Minh H. Tong

Person

Raleigh, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic cache activation and deactivation for power reduction
- Patent number 7,266,663
- Issue date Sep 4, 2007
- International Business Machines Corporation
- Jeffery S. Hines
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diffusion resistor/capacitor (DRC) non-aligned MOSFET structure
- Patent number 6,838,323
- Issue date Jan 4, 2005
- International Business Machines Corporation
- Robert J. Gauthier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active well schemes for SOI technology
- Patent number 6,664,150
- Issue date Dec 16, 2003
- International Business Machines Corporation
- William F. Clark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Matched transistors and methods for forming the same
- Patent number 6,552,396
- Issue date Apr 22, 2003
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Asymmetric high voltage silicon on insulator device design for inpu...
- Patent number 6,528,846
- Issue date Mar 4, 2003
- International Business Machines Corporation
- Edward J. Nowak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage high-speed SOI MOSFET
- Patent number 6,512,269
- Issue date Jan 28, 2003
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI pass-gate disturb solution
- Patent number 6,498,058
- Issue date Dec 24, 2002
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for forming decoupling capacitors
- Patent number 6,475,838
- Issue date Nov 5, 2002
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Active well schemes for SOI technology
- Patent number 6,469,350
- Issue date Oct 22, 2002
- International Business Machines Corporation
- William F. Clark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic threshold voltage devices with low gate to substrate resist...
- Patent number 6,459,106
- Issue date Oct 1, 2002
- International Business Machines Corporation
- Andres A. Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact-less probe of semiconductor wafers
- Patent number 6,455,766
- Issue date Sep 24, 2002
- International Business Machines Corporation
- Donald J. Cook
- G01 - MEASURING TESTING
Information Patent Grant
SOI pass gate leakage monitor
- Patent number 6,437,594
- Issue date Aug 20, 2002
- International Business Machines Corporation
- Ronald J. Bolam
- G01 - MEASURING TESTING
Information Patent Grant
Method and structure for creating high density buried contact for u...
- Patent number 6,436,744
- Issue date Aug 20, 2002
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic threshold voltage devices with low gate to substrate resist...
- Patent number 6,429,056
- Issue date Aug 6, 2002
- International Business Machines Corporation
- Andres A. Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low leakage logic gates
- Patent number 6,424,174
- Issue date Jul 23, 2002
- International Business Machines Corporation
- Edward J. Nowak
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Domino logic circuit having multiplicity of gate dielectric thickne...
- Patent number 6,404,236
- Issue date Jun 11, 2002
- International Business Machines Corporation
- Kerry Bernstein
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and system for processing integrated circuits
- Patent number 6,400,171
- Issue date Jun 4, 2002
- International Business Machines Corp.
- Andres Bryant
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming semiconductor device with decoupling capacitance
- Patent number 6,365,484
- Issue date Apr 2, 2002
- International Business Machines Corporation
- Edward Joseph Nowak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scalable high-voltage devices
- Patent number 6,333,230
- Issue date Dec 25, 2001
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Contact-less probe of semiconductor wafers
- Patent number 6,300,785
- Issue date Oct 9, 2001
- International Business Machines Corporation
- Donald J. Cook
- G01 - MEASURING TESTING
Information Patent Grant
Operable floating gate contact for SOI with high Vt well
- Patent number 6,249,028
- Issue date Jun 19, 2001
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device method for enhanced avalanche SOI CMOS
- Patent number 6,249,029
- Issue date Jun 19, 2001
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switched body SOI (silicon on insulator) circuits and fabrication m...
- Patent number 6,239,649
- Issue date May 29, 2001
- International Business Machines Corporation
- Claude Louis Bertin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for monitoring SOI hysterises effects
- Patent number 6,239,591
- Issue date May 29, 2001
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage, high performance FETs
- Patent number 6,200,843
- Issue date Mar 13, 2001
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with decoupling capacitance
- Patent number 6,191,451
- Issue date Feb 20, 2001
- International Business Machines Corporation
- Edward Joseph Nowak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Depleted poly mosfet structure and method
- Patent number 6,171,918
- Issue date Jan 9, 2001
- International Business Machines Corporation
- Jeffrey S. Brown
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reliable diffusion resistor and diffusion capacitor
- Patent number 6,100,153
- Issue date Aug 8, 2000
- International Business Machines Corporation
- Edward J. Nowak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI pass-gate disturb solution
- Patent number 6,100,564
- Issue date Aug 8, 2000
- International Business Machines Corporation
- Andres Bryant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device fabrication method and apparatus using connect...
- Patent number 6,097,068
- Issue date Aug 1, 2000
- International Business Machines Corporation
- Jeffrey Scott Brown
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Automatic cache activation and deactivation for power reduction
- Publication number 20060156048
- Publication date Jul 13, 2006
- International Business Machines Corporation
- Jeffery S. Hines
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Diffusion resistor/capacitor (DRC) non-aligned MOSFET structure
- Publication number 20030102513
- Publication date Jun 5, 2003
- International Business Machines Corporation
- Robert J. Gauthier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Active well schemes for SOI technology
- Publication number 20030080383
- Publication date May 1, 2003
- International Business Machines Corporation
- William F. Clark
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIFFUSION RESISTOR/CAPACITOR (DRC) NON-ALIGNED MOSFET STRUCTURE
- Publication number 20020060343
- Publication date May 23, 2002
- ROBERT J. GAUTHIER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contact-less probe of semiconductor wafers
- Publication number 20020047722
- Publication date Apr 25, 2002
- Donald J. Cook
- G01 - MEASURING TESTING
Information Patent Application
A METHOD AND SYSTEM FOR PROCESSING INTEGRATED CIRCUITS
- Publication number 20020003430
- Publication date Jan 10, 2002
- International Business Machines Corporation
- ANDRES BRYANT
- G01 - MEASURING TESTING
Information Patent Application
Dynamic threshold voltage devices with low gate to substrate resist...
- Publication number 20010001483
- Publication date May 24, 2001
- Andres A. Bryant
- H01 - BASIC ELECTRIC ELEMENTS

Minh H. Tong

Person

Patents Grantslast 30 patents

Automatic cache activation and deactivation for power reduction

Diffusion resistor/capacitor (DRC) non-aligned MOSFET structure

Active well schemes for SOI technology

Matched transistors and methods for forming the same

Asymmetric high voltage silicon on insulator device design for inpu...

High-voltage high-speed SOI MOSFET

SOI pass-gate disturb solution

Methods for forming decoupling capacitors

Active well schemes for SOI technology

Dynamic threshold voltage devices with low gate to substrate resist...

Contact-less probe of semiconductor wafers

SOI pass gate leakage monitor

Method and structure for creating high density buried contact for u...

Dynamic threshold voltage devices with low gate to substrate resist...

Low leakage logic gates

Domino logic circuit having multiplicity of gate dielectric thickne...

Method and system for processing integrated circuits

Method of forming semiconductor device with decoupling capacitance

Scalable high-voltage devices

Contact-less probe of semiconductor wafers

Operable floating gate contact for SOI with high Vt well

Device method for enhanced avalanche SOI CMOS

Switched body SOI (silicon on insulator) circuits and fabrication m...

Method and apparatus for monitoring SOI hysterises effects

High-voltage, high performance FETs

Semiconductor device with decoupling capacitance

Depleted poly mosfet structure and method

Reliable diffusion resistor and diffusion capacitor

SOI pass-gate disturb solution

Semiconductor device fabrication method and apparatus using connect...

Patents Applicationslast 30 patents

Automatic cache activation and deactivation for power reduction

Diffusion resistor/capacitor (DRC) non-aligned MOSFET structure

Active well schemes for SOI technology

DIFFUSION RESISTOR/CAPACITOR (DRC) NON-ALIGNED MOSFET STRUCTURE

Contact-less probe of semiconductor wafers

A METHOD AND SYSTEM FOR PROCESSING INTEGRATED CIRCUITS

Dynamic threshold voltage devices with low gate to substrate resist...