G02 - OPTICS
Information Patent Application
OPTICALLY-COUPLED DEVICE AND METHOD OF FIXING THE SAME
- Publication number 20120275742
- Publication date Nov 1, 2012
- Michihiko NISHIGAKI
- G02 - OPTICS
Information Patent Application
OPTICAL COUPLING ELEMENT AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120243835
- Publication date Sep 27, 2012
- Michihiko NISHIGAKI
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
RESONATOR AND OSCILLATOR
- Publication number 20120206018
- Publication date Aug 16, 2012
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ACCELERATION SENSOR
- Publication number 20110234206
- Publication date Sep 29, 2011
- Kabushiki Kaisha Toshiba
- Takashi KAWAKUBO
- G01 - MEASURING TESTING
Information Patent Application
PIEZOELECTRIC-DRIVEN MEMS ELEMENT
- Publication number 20100244628
- Publication date Sep 30, 2010
- Kabushiki Kaisha Toshiba
- Michihiko Nishigaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INERTIA SENSOR
- Publication number 20100077858
- Publication date Apr 1, 2010
- Takashi KAWAKUBO
- G01 - MEASURING TESTING
Information Patent Application
MULTIAXIAL ACCELERATION SENSOR AND ANGULAR VELOCITY SENSOR
- Publication number 20100064804
- Publication date Mar 18, 2010
- Takashi Kawakubo
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL SENSOR AND INERTIAL DETECTING DEVICE
- Publication number 20090322183
- Publication date Dec 31, 2009
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- G01 - MEASURING TESTING
Information Patent Application
MEMS VARIABLE CAPACITOR
- Publication number 20090296308
- Publication date Dec 3, 2009
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACTUATOR
- Publication number 20090206702
- Publication date Aug 20, 2009
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INFRARED-DETECTING ELEMENT AND INFRARED IMAGE SENSOR USING THE SAME
- Publication number 20090200471
- Publication date Aug 13, 2009
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- G01 - MEASURING TESTING
Information Patent Application
ACTUATOR AND ELECTRONIC HARDWARE USING THE SAME
- Publication number 20090189487
- Publication date Jul 30, 2009
- Kabushiki Kaisha Toshiba
- Michihiko Nishigaki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
ACTUATOR AND ELECTRONIC CIRCUIT BASED THEREON
- Publication number 20090135541
- Publication date May 28, 2009
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PIEZOELECTRIC DRIVEN MEMS APPARATUS AND PORTABLE TERMINAL
- Publication number 20090051251
- Publication date Feb 26, 2009
- Kabushiki Kaisha Toshiba
- Takashi Kawakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMS APPARATUS AND METHOD OF MANUFACTURING THE SAME
- Publication number 20090050988
- Publication date Feb 26, 2009
- Kabushiki Kaisha Toshiba
- Kazuhiro Suzuki
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Michihiko NISHIGAKI

Person

Patents Grantslast 30 patents

Monitoring device and monitoring system

Monitoring device and monitoring system

Monitoring device and monitoring system

Cell sorter

Particle inspection system and driving method employed therein

Pattern forming method, semiconductor device, and manufacturing met...

Sample liquid measuring device and measuring method

Microanalysis chip

Semiconductor micro-analysis chip and method of manufacturing the same

Optical sensor

Analysis package for detecting particles in a sample liquid

Analysis package for detecting particles in a sample liquid includi...

Analysis package for detecting particles in a sample liquid, and in...

Acceleration sensor

Resonator and oscillator with a tuning fork vibrator in a cut-out p...

MEMS variable capacitor having a piezoelectric actuation mechanism...

Multiaxial acceleration sensor and angular velocity sensor

Inertia sensor

Piezoelectric-driven MEMS element

Piezoelectric-driven MEMS device and method for manufacturing the same

Actuator

MEMS apparatus and method of manufacturing the same

Infrared-detecting element and infrared image sensor using the same

Surface emitting type optical semiconductor device

Actuator and electronic hardware using the same

Piezoelectric driven MEMS apparatus and portable terminal

Digital signal demodulator and wireless receiver using the same

Antenna sharing device and portable telephone

Piezoelectric thin film device and method for manufacturing the same

MEMS device with low operation voltage, large contact pressure forc...

Patents Applicationslast 30 patents

MONITORING DEVICE AND MONITORING SYSTEM

MONITORING DEVICE AND MONITORING SYSTEM

METHOD OF MANUFACTURING MICROCHANNEL

CELL SORTER

PATTERN FORMING METHOD, SEMICONDUCTOR DEVICE, AND MANUFACTURING MET...

SAMPLE LIQUID MEASURING DEVICE AND MEASURING METHOD

PARTICLE INSPECTION SYSTEM AND DRIVING METHOD EMPLOYED THEREIN

SEMICONDUCTOR MICRO-ANALYSIS CHIP AND METHOD OF MANUFACTURING THE SAME

PARTICLE INSPECTION UNIT AND PARTICLE INSPECTION SYSTEM

ANALYSIS PACKAGE

ANALYSIS PACKAGE

ANALYSIS PACKAGE

MICROANALYSIS CHIP

PLASTIC FIBER RIBBON AND COVER REMOVAL METHOD THEREOF

OPTICAL MODULE AND METHOD OF MANUFACTURING THE SAME

OPTICALLY-COUPLED DEVICE AND METHOD OF FIXING THE SAME

OPTICAL COUPLING ELEMENT AND METHOD OF MANUFACTURING THE SAME

RESONATOR AND OSCILLATOR

ACCELERATION SENSOR

PIEZOELECTRIC-DRIVEN MEMS ELEMENT

INERTIA SENSOR

MULTIAXIAL ACCELERATION SENSOR AND ANGULAR VELOCITY SENSOR

INERTIAL SENSOR AND INERTIAL DETECTING DEVICE

MEMS VARIABLE CAPACITOR

ACTUATOR

INFRARED-DETECTING ELEMENT AND INFRARED IMAGE SENSOR USING THE SAME

ACTUATOR AND ELECTRONIC HARDWARE USING THE SAME

ACTUATOR AND ELECTRONIC CIRCUIT BASED THEREON

PIEZOELECTRIC DRIVEN MEMS APPARATUS AND PORTABLE TERMINAL

MEMS APPARATUS AND METHOD OF MANUFACTURING THE SAME