Mitsuyasu Ohta

Person

Osaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
- Patent number 7,348,595
- Issue date Mar 25, 2008
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods for evaluating quality of test sequences for delay faults a...
- Patent number 7,302,658
- Issue date Nov 27, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device, method of testing the same...
- Patent number 7,203,913
- Issue date Apr 10, 2007
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit and testing method for the same
- Patent number 7,197,725
- Issue date Mar 27, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
- Patent number 7,171,600
- Issue date Jan 30, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor wiring substrate, semiconductor device, method for te...
- Patent number 7,032,196
- Issue date Apr 18, 2006
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having a device for testing the semiconductor
- Patent number 6,734,549
- Issue date May 11, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G11 - INFORMATION STORAGE
Information Patent Grant
Functional block for integrated circuit, semiconductor integrated c...
- Patent number 6,708,301
- Issue date Mar 16, 2004
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of design for testability, test sequence generation method a...
- Patent number 6,651,206
- Issue date Nov 18, 2003
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device, method of testing the same...
- Patent number 6,625,784
- Issue date Sep 23, 2003
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Database for designing integrated circuit device, and method for de...
- Patent number 6,615,389
- Issue date Sep 2, 2003
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inserting test circuit and method for converting test data
- Patent number 6,499,125
- Issue date Dec 24, 2002
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit and method for testing the semicon...
- Patent number 6,271,677
- Issue date Aug 7, 2001
- Matsushita Electric Industrial Company, Limited
- Mitsuyasu Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Method of design for testability test sequence generation method an...
- Patent number 6,253,343
- Issue date Jun 26, 2001
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit
- Patent number 6,119,250
- Issue date Sep 12, 2000
- Matsushita Electric Industrial Co., Ltd.
- Kazuko Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor circuit system, method for testing semiconductor inte...
- Patent number 5,978,948
- Issue date Nov 2, 1999
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating test sequences for detecting faults in target...
- Patent number 5,617,427
- Issue date Apr 1, 1997
- Matsushita Electcric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Test sequence generation method
- Patent number 5,483,543
- Issue date Jan 9, 1996
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of test sequence generation
- Patent number 5,305,328
- Issue date Apr 19, 1994
- Matsushita Electric Industrial Co., Ltd.
- Akira Motohara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit and testing method for the same
- Publication number 20070250284
- Publication date Oct 25, 2007
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor integrated circuit device, method of testing the same...
- Publication number 20070106965
- Publication date May 10, 2007
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test pattern generation method
- Publication number 20070011543
- Publication date Jan 11, 2007
- Shinichi Yoshimura
- G01 - MEASURING TESTING
Information Patent Application
Methods for evaluating quality of test sequences for delay faults a...
- Publication number 20050010839
- Publication date Jan 13, 2005
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20040197941
- Publication date Oct 7, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20040199840
- Publication date Oct 7, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20040195672
- Publication date Oct 7, 2004
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Functional block for integrated circuit, semiconductor integrated c...
- Publication number 20040139376
- Publication date Jul 15, 2004
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit device, method of testing the same...
- Publication number 20030046643
- Publication date Mar 6, 2003
- Matsushita Electric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wiring substrate, semiconductor device, method for te...
- Publication number 20030025191
- Publication date Feb 6, 2003
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit and testing method for the same
- Publication number 20030021464
- Publication date Jan 30, 2003
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Application
Method of design for testability, test sequence generation method a...
- Publication number 20020026611
- Publication date Feb 28, 2002
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING

Mitsuyasu Ohta

Person

Patents Grantslast 30 patents

Semiconductor wiring substrate, semiconductor device, method for te...

Methods for evaluating quality of test sequences for delay faults a...

Semiconductor integrated circuit device, method of testing the same...

Semiconductor integrated circuit and testing method for the same

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor device having a device for testing the semiconductor

Functional block for integrated circuit, semiconductor integrated c...

Method of design for testability, test sequence generation method a...

Semiconductor integrated circuit device, method of testing the same...

Database for designing integrated circuit device, and method for de...

Method for inserting test circuit and method for converting test data

Semiconductor integrated circuit and method for testing the semicon...

Method of design for testability test sequence generation method an...

Semiconductor integrated circuit

Semiconductor circuit system, method for testing semiconductor inte...

Method for generating test sequences for detecting faults in target...

Test sequence generation method

Method of test sequence generation

Patents Applicationslast 30 patents

Semiconductor integrated circuit and testing method for the same

Semiconductor integrated circuit device, method of testing the same...

Test pattern generation method

Methods for evaluating quality of test sequences for delay faults a...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor wiring substrate, semiconductor device, method for te...

Functional block for integrated circuit, semiconductor integrated c...

Semiconductor integrated circuit device, method of testing the same...

Semiconductor wiring substrate, semiconductor device, method for te...

Semiconductor integrated circuit and testing method for the same

Method of design for testability, test sequence generation method a...