Mike Berkmyre

Person

Allen, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Optical nanoprobing of integrated circuits
- Patent number 10,175,295
- Issue date Jan 8, 2019
- FEI Company
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Probe-based data collection system with adaptive mode of probing co...
- Patent number 9,891,280
- Issue date Feb 13, 2018
- FEI EFA, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-contact microscopy for three-dimensional...
- Patent number 9,506,947
- Issue date Nov 29, 2016
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
Probe-based data collection system with adaptive mode of probing
- Patent number 9,057,740
- Issue date Jun 16, 2015
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Grant
System and method for non-contact microscopy for three-dimensional...
- Patent number 8,895,923
- Issue date Nov 25, 2014
- DCG Systems, Inc.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM
- Publication number 20230168274
- Publication date Jun 1, 2023
- Innovatum Instruments Inc.
- Richard E Stallcup
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...
- Publication number 20170082685
- Publication date Mar 23, 2017
- DCG SYSTEMS, INC.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL NANOPROBING OF INTEGRATED CIRCUITS
- Publication number 20160377675
- Publication date Dec 29, 2016
- FEI Company
- Vladimir A. Ukraintsev
- B82 - NANO-TECHNOLOGY
Information Patent Application
Particle Beam Heating to Identify Defects
- Publication number 20160370425
- Publication date Dec 22, 2016
- DCG SYSTEMS, INC.
- Richard Stallcup
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...
- Publication number 20150301078
- Publication date Oct 22, 2015
- DCG SYSTEMS, INC.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING
- Publication number 20150168444
- Publication date Jun 18, 2015
- DCG SYSTEMS, INC.
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...
- Publication number 20140380531
- Publication date Dec 25, 2014
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...
- Publication number 20140143912
- Publication date May 22, 2014
- Vladimir A. Ukraintsev
- G01 - MEASURING TESTING

Mike Berkmyre

Person

Patents Grantslast 30 patents

Optical nanoprobing of integrated circuits

Probe-based data collection system with adaptive mode of probing co...

System and method for non-contact microscopy for three-dimensional...

Probe-based data collection system with adaptive mode of probing

System and method for non-contact microscopy for three-dimensional...

Patents Applicationslast 30 patents

PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM

PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...

OPTICAL NANOPROBING OF INTEGRATED CIRCUITS

Particle Beam Heating to Identify Defects

SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...

PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING

PROBE-BASED DATA COLLECTION SYSTEM WITH ADAPTIVE MODE OF PROBING CO...

SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL...