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X ray detecting device
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Patent number 5,066,861
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Issue date Nov 19, 1991
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Kanegafuchi Chemical Industry Co., Ltd.
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Takehisa Nakayama
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G01 - MEASURING TESTING
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Semiconductor image sensor
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Patent number 5,039,852
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Issue date Aug 13, 1991
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Kanegafuchi Chemical Industry Co., Ltd.
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Masataka Kondo
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H01 - BASIC ELECTRIC ELEMENTS
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Strain sensor
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Patent number 4,937,550
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Issue date Jun 26, 1990
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Kanegafuchi Kagaku Kogyo Kabushiki Kaisha
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Yoshihisa Tawada
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G01 - MEASURING TESTING
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Photovoltaic element
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Patent number 4,892,594
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Issue date Jan 9, 1990
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Canon Kabushiki Kaisha
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Ryoji Fujiwara
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H01 - BASIC ELECTRIC ELEMENTS
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Temperature detector
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Patent number 4,754,254
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Issue date Jun 28, 1988
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Kanegafuchi Kagaku Kogyo Kabushiki Kaisha
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Yoichi Hosokawa
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G01 - MEASURING TESTING
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Photoconductive material
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Patent number 4,569,891
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Issue date Feb 11, 1986
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Kanegafuchi Chemical Industry Co., Ltd.
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Isamu Shimizu
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G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY