Miki TOSHIMA

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Alignment apparatus and method of manufacturing semiconductor device
- Patent number 11,387,131
- Issue date Jul 12, 2022
- Kioxia Corporation
- Miki Toshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Quality control method of position measurement light source, semico...
- Patent number 11,031,306
- Issue date Jun 8, 2021
- TOSHIBA MEMORY CORPORATION
- Miki Toshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Position measuring method, position measuring apparatus, and semico...
- Patent number 10,599,056
- Issue date Mar 24, 2020
- TOSHIBA MEMORY CORPORATION
- Miki Toshima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Substrate measurement system, method of measuring substrate, and co...
- Patent number 10,295,409
- Issue date May 21, 2019
- TOSHIBA MEMORY CORPORATION
- Miki Toshima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
- Publication number 20240321819
- Publication date Sep 26, 2024
- KIOXIA Corporation
- Miki TOSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20240297145
- Publication date Sep 5, 2024
- KIOXIA Corporation
- Miki TOSHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STORAGE DEVICE AND METHOD FOR MANUFACTURING SEMICONDU...
- Publication number 20240292619
- Publication date Aug 29, 2024
- Kioxia Corporation
- Yasuaki NAKATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20210043488
- Publication date Feb 11, 2021
- Kioxia Corporation
- Miki TOSHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION MEASURING METHOD, POSITION MEASURING APPARATUS, AND SEMICO...
- Publication number 20200081357
- Publication date Mar 12, 2020
- Toshiba Memory Corporation
- Miki Toshima
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
QUALITY CONTROL METHOD OF POSITION MEASUREMENT LIGHT SOURCE, SEMICO...
- Publication number 20190295902
- Publication date Sep 26, 2019
- Toshiba Memory Corporation
- Miki Toshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE MEASUREMENT SYSTEM, METHOD OF MEASURING SUBSTRATE, AND CO...
- Publication number 20170235232
- Publication date Aug 17, 2017
- KABUSHIKI KAISHA TOSHIBA
- Miki TOSHIMA
- G01 - MEASURING TESTING

Miki TOSHIMA

Person

Patents Grantslast 30 patents

Alignment apparatus and method of manufacturing semiconductor device

Quality control method of position measurement light source, semico...

Position measuring method, position measuring apparatus, and semico...

Substrate measurement system, method of measuring substrate, and co...

Patents Applicationslast 30 patents

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR STORAGE DEVICE AND METHOD FOR MANUFACTURING SEMICONDU...

ALIGNMENT APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

POSITION MEASURING METHOD, POSITION MEASURING APPARATUS, AND SEMICO...

QUALITY CONTROL METHOD OF POSITION MEASUREMENT LIGHT SOURCE, SEMICO...

SUBSTRATE MEASUREMENT SYSTEM, METHOD OF MEASURING SUBSTRATE, AND CO...