Min-Su Fung

Person

Lagrangeville, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Non-contact mobile charge measurement with leakage band-bending and...
- Patent number 7,230,443
- Issue date Jun 12, 2007
- KLA-Tencor Corporation
- Min-Su Fung
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact mobile charge measurement with leakage band-bending and...
- Patent number 6,937,050
- Issue date Aug 30, 2005
- Min-Su Fung
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact mobile charge measurement with leakage band-bending and...
- Patent number 6,771,092
- Issue date Aug 3, 2004
- Min-Su Fung
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact mobile charge measurement with leakage band-bending and...
- Patent number 6,522,158
- Issue date Feb 18, 2003
- Keithley Instruments, Inc.
- Min-Su Fung
- G01 - MEASURING TESTING
Information Patent Grant
Mobile charge immune process
- Patent number 6,136,669
- Issue date Oct 24, 2000
- International Business Machines Corporation
- Frederick Albert Flitsch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photovoltaic oxide charge measurement probe technique
- Patent number 5,650,731
- Issue date Jul 22, 1997
- International Business Machines Corporation
- Min-Su Fung
- G01 - MEASURING TESTING
Information Patent Grant
Contactless corona-oxide-semiconductor Q-V mobile charge measuremen...
- Patent number 5,498,974
- Issue date Mar 12, 1996
- International Business Machines Corporation
- Roger L. Verkuil
- G01 - MEASURING TESTING
Information Patent Grant
Contactless technique for semicondutor wafer testing
- Patent number 4,812,756
- Issue date Mar 14, 1989
- International Business Machines Corporation
- Huntington W. Curtis
- G01 - MEASURING TESTING

Min-Su Fung

Person

Patents Grantslast 30 patents

Non-contact mobile charge measurement with leakage band-bending and...

Non-contact mobile charge measurement with leakage band-bending and...

Non-contact mobile charge measurement with leakage band-bending and...

Non-contact mobile charge measurement with leakage band-bending and...

Mobile charge immune process

Photovoltaic oxide charge measurement probe technique

Contactless corona-oxide-semiconductor Q-V mobile charge measuremen...

Contactless technique for semicondutor wafer testing