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Probe card
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Patent number 9,476,913
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Issue date Oct 25, 2016
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Shinko Electric Industries Co., Ltd.
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Ryo Fukasawa
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G01 - MEASURING TESTING
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Probe card
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Patent number 9,470,718
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Issue date Oct 18, 2016
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Shinko Electric Industries Co., Ltd.
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Ryo Fukasawa
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G01 - MEASURING TESTING
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Wiring board and light emitting device
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Patent number 9,137,890
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Issue date Sep 15, 2015
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Shinko Electric Industries Co., Ltd.
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Kazutaka Kobayashi
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H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Wiring board and light emitting device
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Patent number 9,006,894
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Issue date Apr 14, 2015
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Shinko Electric Industries Co., Ltd.
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Kazutaka Kobayashi
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H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Semiconductor inspecting device
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Patent number 7,884,632
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Issue date Feb 8, 2011
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Shinko Electric Electric Industries Co., Ltd.
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Akinori Shiraishi
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G01 - MEASURING TESTING
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