Mineo Nomoto

Person

Fujisawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring displacement of a sample using a...
- Patent number 8,659,761
- Issue date Feb 25, 2014
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measurement method and apparatus thereof, stage appara...
- Patent number 8,629,985
- Issue date Jan 14, 2014
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Displacement measurement method and apparatus thereof, stage appara...
- Patent number 8,284,406
- Issue date Oct 9, 2012
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring displacement of a sample to be i...
- Patent number 8,064,066
- Issue date Nov 22, 2011
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing display device
- Patent number 7,834,353
- Issue date Nov 16, 2010
- Hitachi Displays, Ltd.
- Mikio Hongo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for measuring displacement of a sample
- Patent number 7,612,889
- Issue date Nov 3, 2009
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 7,498,589
- Issue date Mar 3, 2009
- Hitachi Kenki Fine Tech Co., Ltd.
- Shigenobu Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring shape of bumps
- Patent number 7,336,816
- Issue date Feb 26, 2008
- Hitachi Via Mechanics, Ltd.
- Hideaki Sasazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing display device
- Patent number 7,326,623
- Issue date Feb 5, 2008
- Hitachi, Ltd.
- Mikio Hongo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for non-destructive inspection, apparatus thereof and digita...
- Patent number 7,272,253
- Issue date Sep 18, 2007
- Hitachi, Ltd.
- Daisuke Katsuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nondestructive inspection method and apparatus
- Patent number 7,215,807
- Issue date May 8, 2007
- Hitachi, Ltd.
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display device, process of fabricating same, and apparatus for fabr...
- Patent number 7,129,124
- Issue date Oct 31, 2006
- Hitachi Displays, Ltd.
- Mikio Hongo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring thickness of thin film and devic...
- Patent number 7,119,908
- Issue date Oct 10, 2006
- Hitachi, Ltd.
- Mineo Nomoto
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for measuring thickness of thin film and devic...
- Patent number 7,057,744
- Issue date Jun 6, 2006
- Hitachi, Ltd.
- Mineo Nomoto
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing pad surface condition evaluation method and an apparatus...
- Patent number 7,020,306
- Issue date Mar 28, 2006
- Hitachi, Ltd.
- Takenori Hirose
- B24 - GRINDING POLISHING
Information Patent Grant
Method and apparatus for managing surface image of thin film device...
- Patent number 6,987,874
- Issue date Jan 17, 2006
- Hitachi, Ltd.
- Takenori Hirose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nondestructive inspection method and apparatus
- Patent number 6,950,545
- Issue date Sep 27, 2005
- Hitachi, Ltd.
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Laser annealing apparatus, TFT device and annealing method of the same
- Patent number 6,943,086
- Issue date Sep 13, 2005
- Hitachi, Ltd.
- Mikio Hongo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of detecting and measuring endpoint of polishing processing...
- Patent number 6,897,079
- Issue date May 24, 2005
- Hitachi, Ltd.
- Takenori Hirose
- B24 - GRINDING POLISHING
Information Patent Grant
Method of polishing a film
- Patent number 6,794,206
- Issue date Sep 21, 2004
- Hitachi, Ltd.
- Takenori Hirose
- B24 - GRINDING POLISHING
Information Patent Grant
Method and device of inspecting three-dimensional shape defect
- Patent number 6,072,899
- Issue date Jun 6, 2000
- Hitachi, Ltd.
- Yoko Irie
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspecting defects of surface shape
- Patent number 5,973,777
- Issue date Oct 26, 1999
- Hitachi, Ltd.
- Mineo Nomoto
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measuring method using thermal expansion and an apparat...
- Patent number 5,645,351
- Issue date Jul 8, 1997
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Method for pattern inspection and apparatus therefor
- Patent number 5,301,248
- Issue date Apr 5, 1994
- Hitachi, Ltd.
- Ninomiya Takanori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting filled state of via-holes filled with fillers...
- Patent number 5,015,097
- Issue date May 14, 1991
- Hitachi, Ltd.
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray tomographic imaging system and method
- Patent number 4,872,187
- Issue date Oct 3, 1989
- Hitachi, Ltd.
- Kozo Nakahata
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method
- Patent number 4,776,023
- Issue date Oct 4, 1988
- Hitachi, Ltd.
- Toshimitsu Hamada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern test apparatus including a plurality of pattern generators
- Patent number 4,744,047
- Issue date May 10, 1988
- Hitachi, Ltd.
- Keiichi Okamoto
- G01 - MEASURING TESTING
Information Patent Grant
Pattern checking apparatus
- Patent number 4,628,531
- Issue date Dec 9, 1986
- Hitachi, Ltd.
- Keiichi Okamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Projecting apparatus
- Patent number 4,420,233
- Issue date Dec 13, 1983
- Hitachi, Ltd.
- Mineo Nomoto
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Displacement Measurement Method and Apparatus Thereof, Stage Appara...
- Publication number 20120327429
- Publication date Dec 27, 2012
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE TO BE I...
- Publication number 20120062903
- Publication date Mar 15, 2012
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE
- Publication number 20100039652
- Publication date Feb 18, 2010
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
Displacement Measurement Method and Apparatus Thereof, Stage Appara...
- Publication number 20090210971
- Publication date Aug 20, 2009
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING PLASMA DISPLAY PANEL, AND APPARATUS FOR IN...
- Publication number 20080145517
- Publication date Jun 19, 2008
- Hideaki SASAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING DISPLAY DEVICE
- Publication number 20080121894
- Publication date May 29, 2008
- Mikio Hongo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus for fabricating a display device
- Publication number 20070041410
- Publication date Feb 22, 2007
- Mikio Hongo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for measuring displacement of a sample
- Publication number 20060215171
- Publication date Sep 28, 2006
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
Laser processing machine and laser processing method
- Publication number 20060102608
- Publication date May 18, 2006
- Daisuke Katsuta
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Apparatus and method for determining surface profiles using a scann...
- Publication number 20060097162
- Publication date May 11, 2006
- Shigenobu Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing display device
- Publication number 20060003478
- Publication date Jan 5, 2006
- Mikio Hongo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Nondestructive inspection method and apparatus
- Publication number 20050259861
- Publication date Nov 24, 2005
- Hitachi, Ltd
- Mineo Nomoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for measuring shape of bumps
- Publication number 20050129304
- Publication date Jun 16, 2005
- Hideaki Sasazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for measuring thickness of thin film and devic...
- Publication number 20050117164
- Publication date Jun 2, 2005
- Hitachi, Ltd
- Mineo Nomoto
- B24 - GRINDING POLISHING
Information Patent Application
Method of trading information
- Publication number 20040186740
- Publication date Sep 23, 2004
- Daisuke Katsuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Display device, process of fabricating same, and apparatus for fabr...
- Publication number 20040041158
- Publication date Mar 4, 2004
- Mikio Hongo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Laser annealing apparatus, TFT device and annealing method of the same
- Publication number 20030068836
- Publication date Apr 10, 2003
- Mikio Hongo
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and apparatus for managing surface image of thin film device...
- Publication number 20030059105
- Publication date Mar 27, 2003
- Hitachi, Ltd
- Takenori Hirose
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for measuring thickness of thin film and devic...
- Publication number 20030022400
- Publication date Jan 30, 2003
- Hitachi, Ltd
- Mineo Nomoto
- G01 - MEASURING TESTING
Information Patent Application
Method of polishing a film
- Publication number 20020197871
- Publication date Dec 26, 2002
- Takenori Hirose
- B24 - GRINDING POLISHING
Information Patent Application
Film thickness measuring method and apparatus, and thin film device...
- Publication number 20020163649
- Publication date Nov 7, 2002
- Hitachi, Ltd
- Takenori Hirose
- G01 - MEASURING TESTING
Information Patent Application
Method for non-destructive inspection, apparatus thereof and digita...
- Publication number 20020154811
- Publication date Oct 24, 2002
- Hitachi, Ltd
- Daisuke Katsuta
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting and measuring endpoint of polishing processing...
- Publication number 20020127950
- Publication date Sep 12, 2002
- Takenori Hirose
- B24 - GRINDING POLISHING
Information Patent Application
Polishing pad surface condition evaluation method and an apparatus...
- Publication number 20010015801
- Publication date Aug 23, 2001
- Takenori Hirose
- G01 - MEASURING TESTING

Mineo Nomoto

Person

Patents Grantslast 30 patents

Method and apparatus for measuring displacement of a sample using a...

Displacement measurement method and apparatus thereof, stage appara...

Displacement measurement method and apparatus thereof, stage appara...

Method and apparatus for measuring displacement of a sample to be i...

Method of manufacturing display device

Method and apparatus for measuring displacement of a sample

Scanning probe microscope

Method and apparatus for measuring shape of bumps

Method of manufacturing display device

Method for non-destructive inspection, apparatus thereof and digita...

Nondestructive inspection method and apparatus

Display device, process of fabricating same, and apparatus for fabr...

Method and apparatus for measuring thickness of thin film and devic...

Method and apparatus for measuring thickness of thin film and devic...

Polishing pad surface condition evaluation method and an apparatus...

Method and apparatus for managing surface image of thin film device...

Nondestructive inspection method and apparatus

Laser annealing apparatus, TFT device and annealing method of the same

Method of detecting and measuring endpoint of polishing processing...

Method of polishing a film

Method and device of inspecting three-dimensional shape defect

Method and apparatus for inspecting defects of surface shape

Temperature measuring method using thermal expansion and an apparat...

Method for pattern inspection and apparatus therefor

Method for inspecting filled state of via-holes filled with fillers...

X-ray tomographic imaging system and method

Pattern inspection method

Pattern test apparatus including a plurality of pattern generators

Pattern checking apparatus

Projecting apparatus

Patents Applicationslast 30 patents

Displacement Measurement Method and Apparatus Thereof, Stage Appara...

METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE TO BE I...

METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE

Displacement Measurement Method and Apparatus Thereof, Stage Appara...

METHOD FOR MANUFACTURING PLASMA DISPLAY PANEL, AND APPARATUS FOR IN...

METHOD OF MANUFACTURING DISPLAY DEVICE

Apparatus for fabricating a display device

Method and apparatus for measuring displacement of a sample

Laser processing machine and laser processing method

Apparatus and method for determining surface profiles using a scann...

Method of manufacturing display device

Nondestructive inspection method and apparatus

Method and apparatus for measuring shape of bumps

Method and apparatus for measuring thickness of thin film and devic...

Method of trading information

Display device, process of fabricating same, and apparatus for fabr...

Laser annealing apparatus, TFT device and annealing method of the same

Method and apparatus for managing surface image of thin film device...

Method and apparatus for measuring thickness of thin film and devic...

Method of polishing a film

Film thickness measuring method and apparatus, and thin film device...

Method for non-destructive inspection, apparatus thereof and digita...

Method of detecting and measuring endpoint of polishing processing...

Polishing pad surface condition evaluation method and an apparatus...