Minpei Fujinami

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for evaluating the capacitance of an integrate...
- Patent number 5,097,204
- Issue date Mar 17, 1992
- Nippon Telegraph & Telephone Public Corporation
- Masahiro Yoshizawa
- G01 - MEASURING TESTING
Information Patent Grant
Charged beam radiation apparatus
- Patent number 5,006,795
- Issue date Apr 9, 1991
- Nippon Telephone and Telegraph Public Corporation
- Masahiro Yoshizawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing integrated electronic device
- Patent number 4,980,639
- Issue date Dec 25, 1990
- Nippon Telegraph and Telephone Public Corporation
- Masahiro Yoshizawa
- G01 - MEASURING TESTING
Information Patent Grant
Characteristic test apparatus for electronic device and method for...
- Patent number 4,851,768
- Issue date Jul 25, 1989
- Nippon Telegraph & Telephone Corporation
- Masahiro Yoshizawa
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam lithography apparatus
- Patent number 4,692,579
- Issue date Sep 8, 1987
- Hitachi, Ltd.
- Norio Saitou
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Position detecting system
- Patent number 4,589,773
- Issue date May 20, 1986
- Nippon Telegraph & Telephone Public Corporation
- Satoshi Ido
- G01 - MEASURING TESTING
Information Patent Grant
Control system for deflecting an electron beam
- Patent number 4,197,486
- Issue date Apr 8, 1980
- Nippon Telegraph and Telephone Public Corporation
- Atsushi Iwata
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Minpei Fujinami

Person

Patents Grantslast 30 patents

Method and apparatus for evaluating the capacitance of an integrate...

Charged beam radiation apparatus

Method and apparatus for testing integrated electronic device

Characteristic test apparatus for electronic device and method for...

Electron beam lithography apparatus

Position detecting system

Control system for deflecting an electron beam