Ming Chen

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Mission Viejo, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Capacitance modification without affecting die area
- Patent number 8,627,259
- Issue date Jan 7, 2014
- Broadcom Corporation
- Peter Huang
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Adjusting capacitance of capacitors without affecting die area
- Patent number 8,627,258
- Issue date Jan 7, 2014
- Broadcom Corporation
- Peter Huang
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for adjusting capacitance of capacitors without affecting di...
- Patent number 8,255,858
- Issue date Aug 28, 2012
- Broadcom Corporation
- Peter Huang
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
System and method to screen defect related reliability failures in...
- Patent number 6,950,355
- Issue date Sep 27, 2005
- Broadcom Corporation
- Surya Battacharya
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Capacitance modification without affecting die area
- Publication number 20120329179
- Publication date Dec 27, 2012
- Broadcom Corporation
- Peter Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Adjusting Capacitance of Capacitors without Affecting Die Area
- Publication number 20120315711
- Publication date Dec 13, 2012
- Broadcom Corporation
- Peter Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for adjusting capacitance of capacitors without affecting di...
- Publication number 20100125989
- Publication date May 27, 2010
- BROADCOM CORPORATION
- Peter Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit having a thin passivation layer that facilitates...
- Publication number 20080308901
- Publication date Dec 18, 2008
- BROADCOM CORPORATION
- Tzu-Hsin Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method to screen defect related reliability failures in...
- Publication number 20030036231
- Publication date Feb 20, 2003
- Broadcom Corporation
- Surya Bhattacharya
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for a production testline to monitor CMOS SRAMs
- Publication number 20030034489
- Publication date Feb 20, 2003
- Broadcom Corporation
- Surya Bhattacharya
- H01 - BASIC ELECTRIC ELEMENTS